High and Low Stress Voltage Instabilities in High-K Gate Stacks

2019 ◽  
Vol 8 (1) ◽  
pp. 99-103 ◽  
Author(s):  
Gennadi Bersuker ◽  
Chad Young ◽  
Dawei Heh ◽  
Rino Choi ◽  
Byoung H. Lee ◽  
...  
Keyword(s):  
Gate Stacks ◽  
High K ◽  
Stress Voltage

Tradeoff Between Hot Carrier and Negative Bias Temperature Degradations in High-Performance $\hbox{Si}_{1 - x}\hbox{Ge}_{x}$ pMOSFETs With High-$k$/Metal Gate Stacks

2010 ◽  
Author(s):  
Won-Ho Choi ◽  
Chang-Young Kang ◽  
Jung-Woo Oh ◽  
Byoung-Hun Lee ◽  
Prashant Majhi ◽  
...  
Keyword(s):  
High Performance ◽  
Negative Bias ◽  
Gate Stacks ◽  
Metal Gate ◽  
Hot Carrier ◽  
High K

Comparison of semiclassical transport formulations including quantum corrections for advanced devices with High-K gate stacks

2010 ◽  
Author(s):  
F. M. Bufler ◽  
V. Aubry-Fortuna ◽  
A. Bournel ◽  
M. Braccioli ◽  
P. Dollfus ◽  
...  
Keyword(s):  
Quantum Corrections ◽  
Gate Stacks ◽  
High K ◽  
Semiclassical Transport

The Role of the Interfaces in the 1/f Noise of MOSFETs with High-k Gate Stacks

2019 ◽  
Vol 19 (2) ◽  
pp. 87-99 ◽  
Author(s):  
Felice Crupi ◽  
Paolo Magnone ◽  
Eddy Simoen ◽  
Luigi Pantisano ◽  
Gino Giusi ◽  
...  
Keyword(s):  
Gate Stacks ◽  
High K

Counter Dipole Layer Formation in Multilayer High-$k$ Gate Stacks

2012 ◽  
Vol 51 ◽  
pp. 081303 ◽  
Author(s):  
Shinya Hibino ◽  
Tomonori Nishimura ◽  
Kosuke Nagashio ◽  
Koji Kita ◽  
Akira Toriumi
Keyword(s):  
Layer Formation ◽  
Gate Stacks ◽  
Dipole Layer ◽  
High K

scholarly journals Systematic study on work-function-shift in metal/Hf-based high-k gate stacks

2009 ◽  
Vol 94 (12) ◽  
pp. 122905 ◽  
Author(s):  
Yuki Kita ◽  
Shinichi Yoshida ◽  
Takuji Hosoi ◽  
Takayoshi Shimura ◽  
Kenji Shiraishi ◽  
...  
Keyword(s):  
Work Function ◽  
Systematic Study ◽  
Gate Stacks ◽  
High K

Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress

2012 ◽  
Vol 52 (9-10) ◽  
pp. 1901-1904 ◽  
Author(s):  
Dongwoo Kim ◽  
Seonhaeng Lee ◽  
Cheolgyu Kim ◽  
Chiho Lee ◽  
Jeongsoo Park ◽  
...  
Keyword(s):  
Gate Stacks ◽  
Metal Gate ◽  
Hot Carrier ◽  
High K ◽  
Enhanced Degradation

Thermal stability and scalability of Zr-aluminate-based high-k gate stacks

2003 ◽  
Author(s):  
P.J. Chen ◽  
E. Cartier ◽  
R.J. Carter ◽  
T. Kauerauf ◽  
C. Zhao ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Gate Stacks ◽  
High K
Sign in / Sign up

Export Citation Format

Share Document