Scanning Probe Microscopy Imaging of Nucleation and Electronic Structure Passivation during Atomic Layer Deposition on a Compound Semiconductor Surface

2010 ◽  
Keyword(s):  
Electronic Structure ◽  
Atomic Layer Deposition ◽  
Scanning Probe Microscopy ◽  
Atomic Layer ◽  
Compound Semiconductor ◽  
Scanning Probe ◽  
Semiconductor Surface ◽  
Microscopy Imaging ◽  
Probe Microscopy ◽  
Layer Deposition

Atomic imaging of the monolayer nucleation and unpinning of a compound semiconductor surface during atomic layer deposition

2010 ◽  
Vol 133 (15) ◽  
pp. 154704 ◽  
Author(s):  
Jonathon B. Clemens ◽  
Evgueni A. Chagarov ◽  
Martin Holland ◽  
Ravi Droopad ◽  
Jian Shen ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Compound Semiconductor ◽  
Semiconductor Surface ◽  
Layer Deposition

scholarly journals Scanning probe microscopy imaging of metallic nanocontacts

2012 ◽  
Vol 85 (3) ◽  
Author(s):  
D. Stöffler ◽  
S. Fostner ◽  
P. Grütter ◽  
R. Hoffmann-Vogel
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Microscopy Imaging ◽  
Probe Microscopy
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