Voltage Ramp Stress (VRS) Based Test Methods for Reliability
Characterization of Hf-Base High-k/Metal Gate Stacks for CMOS
Technologies
2008 ◽
Vol 48
(11-12)
◽
pp. 1759-1764
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2010 ◽
Vol 57
(11)
◽
pp. 2814-2820
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Keyword(s):
2012 ◽
Vol 52
(9-10)
◽
pp. 1901-1904
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