Atomic-Level Real-Time Observation of Crystal Growth and Evaporation in LiFePO4 at High Temperature

2013 ◽  
Vol 740-742 ◽  
pp. 35-38 ◽  
Author(s):  
Sakiko Kawanishi ◽  
Takeshi Yoshikawa ◽  
Kazuki Morita

Precise morphological control of the interface between SiC and solution during the solution growth of SiC is crucial for obtaining high quality crystals with fewer defects and less step bunching. In this paper, a new technique for real-time observation of the high temperature interface between SiC and solution through the back surface of SiC was developed by focusing on the “wide” bandgap of SiC. Real-time observation of the interface during dissolution of SiC into an Fe-Si solvent alloy was carried out using a digital microscope, and the submicron-height structure of the solid-liquid interface was clearly observed at up to 1773 K. Interface morphologies, such as numerous hexagonal pits which were present at the initial stage of dissolution, followed by preferential dissolution in the lateral direction, were observed.


2006 ◽  
Vol 959 ◽  
Author(s):  
Itaru Kamiya ◽  
Kohtaro Matsuura ◽  
Tsuyoshi Higashinakagawa

ABSTRACTSelf-assembled (SA) quantum dots (QDs) have been widely studied due to the facileness in their preparation. Unlike other types of QDs that require complicated fabrication processes, SA QDs are prepared merely by depositing materials that have different bandgaps and lattice constants to the with respect to the substrate by epitaxial crystal growth techniques. InAs QDs on GaAs(001) grown by MBE or MOCVD have been a typical example, and their optoelectronic properties have been extensively investigated. For device applications, it is essential that their size and spatial distribution are controlled. However, since SA QDs are formed through random processes, it is not easy to achieve size and distribution uniformity without prior processing the substrate prior to crystal growth. A number of studies have been performed to understand the fundamental mechanisms of SA QD formation that would provide us with information to achieve such goal. Here, we performed real-time observation of SA InAs QD growth on GaAs(001) by MBE. In contrast to most previous reports that employed growth interruption, by following the time transient of RHEED specular beam in detail, we obtained information about nucleation and evolution of the QDs, and have been able to distinguish processes that are dependent and independent of growth rate. In addition, the results reveal that surface migration of In/As atoms and their incorporation into QDs, with the aid of the wetting layer, can be observed. We will also provide a quantitative discussion on these processes.


2013 ◽  
Vol 135 (21) ◽  
pp. 7811-7814 ◽  
Author(s):  
Sung-Yoon Chung ◽  
Young-Min Kim ◽  
Si-Young Choi ◽  
Jin-Gyu Kim

2018 ◽  
Vol 69 (6) ◽  
pp. 678-689 ◽  
Author(s):  
Christiane Stephan-Scherb ◽  
Kathrin Nützmann ◽  
Axel Kranzmann ◽  
Manuela Klaus ◽  
Christoph Genzel

JOM ◽  
2019 ◽  
Vol 71 (4) ◽  
pp. 1560-1565
Author(s):  
Florian Falk ◽  
Martina Menneken ◽  
Christiane Stephan-Scherb

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