S41 Application of X-ray Diffraction Stress Analysis at Constant Penetration Depth for the Determination of Both Real-Space Residual-Stress and Lattice-Parameter Gradients

2008 ◽  
Vol 23 (2) ◽  
pp. 182-182
Author(s):  
M. Wohlschlögel ◽  
U. Welzel ◽  
E. J. Mittemeijer
2009 ◽  
Vol 24 (4) ◽  
pp. 1342-1352 ◽  
Author(s):  
M. Wohlschlögel ◽  
U. Welzel ◽  
E.J. Mittemeijer

The residual stress and lattice-parameter depth profiles in a γ′-Fe4N1-x layer (6-μm thickness) grown on top of an α-Fe substrate were investigated using x-ray diffraction stress analysis at constant penetration depths. Three different reflections (220, 311, and 222) were recorded at six different penetration depths using three different wavelengths. At each penetration depth, x-ray diffraction stress analysis was performed on the basis of the sin2ψ method. As a result, the residual-stress depth profile was obtained from the measured lattice strains. The lattice spacings measured in the strain-free direction were used to determine the (strain-free) lattice-parameter depth profile. The nitrogen-concentration depth profile in the layer was calculated by applying a relationship between the (strain-free) γ′ lattice parameter and the nitrogen concentration. It was found that the strain-free lattice-parameter depth profile as derived from the 311 reflections is best compatible with nitrogen concentrations at the surface and at the γ′/α interface as predicted on the basis of local thermodynamic equilibrium. It could be shown that the 311 reflection is most suitable for the analysis of lattice-parameter and residual stress depth profiles because the corresponding x-ray elastic constants exhibit the least sensitivity to the type of and changes in grain interaction. The depth-dependence of the grain interaction could be revealed. It was found that the grain interaction changes from Voigt-type near the surface to Reuss-type at the layer/substrate interface.


1979 ◽  
Vol 23 ◽  
pp. 333-339
Author(s):  
S. K. Gupta ◽  
B. D. Cullity

Since the measurement of residual stress by X-ray diffraction techniques is dependent on the difference in angle of a diffraction peak maximum when the sample is examined consecutively with its surface at two different angles to the diffracting planes, it is important that these diffraction angles be obtained precisely, preferably with an accuracy of ± 0.01 deg. 2θ. Similar accuracy is desired in precise lattice parameter determination. In such measurements, it is imperative that the diffractometer be well-aligned. It is in the context of diffractometer alignment with the aid of a silicon powder standard free of residual stress that the diffraction peak analysis techniques described here have been developed, preparatory to residual stress determinations.


1988 ◽  
Vol 142 ◽  
Author(s):  
John F. Porter ◽  
Dan O. Morehouse ◽  
Mike Brauss ◽  
Robert R. Hosbons ◽  
John H. Root ◽  
...  

AbstractStudies have been ongoing at Defence Research Establishment Atlantic on the evaluation of non-destructive techniques for residual stress determination in structures. These techniques have included neutron diffraction, x-ray diffraction and blind-hole drilling. In conjunction with these studies, the applicability of these procedures to aid in metallurgical and failure analysis investigations has been explored. The x-ray diffraction technique was applied to investigate the failure mechanism in several bent turbo blower rotor shafts. All examinations had to be non-destructive in nature as the shafts were considered repairable. It was determined that residual stress profiles existed in the distorted shafts which strongly indicated the presence of martensitic microstuctures. These microstructures are considered unacceptable for these shafts due to the potential for cracking or in-service residual stress relaxation which could lead to future shaft distortion.


1984 ◽  
Vol 28 ◽  
pp. 281-288 ◽  
Author(s):  
Ismail Cevdet Noyan

Stress gradients in the direction of the surface normal influence the shape of the interplanar spacing “d” vs. sin2ψ (where ψ is the specimen tilt) plot obtained from the surface layers of a specimen.(1-3) If the gradients are caused by the shear stresses σ13, σ23, the “d” vs. sin2ψ plot exhibits “psi-splitting”, that is the “d” values measured at positive ψ tilts are different from the values measured at negative if tilts. (2) If the shear stresses σ13, σ23, are zero, but the normal stress σ33 exists in the layets penetrated by the x-ray beam, “d” vs. sin2ψ, plot exhibits curvature. (3) Various methods have been proposed to obtain the complete stress tensor from split or curved “d” vs. sin2ψ data, and all of these methods require the “unstressed” lattice spacing “d0” for their calculations.


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