Trace Element Analysis of Rocks by X-ray Spectrometry

1990 ◽  
Vol 34 ◽  
pp. 263-276 ◽  
Author(s):  
Bruce W. Chappell
Keyword(s):  
Trace Element ◽  
Trace Element Analysis ◽  
Major Elements ◽  
Good Precision ◽  
Powerful Method ◽  
Element Analysis ◽  
X Ray ◽  
Advantages And Disadvantages ◽  
Wide Range ◽  
Unique Method

Undoubtedly the most important applications of X-ray fluorescence spectrometry (XRF) have been in the analysis of major elements where the technique provides a unique method of measuring the concentration of all elements having Z > 10 with extremely good precision in a wide range of matrices. However, XRF is in addition a powerful method for trace element analysis. In this discussion, the principles of the method for the trace element analysis of rocks are outlined, its capabilities are summarized, and the advantages and disadvantages of the technique are pointed out.

Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals

1995 ◽  
Vol 39 ◽  
pp. 109-117
Author(s):  
Burkhard Beckhoff ◽  
Birgit Kanngießer
Keyword(s):  
High Intensity ◽  
Focal Plane ◽  
Bragg Reflection ◽  
Pyrolytic Graphite ◽  
Trace Element Analysis ◽  
Detection Sensitivity ◽  
Element Analysis ◽  
X Ray ◽  
Wide Range ◽  
Very High

X-ray focusing based on Bragg reflection at curved crystals allows collection of a large solid angle of incident radiation, monochromatization of this radiation, and condensation of the beam reflected at the crystal into a small spatial cross-section in a pre-selected focal plane. Thus, for the Bragg reflected radiation, one can achieve higher intensities than for the radiation passing directly to the same small area in the focal plane. In that case one can profit considerably from X-ray focusing in an EDXRF arrangement. The 00 2 reflection at Highly Oriented Pyrolytic Graphite (HOPG) crystals offers a very high intensity of the Bragg reflected beam for a wide range of photon energies. Furthermore, curvature radii smaller than 10 mm can be achieved for HOPG crystals ensuring efficient X-ray focusing in EDXRF applications. For the trace analysis of very small amounts of specimen material deposited on small areas of thin-filter backings, HOPG based X-ray focusing may be used to achieve a very high intensity of monochromatic excitation radiation.

Trace element analysis via heavy ion induced X-ray fluorescence

1976 ◽  
Vol 279 (2) ◽  
pp. 160-160 ◽  
Author(s):  
R. Zeisler ◽  
J. Cross ◽  
E. A. Schweikert
Keyword(s):  
Trace Element ◽  
Trace Element Analysis ◽  
Heavy Ion ◽  
Element Analysis ◽  
X Ray

Optimization of PIXE quantitative system to assist traceability of pearls

2017 ◽  
Vol 27 (03n04) ◽  
pp. 125-133
Author(s):  
S. Murao ◽  
K. Sera ◽  
S. Goto ◽  
C. Takahashi ◽  
L. Cartier ◽  
...  
Keyword(s):  
Supply Chain ◽  
Trace Element ◽  
Standard Method ◽  
Good Accuracy ◽  
Trace Element Analysis ◽  
Social Attention ◽  
Element Analysis ◽  
X Ray ◽  
Cultured Pearls

Recent rise of social attention towards ethical jewelry has led scientists to a challenge of how to construct analytical systems that can deliver in line with social and supply chain expectations. Of the various kinds of methods, “Proton/Particle-Induced X-ray Emission” (PIXE) seems to be robust and promising in characterizing gemstones because of its capability of trace element analysis without destruction. The authors established a non-standard method to analyze cultured pearls and applied it to test specimens from different places. The results showed that PIXE could detect important elements for pearl study with good accuracy and sensitivity and that pearl chemistry can be useful to differentiate freshwater and marine pearl products.

Sign in / Sign up

Export Citation Format

Share Document