scholarly journals Size Measurement of Nanoparticle Assembly Using Multilevel Segmented TEM Images

2015 ◽  
Vol 2015 ◽  
pp. 1-8 ◽  
Author(s):  
Paisarn Muneesawang ◽  
Chitnarong Sirisathitkul
Keyword(s):  
Image Segmentation ◽  
Electron Microscope ◽  
Quantitative Analysis ◽  
Scale Invariance ◽  
Clustering Algorithm ◽  
Accurate Method ◽  
Nanoparticle Assembly ◽  
Size Measurement ◽  
Transmission Electron ◽  
Separation Problems

Multilevel image segmentation is demonstrated as a rapid and accurate method of quantitative analysis for nanoparticle assembly in TEM images. The procedure incorporatingK-means clustering algorithm and watershed transform is tested on transmission electron microscope (TEM) images of FePt-based nanoparticles whose diameters are less than 5 nm. By solving the nanoparticle segmentation and separation problems, this unsupervised method is useful not only in the nonoverlapping case but also for agglomerated nanoparticles. Furthermore, the method exhibits scale invariance based on comparable results from images of different magnifications.

Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector

2012 ◽  
Vol 18 (S2) ◽  
pp. 974-975 ◽  
Author(s):  
M. Watanabe ◽  
A. Yasuhara ◽  
E. Okunishi
Keyword(s):  
Electron Microscope ◽  
Quantitative Analysis ◽  
Transmission Electron Microscope ◽  
Solid Angle ◽  
Scanning Transmission Electron Microscope ◽  
Atomic Resolution ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Comparison of Multislice Computer Programs for Electron Scattering Simulations and The Bloch Wave Method

2000 ◽  
Vol 6 (S2) ◽  
pp. 126-127
Author(s):  
C. Koch ◽  
J.M. Zuo
Keyword(s):  
Electron Microscope ◽  
Quantitative Analysis ◽  
Electron Scattering ◽  
Electron Beams ◽  
Bloch Wave ◽  
Zone Axis ◽  
Wave Method ◽  
Software Packages ◽  
Transmission Electron ◽  
Diffraction Patterns

As the demand for quantitative analysis of Transmission Electron Microscope (TEM) images and diffraction patterns increases, questions arise about the reliability of computer simulations using different software packages and algorithms that are used for comparison with the experiment. Here, we compared five multislice programs, which are (with the exception of Cerius2) freely available, with each other and also a Bloch wave code. Since multislice method propagates the electron beams through the crystal slice by slice, the development of differences between the programs can easily be seen by comparing amplitudes and phases of different beams vs. thickness (Pendelloesung plot). We calculated Pendelloesung plots for InP [001] in zone axis and tilted beam orientations and the Si [111] forbidden reflections using the following codes: Cerius2, NCEMSS, Autoslic3, Multis4, EMS5 and an updated Bloch wave code written by J.M. Zuo4.

Quantitative Analysis of Intermetallic Phase in 850°C Aging 2205 Duplex Stainless Steel

2013 ◽  
Vol 791-793 ◽  
pp. 464-468
Author(s):  
Wei Liu ◽  
Na Qiong Zhu ◽  
Yan Lin He ◽  
Lin Li
Keyword(s):  
Stainless Steel ◽  
Electron Microscope ◽  
Quantitative Analysis ◽  
Scanning Electron Microscope ◽  
Duplex Stainless Steel ◽  
Energy Dispersive Spectrometer ◽  
Intermetallic Phase ◽  
2205 Duplex Stainless Steel ◽  
Transmission Electron ◽  
Scanning Electron

The precipitates in 850°C aging 2205 Duplex stainless steel were extracted by the method of carbon extraction replicas. The method makes precipitates disperse uniformly and the contrast between precipitates and matrix distinct. TEM(Transmission Electron Microscope), EDS(Energy Dispersive Spectrometer) and SEM (Scanning Electron Microscope) were applied for the observation of microstructure. The SEM micrographs were used for intermetallic size statistic, which revealed that the sizes of intermetallic increased with aging time.

A Reproducible Selective Stain for Cardiac Sarcoplasmic Reticulum

1974 ◽  
Vol 32 ◽  
pp. 214-215
Author(s):  
R. A. Waugh ◽  
J. R. Sommer
Keyword(s):  
Complex System ◽  
Electron Microscope ◽  
Sarcoplasmic Reticulum ◽  
Transmission Electron Microscope ◽  
Electron Microscopic ◽  
Cardiac Sarcoplasmic Reticulum ◽  
Transmission Electron

Cardiac sarcoplasmic reticulum (SR) is a complex system of intracellular tubules that, due to their small size and juxtaposition to such electron-dense structures as mitochondria and myofibrils, are often inconspicuous in conventionally prepared electron microscopic material. This study reports a method with which the SR is selectively “stained” which facilitates visualizationwith the transmission electron microscope.

Surface Structure of the Spores of Glugea Weissenbergi

1969 ◽  
Vol 27 ◽  
pp. 238-239
Author(s):  
Sanford H. Vernick ◽  
Anastasios Tousimis ◽  
Victor Sprague
Keyword(s):  
Electron Microscope ◽  
Surface Structure ◽  
Transmission Electron Microscope ◽  
Mature Spore ◽  
Spore Surface ◽  
Sectioned Material ◽  
Transmission Electron ◽  
Surface Detail

Recent electron microscope studies have greatly expanded our knowledge of the structure of the Microsporida, particularly of the developing and mature spore. Since these studies involved mainly sectioned material, they have revealed much internal detail of the spores but relatively little surface detail. This report concerns observations on the spore surface by means of the transmission electron microscope.

The High Resolution Scanning Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 316-317
Author(s):  
A. V. Crewe
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
High Vacuum ◽  
Scanning Transmission Electron Microscope ◽  
Ultra High Vacuum ◽  
Resolving Power ◽  
Imaging Characteristics ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
The Moment

The high resolution STEM is now a fact of life. I think that we have, in the last few years, demonstrated that this instrument is capable of the same resolving power as a CEM but is sufficiently different in its imaging characteristics to offer some real advantages.It seems possible to prove in a quite general way that only a field emission source can give adequate intensity for the highest resolution^ and at the moment this means operating at ultra high vacuum levels. Our experience, however, is that neither the source nor the vacuum are difficult to manage and indeed are simpler than many other systems and substantially trouble-free.

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