scholarly journals The Design and Thermal Reliability Analysis of a High-Efficiency K-Band MMIC Medium-Power Amplifier with Multiharmonic Matching

2016 ◽  
Vol 2016 ◽  
pp. 1-7 ◽  
Author(s):  
Y. Shang ◽  
H. Xu ◽  
J. Mo ◽  
Z. Wang ◽  
X. Xu ◽  
...  
Keyword(s):  
Reliability Analysis ◽  
Power Amplifier ◽  
High Efficiency ◽  
Infrared Imaging ◽  
Imaging System ◽  
Thermal Characteristic ◽  
Analysis Method ◽  
Process Technology ◽  
Thermal Reliability ◽  
K Band

A new high-efficiency K-band MMIC medium-power amplifier (PA) is designed with multiharmonic matching using GaAs pHEMT process technology. It has an operation frequency centered at 26 GHz with a bandwidth of 2 GHz. A 20 dBm 1 dB-compression-point output power and 40% efficiency are achieved. A novel thermal reliability analysis method based on ICEPAK is proposed also to evaluate its thermal characteristic. The test result by using a QFI InfraScope™infrared imaging system is compared with the simulation result. It agrees well with an accuracy within ±1°C differences, which reflects the advantages of the thermal analysis method with respect to accuracy and convenience for use.

High-efficiency K-band MMIC power amplifier using multi-harmonic load terminations

2015 ◽  
Vol 46 (12) ◽  
pp. 1453-1458 ◽  
Author(s):  
Zhichen Tu ◽  
Bo Li ◽  
Yongheng Shang ◽  
Zhiyu Wang ◽  
Liping Wang ◽  
...  
Keyword(s):  
Power Amplifier ◽  
High Efficiency ◽  
Harmonic Load ◽  
K Band

Design of a K-Band High-Efficiency Power Amplifier in 45 nm SOI CMOS Technology

2021 ◽  
Vol 217 (1) ◽  
pp. 95-106
Author(s):  
Liying Chen ◽  
Hao Wang ◽  
Junfa Zhao ◽  
Simin Zhang
Keyword(s):  
Power Amplifier ◽  
High Efficiency ◽  
Cmos Technology ◽  
K Band ◽  
Soi Cmos

scholarly journals A 28 GHz high efficiency fully integrated 0.18 µm combined CMOS power amplifier using power divider technique for 5G millimeter-wave applications

2020 ◽  
Vol 9 (2) ◽  
Author(s):  
A. F. Hasan ◽  
S. A. Z. Murad ◽  
F. A. Bakar ◽  
T. Z. A. Zulkifli
Keyword(s):  
Millimeter Wave ◽  
Power Amplifier ◽  
High Efficiency ◽  
Power Divider ◽  
Power Gain ◽  
Power Combiner ◽  
Process Technology ◽  
Fully Integrated ◽  
Power Added Efficiency ◽  
Simulation Results

A 28 GHz power amplifier (PA) using CMOS 0.18 µm Silterra process technology for milimeter wave applications is reported. Maximizing the power added efficiency (PAE) and output power are achieved by optimize the circuit with power divider and cascade configuration. In addition, reverse body bias is also employed for realizing excellent PAE and power consumption. A three stage CMOS PA with power combiner is designed and simulated. The simulation results show that the proposed PA consumes 62.56 mW and power gain (S21) of 8.08 dB is achieved at 28 GHz. The PA achieves saturated power (Psat) of 12.62 dBm and maximum PAE of 23.74% with output 1-dB compression point (OP1dB) 10.85 dBm. These results demonstrate the proposed power amplifier architecture is suitable for 5G applications.

A High Efficiency Class-E Power Amplifier Over a Wide Power Range Using a Look-Up Table Based Dynamic Biasing Scheme

2015 ◽  
Vol E98.C (4) ◽  
pp. 377-379
Author(s):  
Jonggyun LIM ◽  
Wonshil KANG ◽  
Kang-Yoon LEE ◽  
Hyunchul KU
Keyword(s):  
Power Amplifier ◽  
High Efficiency ◽  
Look Up Table ◽  
Dynamic Biasing ◽  
Class E

scholarly journals An Efficient Time-Variant Reliability Analysis Method with Mixed Uncertainties

Algorithms ◽  
2021 ◽  
Vol 14 (8) ◽  
pp. 229
Author(s):  
Fangyi Li ◽  
Yufei Yan ◽  
Jianhua Rong ◽  
Houyao Zhu
Keyword(s):  
Reliability Analysis ◽  
Limit State ◽  
Random Variables ◽  
Equivalent Model ◽  
Independent Random Variables ◽  
Problem Analysis ◽  
Analysis Method ◽  
Calculation Algorithm ◽  
Reliability Problem ◽  
Interval Variables

In practical engineering, due to the lack of information, it is impossible to accurately determine the distribution of all variables. Therefore, time-variant reliability problems with both random and interval variables may be encountered. However, this kind of problem usually involves a complex multilevel nested optimization problem, which leads to a substantial computational burden, and it is difficult to meet the requirements of complex engineering problem analysis. This study proposes a decoupling strategy to efficiently analyze the time-variant reliability based on the mixed uncertainty model. The interval variables are treated with independent random variables that are uniformly distributed in their respective intervals. Then the time-variant reliability-equivalent model, containing only random variables, is established, to avoid multi-layer nesting optimization. The stochastic process is first discretized to obtain several static limit state functions at different times. The time-variant reliability problem is changed into the conventional time-invariant system reliability problem. First order reliability analysis method (FORM) is used to analyze the reliability of each time. Thus, an efficient and robust convergence hybrid time-variant reliability calculation algorithm is proposed based on the equivalent model. Finally, numerical examples shows the effectiveness of the proposed method.

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