A Comparative Study of the Smear Layer Removal Using Scanning Electronic Microscopy and Atomic Force Microscopy

This paper presents a study of soils structure and composition using up to date technique, such as scanning electronic microscopy, atomic force microscopy, X-ray diffraction, X-ray fluorescence, as well as some other characterization methods. It was shown that soil particles have porous structure and dimensions in the range from several millimeters to several hundreds of nanometers and consist of different minerals such as kaolin, quartz and feldspate.

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Efficacy of smear layer removal by cavity cleaning solutions: an atomic force microscopy study

Revista Odonto Ciência ◽

10.1590/s1980-65232011000300011 ◽

2011 ◽

Vol 26 (3) ◽

pp. 253-257 ◽

Cited By ~ 1

Author(s):

Jiovanne Rabelo Neri ◽

Vanara Florêncio Passos ◽

Felipe Bandeira deAlencar Viana ◽

Lidiany Karla Azevedo Rodrigues ◽

Vicente de Paulo Aragão Saboia ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Smear Layer ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Layer Removal ◽

Atomic Force

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Comparative study of the GaAs (113), (115), (001), (115) , (113) , and (110) surfaces by atomic force microscopy, low energy electron diffraction, and reflectance anisotropy spectroscopy

Microelectronics Journal ◽

10.1016/s0026-2692(98)00151-7 ◽

1999 ◽

Vol 30 (4-5) ◽

pp. 449-453 ◽

Cited By ~ 9

Author(s):

Markus Pristovsek ◽

H. Menhal ◽

T. Schmidtling ◽

N. Esser ◽

W. Richter

Keyword(s):

Atomic Force Microscopy ◽

Electron Diffraction ◽

Comparative Study ◽

Low Energy ◽

Energy Electron ◽

Force Microscopy ◽

Low Energy Electron Diffraction ◽

Reflectance Anisotropy ◽

Atomic Force ◽

Low Energy Electron

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Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

Microscopy and Microanalysis ◽

10.1017/s1431927699990475 ◽

1999 ◽

Vol 5 (6) ◽

pp. 413-419 ◽

Cited By ~ 10

Author(s):

Bernardo R.A. Neves ◽

Michael E. Salmon ◽

Phillip E. Russell ◽

E. Barry Troughton

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Comparative Study ◽

Field Emission ◽

Self Assembled Monolayer ◽

Force Microscopy ◽

Atomic Force ◽

Self Assembled ◽

Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

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