Characteristics of Electrodeposited Single-Walled Carbon Nanotube Films

2006 ◽  
Vol 6 (11) ◽  
pp. 3614-3618
Author(s):  
Sung-Kyoung Kim ◽  
Hee-Young Choi ◽  
Ha-Jin Lee ◽  
Haiwon Lee
Keyword(s):  
Single Walled Carbon Nanotubes ◽  
Attenuated Total Reflectance ◽  
Gold Substrate ◽  
Single Walled Carbon Nanotube ◽  
Ir Spectrometry ◽  
Total Reflectance ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Walled Carbon Nanotubes

Thin films of chemically-functionalized single walled carbon nanotubes (SWNTs) were fabricated by using a direct current (DC) electrodeposition method. SWNTs were shortened and then functionalized with acid chloride group to combine with amine group-terminated gold substrate. The electrodeposited SWNT films were characterized by using Raman spectroscopy, attenuated total reflectance infrared (ATR/IR) spectrometry and atomic force microscopy. We demonstrated that the SWNT film was well distributed on an electrode with robust adhesion.

Efficient Charge-Transfer from Diketopyrrolopyrroles to Single-Walled Carbon Nanotubes

Nanoscale ◽  
2021 ◽  
Author(s):  
Ilias Papadopoulos ◽  
Arjun Puthiyedath ◽  
Fabian Plass ◽  
Desiré Molina ◽  
Christina Harreiss ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Charge Transfer ◽  
Single Walled Carbon Nanotubes ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Efficient Charge ◽  
Walled Carbon Nanotubes ◽  
State Charge

In this contribution, the excited state charge-transfer interactions between single walled carbon nanotubes (SWCNTs) and a variety of phenyl, 4-bromophenyl, and thiophene substituted diketopyrrolopyrroles (DPPs), is described. Atomic force microscopy...

Growth of Single-Walled Carbon Nanotubes by Microwave Plasma Enhanced Chemical Vapor Deposition

2004 ◽  
Vol 858 ◽  
Author(s):  
Matthew R. Maschmann ◽  
Amit Goyal ◽  
Zafar Iqbal ◽  
Timothy S. Fisher ◽  
Roy Gat
Keyword(s):  
Carbon Nanotubes ◽  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Microwave Plasma ◽  
Chemical Vapor ◽  
Single Walled Carbon Nanotubes ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Walled Carbon Nanotubes

ABSTRACTSingle-walled carbon nanotubes (SWCNTs) have been grown for the first time by microwave plasma-enhanced chemical vapor deposition (PECVD) at 800°C using methane as the precursor and bimetallic Mo/Co catalyst supported on MgO dispersed on a silicon wafer. The nanotubes grown consist of bundles, each composed of individual tubes of a single diameter associated with either metallic or semiconducting SWCNTs, based on characterization by Raman spectroscopy. Field-emission scanning electron microscopy and atomic force microscopy show that the bundles are relatively thin – 5 to 10 nm in diameter – and up to a few micrometers in length. The results are compared with those obtained on recently reported SWCNTs grown by radio frequency PECVD.

Fabrication of Selective Metal Contacts on Single-Walled Carbon Nanotubes for Device Applications

2005 ◽  
Vol 11 (S03) ◽  
pp. 106-109
Author(s):  
I. O. Maciel ◽  
B. R. A. Neves ◽  
A. P. Santos ◽  
C. A. Furtado ◽  
A. S. Ferlauto ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Research Area ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Sample Characterization ◽  
Active Research ◽  
Walled Carbon Nanotubes

Silicon based devices are expected to achieve the limit of possible downscaling in 10 to 15 years. Thus, the search of new materials to construct smaller, faster and more energy efficient devices has been a very active research area. Carbon nanotubes (CNTs) are very good candidates to construct nanoelectronic and nanophotonic devices [1,2,3] due to unique physical properties, such as its metallic or semiconducting characteristics depending only its diameter and chirality [4,5] and capability of caring high current densities (up to 1010A/cm2). In this work we develop nanofabrication techniques of single-walled carbon nanotubes (SWNTs) based devices using a combination of electron beam and optical lithography with Atomic Force Microscopy (AFM). We used both CVD-grown nanotubes [6] and HipCO-NTs [7] suspended on aqueous solution and deposited on the substrate. Atomic Force Microscopy (AFM) in tapping mode (Multimode Nanoscope IV, Digital Instruments) was used to CVD sample characterization, study of CNT deposition and to localize and index the nanotubes on substrate using lithography patterns as references, making possible to selectively construct metallic contacts on the CNTs.

Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3707-3710 ◽  
Author(s):  
Nami Choi ◽  
Takayuki Uchihashi ◽  
Hidehiro Nishijima ◽  
Takao Ishida ◽  
Wataru Mizutani ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Single Walled Carbon Nanotubes ◽  
Force Microscopy ◽  
Single Walled Carbon ◽  
Atomic Force ◽  
Walled Carbon Nanotubes
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