Comparative Analysis of Nano-Scale Structural and Electrical Properties in AlGaN/GaN High Electron Mobility Transistors on SiC and Sapphire Substrates

2013 ◽  
Vol 13 (10) ◽  
pp. 7083-7088 ◽  
Author(s):  
Cong Wang ◽  
Sung-Jin Cho ◽  
Nam-Young Kim
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