A Reliable Extraction Method for Source and Drain Series Resistances in Silicon Nanowire Metal-Oxide-Semiconductor Field-Effect-Transistors (MOSFETs) Based on Radio-Frequency Analysis

2014 ◽  
Vol 14 (11) ◽  
pp. 8219-8224
Author(s):  
Jae Hwa Seo ◽  
Young Jun Yoon ◽  
Hwan Gi Lee ◽  
Gwan Min Yoo ◽  
Eou-Sik Cho ◽  
...  
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