Novel Extraction Method for Source and Drain Series Resistances in Silicon Nanowire Metal–Oxide–Semiconductor Field-Effect-Transistors Based on Radio-Frequency Analysis
2014 ◽
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pp. 8219-8224
2007 ◽
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pp. 7635-7638
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pp. 084203
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2000 ◽
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2015 ◽
Vol 87
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pp. 9982-9990
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