Novel Extraction Method for Source and Drain Series Resistances in Silicon Nanowire Metal–Oxide–Semiconductor Field-Effect-Transistors Based on Radio-Frequency Analysis

2013 ◽  
Vol 52 (4S) ◽  
pp. 04CC14
Author(s):  
Kyung Rok Kim ◽  
Sunhae Shin ◽  
Seongjae Cho ◽  
Jung-Hee Lee ◽  
In Man Kang
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