Effect of Annealing on Morphology and Photoluminescence of WO3 Nanowires Deposited by Glancing Angle Deposition Techniques

2020 ◽  
Vol 20 (5) ◽  
pp. 3274-3282 ◽  
Author(s):  
Rajshree Rajkumari ◽  
Naorem Khelchand Singh
Keyword(s):  
Annealing Temperature ◽  
Blue Emission ◽  
Glancing Angle Deposition ◽  
Localized States ◽  
Near Band Edge ◽  
Band Edge Emission ◽  
X Ray Diffraction ◽  
Glancing Angle ◽  
Vertically Aligned ◽  
Angle Deposition

In this article, vertically aligned WO3 nanowires were synthesized by employing the glancing angle deposition technique. The significant improvement in the crystallinity and surface morphology of the synthesized WO3 nanowires were observed for 500 °C annealed samples and beyond that temperature it starts degrading. The X-ray diffraction confirmed the different phase transition after annealing. Increase in crystallite size from 68.93 nm to 77.41 nm was observed with the increase in annealing temperature from 300 °C to 500 °C. Upon 250 nm excitation, a broad blue emission aroused by near band edge emission is observed. Also, other emission peaks were observed due to the localized states of oxygen vacancies in the conduction band of WO3. Fourier transform infrared result shows the bonding of WO3 nanowires and intensity were greatly enhanced as the annealing temperature increases up to 500 °C. These enhancements in the properties could be applicable for the development of WO3 based nanodevices.

Influence of an Annealing Temperature in a Vacuum Atmosphere on the Physical Properties of Indium Tin Oxide Nanorod Films

2020 ◽  
Vol 20 (8) ◽  
pp. 5006-5013
Author(s):  
Peerasil Charoenyuenyao ◽  
Nathaporn Promros ◽  
Rawiwan Chaleawpong ◽  
Pitoon Noymaliwan ◽  
Nattakorn Borwornpornmetee ◽  
...  
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Annealing Temperature ◽  
Electron Beam Evaporation ◽  
Glancing Angle Deposition ◽  
Root Mean Square Roughness ◽  
X Ray Diffraction ◽  
Glancing Angle ◽  
Vacuum Atmosphere ◽  
Angle Deposition

In the present study, indium tin oxide (ITO) nanorod films were produced by usage of ion-assisted electron-beam evaporation with a glancing angle deposition technique. The as-produced ITO nanorod films were annealed in the temperature range of 100–500 °C for two hours in a vacuum atmosphere. The as-produced ITO nanorod films exhibited (222) and (611) preferred orientations from the X-ray diffraction pattern. After vacuum annealing at 500 °C, the ITO nanorod films demonstrated many preferred orientations and the improvement of film crystallinity. The sheet resistance of the as-produced ITO nanorod films was 11.92 Ω/ and was found to be 13.63 Ω/ by annealing at 500 °C. The as-produced and annealed ITO nanorod films had a rod diameter of around 80 nm and transmittance in a visible zone of around 90%. The root mean square roughness of the as-produced ITO nanorod film’s surface was 5.49 nm, which increased to 13.77 nm at an annealing temperature of 500 °C. The contact angle of the as-produced ITO nanorod films was 110.9° and increased to 116.5° after annealing at 500 °C.

Growth of Nanostructure TiO2 Films by Glancing Angle Deposition

2016 ◽  
Vol 675-676 ◽  
pp. 289-292 ◽  
Author(s):  
Theerayuth Plirdpring ◽  
Mati Horprathum ◽  
Pitak Eiamchai ◽  
Benjarong Samransuksamer ◽  
Chanunthorn Chananonnawathorn ◽  
...  
Keyword(s):  
Room Temperature ◽  
Rotation Speed ◽  
Electron Beam Evaporation ◽  
Glancing Angle Deposition ◽  
X Ray Diffraction ◽  
Sem Images ◽  
X Ray ◽  
Vapor Flux ◽  
Glancing Angle ◽  
Angle Deposition

Nanostructure TiO2 films were prepared by electron beam evaporation with glancing angle deposition technique at room temperature. The morphology, crystal structure and optical properties at various substrate rotation speeds (0-10 rpm) were investigated by field-emission scanning electron microscopy (FE-SEM), X-ray diffraction (XRD) and UV-vis spectrophotometer. The cross-section FE-SEM images illustrate that the nanostructures consist of different morphology: slanted columnar, spiral and vertical align nanorods at 0, 0.01 and 10 rpm-rotation speed, respectively. In particular, the rotation speed-controlled incoming vapor flux was found to play crucial role in the growth of nanostructure TiO2 films.

scholarly journals Optical properties of zigzag nickel nanostructures obtained at different deposition angles

2021 ◽  
Vol 53 (3) ◽  
pp. 347-353
Author(s):  
Jelena Potocnik ◽  
Maja Popovic
Keyword(s):  
Optical Properties ◽  
Structural Analysis ◽  
Glancing Angle Deposition ◽  
High Porosity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glancing Angle ◽  
Deposited Films ◽  
Angle Deposition ◽  
Nickel Nanostructures

In this study, nickel (Ni) thin films were deposited at two different angles (65o and 85o) using Glancing Angle Deposition technique, to the thicknesses of 60 - 290 nm. Structural analysis of the deposited films was performed by scanning electron microscopy and X-ray diffraction, while spectroscopic ellipsometry was used for the investigation of optical properties. Electrical resitivity of the samples was determined by four-point probe method. Structural analysis showed that the Ni films grow in a shape of zigzag nanocolumns, where the deposition angle strongly affects their porosity. As the thickness of the films increase they absorb light strongly and become less dense. Besides, samples deposited at the angle of 85o exhibit higher values of electrical resistivity as compared to the samples deposited at the angle of 65o, which can be correlated with high porosity and the growth mechanism of the deposited nanostructures.

Photo‐Induced Self‐Cleaning and Wettability in TiO 2 Nanocolumn Arrays Obtained by Glancing‐Angle Deposition with Sputtering

2021 ◽  
pp. 2100071
Author(s):  
Fernando Fresno ◽  
María U. González ◽  
Lidia Martínez ◽  
Marcial Fernández‐Castro ◽  
Mariam Barawi ◽  
...  
Keyword(s):  
Glancing Angle Deposition ◽  
Glancing Angle ◽  
Self Cleaning ◽  
Angle Deposition
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