Phototoxic maculopathy due to extreme usage of infrared illuminator–assembled night-vision handheld scope

2019 ◽  
Vol 30 (6) ◽  
pp. NP11-NP16
Author(s):  
Muhammet Derda Ozer ◽  
Muhammed Batur ◽  
Erbil Seven ◽  
Serek Tekin ◽  
Mesut Savasan

Night-vision handheld scopes are of wide use in military operations at dark conditions. In some cases in the battlefield, as in our case report, if there is no light coming from any source (neither from Moon nor from Stars), infrared light-emitting diode illumination can be coupled with night-vision goggles. Reflected illumination from the target is mostly blue filtered through the night-vision goggles objective lens. Retinal damage induced by unfiltered blue light and visible light has been previously reported. We described a phototoxic maculopathy induced by night-vision handheld scope assembled with infrared light-emitting diode illuminator in two soldiers who are on duty at nights for nearly two-thirds of the last year. The phototoxic maculopathy can represent with typical optical coherence tomography findings such as intraretinal hyperreflective accumulation particularly located on the surface of outer retinal segments defect or presumably in the vicinity of the light passageway. Here, we presented a unique factor causing phototoxic maculopathy.

2021 ◽  
pp. 103879
Author(s):  
Hyung-Joo Lee ◽  
Gwang-Hoon Park ◽  
Jin-Su So ◽  
Choong-Hun Lee ◽  
Jae-Hoon Kim ◽  
...  

Author(s):  
Qianqian Zhang ◽  
Guogang Li ◽  
Peipei Dang ◽  
Dongjie Liu ◽  
Dayu Huang ◽  
...  

Near-infrared emitting phosphor-converted light-emitting diode (NIR pc-LED) attracts much attention as the promising applications in night vision, biosensor, food composition and freshness measurement area and so on, while the discovery...


2010 ◽  
Vol 173 ◽  
pp. 1-6 ◽  
Author(s):  
Haider F. Abdul Amir ◽  
Fuei Pien Chee

In this research, optoelectronic devices consisted of an infrared light emitting diode and a phototransistor with no special handling or third party-packaging were irradiated to ionizing radiation utilizing x-rays. It was found that the devices under test (DUTs) undergo performance degradation in their functional parameters during exposure to x-rays. These damaging effects are depending on their current drives and also the Total Ionizing Dose (TID) absorbed. The TID effects by x-rays are cumulative and gradually take place throughout the lifecycle of the devices exposed to radiation.


2016 ◽  
Vol 34 (12) ◽  
pp. 610-626 ◽  
Author(s):  
Margaret A. Naeser ◽  
Paula I. Martin ◽  
Michael D. Ho ◽  
Maxine H. Krengel ◽  
Yelena Bogdanova ◽  
...  

Author(s):  
Marcela Emílio de Araújo ◽  
Marina Bozzini Paies ◽  
Ana Beatriz Arrais ◽  
Fernando Ladd Lobo ◽  
Ruthnaldo Rodrigues Melo de Lima ◽  
...  

2019 ◽  
Vol 19 (10) ◽  
pp. 6187-6191 ◽  
Author(s):  
Seung Ho Lee ◽  
Min Seok Kim ◽  
Ok-Kyun Kim ◽  
Hyung-Hwan Baik ◽  
Ji-Hye Kim

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