Evaluation of Static Performance of Optoelectronic Semiconductor Devices under X-Rays Irradiation
2010 ◽
Vol 173
◽
pp. 1-6
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Keyword(s):
X Rays
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In this research, optoelectronic devices consisted of an infrared light emitting diode and a phototransistor with no special handling or third party-packaging were irradiated to ionizing radiation utilizing x-rays. It was found that the devices under test (DUTs) undergo performance degradation in their functional parameters during exposure to x-rays. These damaging effects are depending on their current drives and also the Total Ionizing Dose (TID) absorbed. The TID effects by x-rays are cumulative and gradually take place throughout the lifecycle of the devices exposed to radiation.
2016 ◽
Vol 34
(12)
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pp. 610-626
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Keyword(s):
2011 ◽
Vol 21
(12)
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pp. 1306-1311
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Keyword(s):
2019 ◽
Vol 19
(10)
◽
pp. 6187-6191
◽
Keyword(s):
2007 ◽
Vol 121-123
◽
pp. 557-560
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Keyword(s):
2019 ◽
Vol 15
(2)
◽
pp. 113-116
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Keyword(s):
2011 ◽
pp. 114-125
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Keyword(s):