Smectite to Illite Conversion in Bentonites and Shales of the East Slovak Basin

Clay Minerals ◽  
1993 ◽  
Vol 28 (2) ◽  
pp. 243-253 ◽  
Author(s):  
V. Šucha ◽  
I. Kraust ◽  
H. Gerthofferová ◽  
J. Peteš ◽  
M. Sereková
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Diffraction Analysis ◽  
Burial Depth ◽  
X Ray Diffraction ◽  
X Ray ◽  
Potassium Fixation ◽  
Rock Types ◽  
Transmission Electron

AbstractThe conversion of smectite to illite has been studied in buried bentonites and shales of the East Slovak Neogene Basin, using X-ray diffraction analysis and transmission electron microscopy. A good correlation was observed in both rock types between the content of expandable layers in interstratified illite-smectite (I-S) minerals and burial depth (temperature), with shales from a given depth being markedly more illitic than bentonties. This difference disappeared at a depth of ~3 km, which represents a temperature of ~150°C The diameter of fundamental illite particles increased with decreasing expandability. Potassium fixation together with neoformation appear to be the mechanisms of conversion of smectite to illite.

scholarly journals Влияние термообработки на свойства композитных кремний-углеродных анодов для литий-ионных аккумуляторов

2020 ◽  
Vol 46 (3) ◽  
pp. 14
Author(s):  
Е.В. Астрова ◽  
А.В. Парфеньева ◽  
А.М. Румянцев ◽  
В.П. Улин ◽  
М.В. Байдакова ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Silicon Carbide ◽  
Diffraction Analysis ◽  
Annealing Temperature ◽  
Argon Atmosphere ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Lithium Alloys

The effect of annealing temperature in argon atmosphere on the ability of Si-C nanocomposites to reversibly insert lithium was investigated. It was found that the higher the annealing temperature during the formation of the composite, the lower is the capacitance of the electrode made from it. X-ray diffraction analysis and transmission electron microscopy reveal that the reason of the capacitance decrease is formation at T  1100°C of silicon carbide of cubic modification -SiC, inactive with respect to the formation of lithium alloys or intercalates.

Bulk mineralogy of individual micrometeorites determined by X-ray diffraction analysis and transmission electron microscopy

2001 ◽  
Vol 65 (23) ◽  
pp. 4385-4397 ◽  
Author(s):  
Tomoki Nakamura ◽  
Takaaki Noguchi ◽  
Toru Yada ◽  
Yoshihiro Nakamuta ◽  
Nobuo Takaoka
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

Microstructural Analysis of Hexagonal Close-Packed Metals Using X-Ray Diffraction and Transmission Electron Microscopy

1990 ◽  
Vol 209 ◽  
Author(s):  
M. Griffiths ◽  
J.E. Winegar
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Diffraction Analysis ◽  
Microstructural Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Hexagonal Close Packed ◽  
Direct Observations ◽  
Transmission Electron

ABSTRACTThe techniques employed for X-ray diffraction analysis of dislocation substructures in hexagonal close-packed metals are descibed and assessed by comparison with direct observations using transmission electron microscopy.

scholarly journals Immersion Sn Finish Processed on Ag Surface via Galvanic Reduction

2021 ◽  
Author(s):  
Chen Yu Wu ◽  
Yi Xuan Lin ◽  
Jyun Yang Wang ◽  
Chia Hung Lee ◽  
Chung Yu Chiu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Free Energy ◽  
Diffraction Analysis ◽  
Gibbs Free Energy ◽  
X Ray Diffraction ◽  
Detailed Mechanism ◽  
X Ray ◽  
Transmission Electron ◽  
The Common

Abstract Typically, Sn cannot be finished on Ni and Ag surfaces via the immersion process. In this work, through galvanic reaction, immersion Sn finish was processed on an immersion Ag finish coexisting with a Ni surface. Herein, the detailed mechanism of the reduction of Sn2+ ions on the immersion Ag surface through galvanic reaction is reported. Through transmission electron microscopy and X-ray diffraction analysis, the uncommon Ag4Sn phase, instead of the common Ag3Sn phase, was confirmed to form during the Sn immersion of the Ag immersion layer. The Ag4Sn phase was found to form between the Ag grains in the immersion Sn layer. The mixed Ag/Ag4Sn structure in the immersion Sn layer can be explained by the galvanic reaction. The preferred formation of the Ag4Sn during the Sn immersion of the Ag immersion layer is discussed from the viewpoint of thermodynamics. The changes in the Gibbs free energy of the formation of the Ag3Sn and Ag4Sn phases were calculated as −3.67 and −8.89 kJ/mol, respectively. This confirms that the Ag4Sn phase is the favorable phase formed in the immersion Sn over the immersion Ag layer.

A High Resolution Study of G.P. Zones in Aluminum - 4.2 at % Silver

1982 ◽  
Vol 40 ◽  
pp. 722-723 ◽  
Author(s):  
R. Gronsky
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Computer Simulations ◽  
Structural Characteristics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Resolution Study

The phenomenon of clustering in Al-Ag alloys has been extensively studied since the early work of Guinierl, wherein the pre-precipitation state was characterized as an assembly of spherical, ordered, silver-rich G.P. zones. Subsequent x-ray and TEM investigations yielded results in general agreement with this model. However, serious discrepancies were later revealed by the detailed x-ray diffraction - based computer simulations of Gragg and Cohen, i.e., the silver-rich clusters were instead octahedral in shape and fully disordered, atleast below 170°C. The object of the present investigation is to examine directly the structural characteristics of G.P. zones in Al-Ag by high resolution transmission electron microscopy.

scholarly journals Quartz Crystallite Size and Moganite Content as Indicators of the Mineralogical Maturity of the Carboniferous Chert: The Case of Cherts from Eastern Asturias (Spain)

Minerals ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 611
Author(s):  
Celia Marcos ◽  
María de Uribe-Zorita ◽  
Pedro Álvarez-Lloret ◽  
Alaa Adawy ◽  
Patricia Fernández ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Crystallite Size ◽  
Archaeological Sites ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Infrared And Raman Spectroscopy ◽  
First Time ◽  
Geological Formations

Chert samples from different coastal and inland outcrops in the Eastern Asturias (Spain) were mineralogically investigated for the first time for archaeological purposes. X-ray diffraction, X-ray fluorescence, transmission electron microscopy, infrared and Raman spectroscopy and total organic carbon techniques were used. The low content of moganite, since its detection by X-ray diffraction is practically imperceptible, and the crystallite size (over 1000 Å) of the quartz in these cherts would be indicative of its maturity and could potentially be used for dating chert-tools recovered from archaeological sites. Also, this information can constitute essential data to differentiate the cherts and compare them with those used in archaeological tools. However, neither composition nor crystallite size would allow distinguishing between coastal and inland chert outcrops belonging to the same geological formations.

Multi-scale Investigation of Heterogeneous Swift Heavy Ion Tracks in Stannate Pyrochlore

2021 ◽  
Author(s):  
Eric O'Quinn ◽  
Cameron Tracy ◽  
William F. Cureton ◽  
Ritesh Sachan ◽  
Joerg C. Neuefeind ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Modifications ◽  
Multi Scale ◽  
Ion Tracks ◽  
Swift Heavy Ion ◽  
Transmission Electron

Er2Sn2O7 pyrochlore was irradiated with swift heavy Au ions (2.2 GeV), and the induced structural modifications were systematically examined using complementary characterization techniques including transmission electron microscopy (TEM), X-ray diffraction...

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