scholarly journals Photocurrent detection of chemically tuned hierarchical ZnO nanostructures grown on seed layers formed by atomic layer deposition

2012 ◽  
Vol 7 (1) ◽  
pp. 290 ◽  
Author(s):  
Seokhwan Bang ◽  
Seungjun Lee ◽  
Youngbin Ko ◽  
Joohyun Park ◽  
Seokyoon Shin ◽  
...  
2022 ◽  
pp. 131347
Author(s):  
Zishuo Li ◽  
Chengming lou ◽  
Guanglu Lei ◽  
Guocai Lu ◽  
Hongyin Pan ◽  
...  

2019 ◽  
Vol 37 (2) ◽  
pp. 020914 ◽  
Author(s):  
Sylvia Hagedorn ◽  
Arne Knauer ◽  
Markus Weyers ◽  
Franziska Naumann ◽  
Hassan Gargouri

2009 ◽  
Vol 54 (3) ◽  
pp. 1330-1333 ◽  
Author(s):  
Dae-Yong Moon ◽  
Woong-Sung Kim ◽  
Tae-Sub Kim ◽  
Byung-Woo Kang ◽  
Jong-Wan Park ◽  
...  

2002 ◽  
Vol 17 (9) ◽  
pp. 2394-2398 ◽  
Author(s):  
Jinshan Huo ◽  
Raj Solanki ◽  
James McAndrew

Properties of copper films produced using atomic layer deposition (ALD) were characterized. Composition, morphology, and electrical properties of these films grown on glass, as well as Ta, TiN, and TaN on silicon wafers were examined. The resistivity of films thicker than about 60 nm was near bulk value. Films were deposited using a two-step ALD process in which copper(II)-1,1,1,5,5,5,-hexafluoroacetylacetonate hydrate and water vapor were introduced in the first step and a reducing agent was introduced in a subsequent step. Five reducing agents were evaluated, with the best results obtained using isopropanol or formalin. The optimum deposition temperature with isopropanol was about 260 °C, whereas it was about 300 °C with formalin. These films were also investigated as seed layers for electrodeposition of thicker Cu layers for possible interconnect applications. Excellent fills in high aspect ratio trenches were demonstrated.


2019 ◽  
Vol 7 (47) ◽  
pp. 15066-15073 ◽  
Author(s):  
Octavio Graniel ◽  
Igor Iatsunskyi ◽  
Emerson Coy ◽  
Christophe Humbert ◽  
Grégory Barbillon ◽  
...  

Au-covered hollow urchin-like ZnO nanostructures were prepared with controlled size by combining nanosphere lithography (NSL), atomic layer deposition (ALD), electrodeposition, and electron beam (e-beam) evaporation.


2015 ◽  
Vol 44 (43) ◽  
pp. 18804-18809 ◽  
Author(s):  
Gengping Wan ◽  
Guizhen Wang ◽  
Xianqin Huang ◽  
Haonan Zhao ◽  
Xinyue Li ◽  
...  

A uniform ZnO@Fe3O4 core–shell structure is prepared by an ALD method, which shows great potential for microwave absorption materials.


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