scholarly journals Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications

2021 ◽  
Vol 51 (1) ◽  
Author(s):  
Young-Min Kim ◽  
Jihye Lee ◽  
Deok-Jin Jeon ◽  
Si-Eun Oh ◽  
Jong-Souk Yeo
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Electrostatic Force ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization ◽  
High Resolution Analysis ◽  
Resolution Analysis ◽  
Recognition Errors

AbstractNeuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand the characteristics of the switching process. As changes by switching cycle occur at local nanoscale areas, a high-resolution analysis method is needed to investigate this phenomenon. Atomic force microscopy (AFM) is used to analyze the local changes because it offers nanoscale detection with high-resolution capabilities. This review introduces various types of AFM such as conductive AFM (C-AFM), electrostatic force microscopy (EFM), and Kelvin probe force microscopy (KPFM) to study switching behaviors.

On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

2018 ◽  
Vol 24 (2) ◽  
pp. 126-131 ◽  
Author(s):  
Sergey Y. Luchkin ◽  
Keith J. Stevenson
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Electrostatic Force ◽  
Experimental Results ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Potential Sensitivity

AbstractIn this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.

scholarly journals Application of Atomic Force Microscopy in Organic and Perovskite Photovoltaics

2021 ◽  
Author(s):  
Chandra Shakher Pathak
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Composition ◽  
High Resolution ◽  
Electronic Properties ◽  
Electrical Characterization ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Photovoltaic Materials

Atomic force microscopy (AFM) has become widely used technique in air, liquids, or vacuum to generate high-resolution topographic images of a surface having a nanometer-scale resolution. AFM gives the information about the morphology, phase composition etc. Photovoltaic materials have been attracting intense interest due to their performance and the morphology as well as quality of these materials affects their performance. AFM is now a day widely used technique for morphology and other electronic properties measurements at nanoscale for photovoltaic materials to understand their relation with device performance. This chapter describe the brief introduction of Kelvin probe force microscopy (KPFM) and conducting atomic force microscopy (CAFM) and their application in electrical characterization at nanoscale of organic and perovskite photovoltaic materials.

scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

Imaging of Xenopus laevis Oocyte Plasma Membrane in Physiological-Like Conditions by Atomic Force Microscopy

2013 ◽  
Vol 19 (5) ◽  
pp. 1358-1363 ◽  
Author(s):  
Massimo Santacroce ◽  
Federica Daniele ◽  
Andrea Cremona ◽  
Diletta Scaccabarozzi ◽  
Michela Castagna ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Plasma Membrane ◽  
High Resolution ◽  
Membrane Proteins ◽  
Xenopus Laevis ◽  
Functional Study ◽  
Xenopus Laevis Oocyte ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

AbstractXenopus laevis oocytes are an interesting model for the study of many developmental mechanisms because of their dimensions and the ease with which they can be manipulated. In addition, they are widely employed systems for the expression and functional study of heterologous proteins, which can be expressed with high efficiency on their plasma membrane. Here we applied atomic force microscopy (AFM) to the study of the plasma membrane of X. laevis oocytes. In particular, we developed and optimized a new sample preparation protocol, based on the purification of plasma membranes by ultracentrifugation on a sucrose gradient, to perform a high-resolution AFM imaging of X. laevis oocyte plasma membrane in physiological-like conditions. Reproducible AFM topographs allowed visualization and dimensional characterization of membrane patches, whose height corresponds to a single lipid bilayer, as well as the presence of nanometer structures embedded in the plasma membrane and identified as native membrane proteins. The described method appears to be an applicable tool for performing high-resolution AFM imaging of X. laevis oocyte plasma membrane in a physiological-like environment, thus opening promising perspectives for studying in situ cloned membrane proteins of relevant biomedical/pharmacological interest expressed in this biological system.

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