Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Keyword(s):
2010 ◽
Vol 29
(5)
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pp. 760-773
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Keyword(s):
2011 ◽
pp. 21-36
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Keyword(s):
Keyword(s):
Keyword(s):
2011 ◽
Vol 28
(2)
◽
pp. 52-61
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