Nondestructive Analysis of Depth Distribution of Materials by Confocal X-ray Diffraction

AbstractWell-defined, homogenous, deep-buried 3C-SiC layers have been formed in silicon by ion beam synthesis using MeV C+ ions. Layers are characterized by RBS/channeling, X-ray diffraction, x-sectional TEM and electron diffraction. The redistribution of implanted carbon atoms into a rectangular carbon depth distribution associated with a well-defined layer during the post-implantation anneal is shown to depend strongly on the existence of crystalline carbide precipitates in the as-implanted state.

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In-Depth Distribution of Stresses Measured by Multireflection Grazing Incidence Diffraction

Materials Science Forum ◽

10.4028/www.scientific.net/msf.772.143 ◽

2013 ◽

Vol 772 ◽

pp. 143-147

Author(s):

Marianna Marciszko ◽

Andrzej Stanisławczyk ◽

Andrzej Baczmanski ◽

Krzysztof Wierzbanowski ◽

Wilfrid Seiler ◽

...

Keyword(s):

Depth Distribution ◽

Grazing Incidence ◽

Inverse Laplace Transform ◽

Stress Profile ◽

X Ray Diffraction ◽

X Ray ◽

Grazing Incidence Diffraction ◽

Destructive Analysis ◽

Sample Range ◽

Non Destructive

The geometry based on the multireflection grazing incidence X-ray diffraction (called the MGIXD method) can be applied to measure residual stresses. Using this method, it is possible to perform a non-destructive analysis of the heterogeneous stresses for different and well defined volumes below the surface of the sample (range of several mm). As the result the average values of stresses weighted by absorption of X-ray radiation are measured. In this work the stress profile as a function of depth for mechanically polished Ti and Al samples were calculated from MGIXD data using inverse Laplace transform.

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Depth Distribution of Ge Fraction in Very-Thin-SGOI Layers Using Total-External-Reflection X-ray Diffraction

Transactions of the Materials Research Society of Japan ◽

10.14723/tmrsj.33.599 ◽

2008 ◽

Vol 33 (3) ◽

pp. 599-602

Author(s):

T. Kawamura ◽

H. Omi ◽

M. Mizumaki ◽

S. Kimura

Keyword(s):

Depth Distribution ◽

Total External Reflection ◽

X Ray Diffraction ◽

X Ray

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Thermal Behaviour of Implanted Nitrogen and Accumulated Hydrogen in Titanium

MRS Proceedings ◽

10.1557/proc-504-231 ◽

1997 ◽

Vol 504 ◽

Author(s):

M. Soltani-Farshi ◽

H. Baumann ◽

D. Rück ◽

G. Walter ◽

K. Bethge

Keyword(s):

Ion Implantation ◽

Depth Distribution ◽

Depth Profiling ◽

Grazing Incidence ◽

X Ray Diffraction ◽

Nitrogen Ion Implantation ◽

X Ray ◽

Depth Profiles ◽

Hydrogen Accumulation ◽

Nitrogen Ion

ABSTRACTThe influence of nitrogen ion implantation on the hydrogen accumulation in titanium was investigated as function of sample temperature and ion fluence. 150 keV nitrogen (15N) ions were implanted at different sample temperatures up to 700°C with fluences ranging from 1 × 1017 to 1 × 1018 ions/cm2. The amount of accumulated hydrogen and its depth distribution was measured quantitatively with the 15N depth profiling method. The implanted 15N depth profiles were measured by the reverse reaction 15N(p, αγ)12C at 429 keV. The binary phases of the implanted nitrogen with titanium are detected by grazing incidence x-ray diffraction. The results are compared with those obtained for samples implanted at RT and subsequently thermally treated.

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Evidence of transition metal diffusion during hydrothermal ceramic film growth: Ba(Ti,Zr)O3on layered Ti–Zr alloy

Journal of Materials Research ◽

10.1557/jmr.1999.0558 ◽

1999 ◽

Vol 14 (11) ◽

pp. 4136-4139 ◽

Cited By ~ 7

Author(s):

Alejandra V. Alvarez ◽

V. M. Fuenzalida

Keyword(s):

Photoelectron Spectroscopy ◽

Depth Distribution ◽

Film Growth ◽

Hydrothermal Process ◽

X Ray Diffraction ◽

X Ray ◽

Metal Diffusion ◽

Homogeneous Composition ◽

Platinum Layer ◽

Zr Alloy

Ti–Zr alloy thin films of 20–60 nm in thickness were evaporated on Pt-coated silicon wafers. The films exhibited a layered Ti–Zr depth distribution. The films were then treated hydrothermally in 0.25 M Ba(OH)2at 150 and 200 °C for 4–8 h. Films treated at 150 °C did not exhibit reflections from the Ba(TixZr1−x)O3perovskite structure by x-ray diffraction, although a slight barium content was detected by x-ray photoelectron spectrometry. On the other hand, the films treated hydrothermally at 200 °C revealed reflections corresponding to perovskite Ba(TixZr1−x)O3. These films exhibited a homogeneous titanium and zirconium depth distribution, as shown by x-ray photoelectron spectroscopy and Auger depth profiles, proving that either titanium or zirconium ions diffuse during the hydrothemal treatment. The initial Ti–Zr film was completely consumed during the hydrothermal process, leading to a film of homogeneous composition (Ba, Ti, and Zr) up to the interface with the platinum layer.

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Nondestructive Structure Analysis of High-Strength Steel Wire for Suspension Bridge Engineering

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.174-177.1415 ◽

2012 ◽

Vol 174-177 ◽

pp. 1415-1418

Author(s):

Fan Yang ◽

Ying Ying Fan

Keyword(s):

Steel Wire ◽

High Strength ◽

Pearlitic Steel ◽

Suspension Bridge ◽

Bridge Engineering ◽

Nondestructive Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Simulation Based ◽

Cold Worked

High strength of drawn pearlitic steel wire is widely utilized in suspension bridge engineering. One of the most powerful nondestructive analysis methods on determining the dislocation character of this heavily cold worked material is the analysis in the broadening in the X–ray diffraction lines. In this letter, line-profile simulation based on Fourier analysis in the drawn steel wire is employed. The analytical process taking size and dislocation broadening into account provides the dislocation character on density and arrangement parameters, which is beyond effective over conventional metallographical approach.

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