J0402-1-5 Development of Elastic-Constant Measurement in THin Films at Low Temperatures Using Picosecond Laser Ultrasound Spectroscopy

2010 ◽  
Vol 2010.6 (0) ◽  
pp. 393-394
Author(s):  
Kenichi TANIGAKI ◽  
Tatsuya KUSUMOTO ◽  
Hirotsugu OGI ◽  
Nobutomo NAKAMURA ◽  
Masahiko HIRAO
Keyword(s):  
Thin Films ◽  
Elastic Constant ◽  
Low Temperatures ◽  
Picosecond Laser ◽  
Laser Ultrasound ◽  
Constant Measurement

Elastic Constant Measurement in Supported W/Cu Multilayer Thin Films by X-Ray Diffraction

2002 ◽  
Vol 404-407 ◽  
pp. 791-796
Author(s):  
Pascale Villain ◽  
Philippe Goudeau ◽  
Pierre Olivier Renault ◽  
K.F. Badawi
Keyword(s):  
Thin Films ◽  
Elastic Constant ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Constant Measurement

scholarly journals Elastic-Constant Measurement in Oxide and Semiconductor Thin Films by Brillouin Oscillations Excited by Picosecond Ultrasound

2009 ◽  
Vol 48 (7) ◽  
pp. 07GA01 ◽  
Author(s):  
Hirotsugu Ogi ◽  
Tomohiro Shagawa ◽  
Nobutomo Nakamura ◽  
Masahiko Hirao ◽  
Hidefumi Odaka ◽  
...  
Keyword(s):  
Thin Films ◽  
Elastic Constant ◽  
Semiconductor Thin Films ◽  
Constant Measurement

scholarly journals Measurement of Elastic Constant and Refraction Index of Thin Films at Low Temperatures Using Picosecond Ultrasound

2010 ◽  
Vol 49 (7) ◽  
pp. 07HB01 ◽  
Author(s):  
Kenichi Tanigaki ◽  
Tatsuya Kusumoto ◽  
Hirotsugu Ogi ◽  
Nobutomo Nakamura ◽  
Masahiko Hirao
Keyword(s):  
Thin Films ◽  
Elastic Constant ◽  
Low Temperatures ◽  
Refraction Index

ANOMALOUS MAGNETIZATION PROCESSES AT LOW TEMPERATURES IN COMPOSITIONALLY MODULATED Co/Mn THIN FILMS

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-1753-C8-1754
Author(s):  
H. Sakakima ◽  
M. Tessier ◽  
R. Krishnan ◽  
E. Hirota
Keyword(s):  
Thin Films ◽  
Low Temperatures ◽  
Magnetization Processes

scholarly journals Structural defects in ZnO thin films grown by atomic layer deposition at low temperatures

2021 ◽  
Vol 27 (S1) ◽  
pp. 2660-2662
Author(s):  
David Elam ◽  
Eduardo Ortega ◽  
Andrey Chabanov ◽  
Arturo Ponce
Keyword(s):  
Thin Films ◽  
Atomic Layer Deposition ◽  
Low Temperatures ◽  
Atomic Layer ◽  
Structural Defects ◽  
Zno Thin Films ◽  
Layer Deposition

Hydrothermal synthesis of heteroepitaxial Pb(ZrxTi1−x)O3 thin films at 90–150 °C

1997 ◽  
Vol 12 (5) ◽  
pp. 1176-1178 ◽  
Author(s):  
A. T. Chien ◽  
J. S. Speck ◽  
F. F. Lange
Keyword(s):  
Thin Films ◽  
Low Temperatures ◽  
High Dielectric Constant ◽  
Ambient Pressure ◽  
Random Access ◽  
Random Access Memory ◽  
Molar Ratio ◽  
Access Memory ◽  
Eds Analysis ◽  
High Dielectric

Pb(ZrxTi1−x)O3 and PbZrO3 heteroepitaxial thin films were produced in an aqueous solution (10 M KOH) at ambient pressure and low temperatures (90–150 °C) on (001) SrTiO3 and LaAlO3 single crystal substrates. Growth of the Pb(ZrxTi1−x)O3 and PbZrO3 thin films initiates by the formation of {100} faceted islands. Energy dispersive spectroscopy (EDS) analysis of the Pb(ZrxTi1−x)O3 thin film shows that the Zr: Ti ratio is 45: 56, nearly identical to the molar ratio of the precursors. This route might provide a viable low temperature alternative for the formation of high dielectric constant thin films for applications such as dynamic random access memory (DRAM).

Picosecond laser pulse-driven crystallization behavior of SiSb phase change memory thin films

2011 ◽  
Vol 128 (3) ◽  
pp. 405-409 ◽  
Author(s):  
Huan Huang ◽  
Simian Li ◽  
Fengxiao Zhai ◽  
Yang Wang ◽  
Tianshu Lai ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Pulse ◽  
Phase Change ◽  
Crystallization Behavior ◽  
Phase Change Memory ◽  
Picosecond Laser ◽  
Picosecond Laser Pulse ◽  
Change Memory
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