scholarly journals Measurement of film thickness distribution by surface plasmon resonance using a micro-lens array

2015 ◽  
Vol 81 (832) ◽  
pp. 15-00291-15-00291
Author(s):  
Yoshiki KANEOKA ◽  
Ryoichi SAKASHITA ◽  
Yasuhiro MIZUTANI ◽  
Tetsuo IWATA
Keyword(s):  
Surface Plasmon Resonance ◽  
Film Thickness ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Thickness Distribution ◽  
Lens Array ◽  
Micro Lens Array ◽  
Micro Lens

scholarly journals Film Thickness Dependence of Surface Plasmon Resonance Behavior at a Grating Structure of Highly Ga‐Doped ZnO

2020 ◽  
Vol 218 (1) ◽  
pp. 2000150
Author(s):  
Chi-Wu Liu ◽  
Chi-Chung Chen ◽  
Yung-Chen Cheng ◽  
Po-Yu Chen ◽  
Wen-Yen Chang ◽  
...  
Keyword(s):  
Surface Plasmon Resonance ◽  
Film Thickness ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Thickness Dependence ◽  
Grating Structure ◽  
Resonance Behavior ◽  
Doped Zno

SURFACE PLASMON RESONANCE SENSOR OF SILVER FILM BASED ON KRETCHMANN CONFIGURATION

2015 ◽  
Vol 76 (13) ◽  
Author(s):  
Hood-Hong Ley ◽  
Asiah Yahaya ◽  
Yusof Munajat
Keyword(s):  
Surface Plasmon Resonance ◽  
Film Thickness ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Silver Film ◽  
Incident Angle ◽  
Theoretical Simulation ◽  
Spr Sensor ◽  
Resonance Sensor ◽  
Instrumental Resolution

Performance of a surface plasmon resonance (SPR) sensor based on Kretchmann configuration for silver (Ag) film is evaluated via theoretical simulation. The film thickness and incident angle are varied to obtain the SPR wavelength in the range of 500-550 nm. Shift of SPR wavelength with refractive index of the dielectric defines the sensitivity whereas the resolution is obtained from the ratio of the instrumental resolution to the sensitivity. The SPR sensor shows increasing sensitivity for thicker film however the absorption magnitudes of such films are high and unfavourable for data acquisition. Film thickness of 45 nm and 50 nm which has good sensitivity and resolution with high absorbance magnitude of the SPR wavelength is the best thickness to be employed for sensing purpose.

In Situ Observation of Formation Behavior of Adsorption Film in the Narrow Space Using Surface Plasmon Resonance (SPR) Method

2017 ◽  
Vol 739 ◽  
pp. 56-62
Author(s):  
Koki Fukuta ◽  
Satoru Maegawa ◽  
Fumihiro Itoigawa ◽  
Takashi Nakamura
Keyword(s):  
Surface Plasmon Resonance ◽  
Film Thickness ◽  
Real Time ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Film Growth ◽  
High Sensitivity ◽  
Adsorption Film ◽  
Base Oil

In this paper, an application of the surface plasmon resonance (SPR) method to real-time and in-situ measurements of changes in adsorption film thickness, e.g., fatty acid adsorbed films, is presented. As discussed in the previous study, the high sensitivity and overall simplicity of its optical system make the SPR method advantageous for monitoring lubricant film thickness. In order to demonstrate the high sensitivity of the SPR method, in-situ and real-time adsorption film growth processes of stearic acid (additives) in hexadecane (base oil) were monitored using the Otto configuration. Based on a comparison between experimental and model calculation results, changes in the adsorption film thickness during a series of different contact tests were measured.

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