Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing
Keyword(s):
2014 ◽
Vol 30
(1)
◽
pp. 77-85
◽
2017 ◽
Vol 10
(04)
◽
pp. 710-717
2019 ◽
Vol 66
(3)
◽
pp. 412-416
◽
Keyword(s):
2007 ◽
Vol 1
(4)
◽
pp. 369
◽
1998 ◽
Vol 45
(9)
◽
pp. 1304-1307
◽
Keyword(s):
Keyword(s):
2014 ◽
Vol 11
(2)
◽
pp. 1
◽