Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing

Author(s):  
Lung-Jen Lee ◽  
Wang-Dauh Tseng ◽  
Rung-Bin Lin ◽  
Chi-Wei Yu
2017 ◽  
Vol 10 (04) ◽  
pp. 710-717
Author(s):  
A. Ahmad ◽  
D. Al Abri ◽  
S. S. Al Busaidi ◽  
M. M. Bait-Suwailam

The authors show that in a Built-In Self-Test (BIST) technique, based on linear-feedback shift registers, when the feedback connections in pseudo-random test-sequence generator and signature analyzer are images of each other and corresponds to primitive characteristic polynomial then behaviors of faults masking remains identical. The simulation results of single stuck-at faults show how the use of such feedback connections in pseudo-random test-sequence generator and signature analyzer yields to mask the same faults.


2014 ◽  
Vol 11 (2) ◽  
pp. 1 ◽  
Author(s):  
A Ahmad ◽  
A Al Maashri

The study of the length of pseudo-random binary sequences generated by Linear- Feedback Shift Registers (LFSRs) plays an important role in the design approaches of built-in selftest, cryptosystems, and other applications. However, certain LFSR structures might not be appropriate in some situations. Given that determining the length of generated pseudo-random binary sequence is a complex task, therefore, before using an LFSR structure, it is essential to investigate the length and the properties of the sequence. This paper investigates some conditions and LFSR’s structures, which restrict the pseudo-random binary sequences’ generation to a certain fixed length. The outcomes of this paper are presented in the form of theorems, simulations, and analyses. We believe that these outcomes are of great importance to the designers of built-in self-test equipment, cryptosystems, and other applications such as radar, CDMA, error correction, and Monte Carlo simulation. 


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