Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing

2009 ◽  
Author(s):  
Lung-Jen Lee ◽  
Wang-Dauh Tseng ◽  
Rung-Bin Lin ◽  
Chi-Wei Yu
Keyword(s):  
Low Power ◽  
Linear Feedback ◽  
Linear Feedback Shift Registers ◽  
Scan Testing ◽  
Feedback Shift Registers ◽  
Self Test ◽  
Built In Self Test

scholarly journals What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

2017 ◽  
Vol 10 (04) ◽  
pp. 710-717
Author(s):  
A. Ahmad ◽  
D. Al Abri ◽  
S. S. Al Busaidi ◽  
M. M. Bait-Suwailam
Keyword(s):  
Linear Feedback ◽  
Test Sequence ◽  
Linear Feedback Shift Registers ◽  
Random Test ◽  
Signature Analyzer ◽  
Simulation Results ◽  
Feedback Shift Registers ◽  
Self Test ◽  
Sequence Generator ◽  
Feedback Connections

The authors show that in a Built-In Self-Test (BIST) technique, based on linear-feedback shift registers, when the feedback connections in pseudo-random test-sequence generator and signature analyzer are images of each other and corresponds to primitive characteristic polynomial then behaviors of faults masking remains identical. The simulation results of single stuck-at faults show how the use of such feedback connections in pseudo-random test-sequence generator and signature analyzer yields to mask the same faults.

scholarly journals On Sequence Lengths of Some Special External Exclusive OR Type LFSR Structures – Study and Analysis

2014 ◽  
Vol 11 (2) ◽  
pp. 1 ◽  
Author(s):  
A Ahmad ◽  
A Al Maashri
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Binary Sequence ◽  
Binary Sequences ◽  
Linear Feedback ◽  
Complex Task ◽  
Linear Feedback Shift Registers ◽  
Feedback Shift Registers ◽  
Self Test ◽  
Exclusive Or

The study of the length of pseudo-random binary sequences generated by Linear- Feedback Shift Registers (LFSRs) plays an important role in the design approaches of built-in selftest, cryptosystems, and other applications. However, certain LFSR structures might not be appropriate in some situations. Given that determining the length of generated pseudo-random binary sequence is a complex task, therefore, before using an LFSR structure, it is essential to investigate the length and the properties of the sequence. This paper investigates some conditions and LFSR’s structures, which restrict the pseudo-random binary sequences’ generation to a certain fixed length. The outcomes of this paper are presented in the form of theorems, simulations, and analyses. We believe that these outcomes are of great importance to the designers of built-in self-test equipment, cryptosystems, and other applications such as radar, CDMA, error correction, and Monte Carlo simulation. 

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