Simulation comparisons of monitoring strategies in narrow bandpass filters and antireflection coatings

2013 ◽  
Vol 53 (4) ◽  
pp. A27 ◽  
Author(s):  
Ronald R. Willey
Keyword(s):  
Bandpass Filters ◽  
Antireflection Coatings ◽  
Monitoring Strategies

Atomic layer deposition of Al_2O_3 and TiO_2 multilayers for applications as bandpass filters and antireflection coatings

2009 ◽  
Vol 48 (9) ◽  
pp. 1727 ◽  
Author(s):  
Adriana Szeghalmi ◽  
Michael Helgert ◽  
Robert Brunner ◽  
Frank Heyroth ◽  
Ulrich Gösele ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Bandpass Filters ◽  
Antireflection Coatings ◽  
Layer Deposition

Spurious Suppression Effect by Transmit Bandpass Filters with HTS Dual-Mode Resonators for 5GHz Band

2009 ◽  
Vol E92-C (3) ◽  
pp. 288-295
Author(s):  
Kazunori YAMANAKA ◽  
Kazuaki KURIHARA ◽  
Akihiko AKASEGAWA ◽  
Masatoshi ISHII ◽  
Teru NAKANISHI
Keyword(s):  
Bandpass Filters ◽  
Dual Mode ◽  
Suppression Effect ◽  
Spurious Suppression

Investigation of HTS Microstrip Bandpass Filters for Extreme Working Conditions

2002 ◽  
Vol 57 (12) ◽  
pp. 6
Author(s):  
I. V. Korotash ◽  
M. Lorenz ◽  
E.M. Rudenko ◽  
T.V. Stepanova
Keyword(s):  
Working Conditions ◽  
Bandpass Filters

Antireflection Coatings for Semiconductor Failure Analysis

2000 ◽  
Author(s):  
Brennan Davis ◽  
Wilson Chi
Keyword(s):  
Failure Analysis ◽  
Material Properties ◽  
Antireflection Coating ◽  
Antireflection Coatings ◽  
Imaging Quality ◽  
Quality Material

Abstract The use of an antireflection coating for backside semiconductor failure analysis is discussed. The process of selecting an appropriate coating is described. Several known coatings are also described in regards to imaging quality, material properties, and the benefits to device analysis applications.

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