Analysis and correction of distortions in a spatial heterodyne spectrometer system

2019 ◽  
Vol 58 (9) ◽  
pp. 2190 ◽  
Author(s):  
Jilin Liu ◽  
Daikang Wei ◽  
Oliver Wroblowski ◽  
Qiuyu Chen ◽  
Klaus Mantel ◽  
...  
Author(s):  
P. E. Batson ◽  
C. H. Chen ◽  
J. Silcox

Electron energy loss experiments combined with microscopy have proven to be a valuable tool for the exploration of the structure of electronic excitations in materials. These types of excitations, however, are difficult to measure because of their small intensity. In a usual situation, the filament of the microscope is run at a very high temperature in order to present as much intensity as possible at the specimen. This results in a degradation of the ultimate energy resolution of the instrument due to thermal broadening of the electron beam.We report here observations and measurements on a new LaB filament in a microscope-velocity spectrometer system. We have found that, in general, we may retain a good energy resolution with intensities comparable to or greater than those available with the very high temperature tungsten filament. We have also explored the energy distribution of this filament.


1986 ◽  
Vol 75 ◽  
Author(s):  
Harold F. Winters ◽  
D. Haarer

AbstractIt has been recognized for some time that the doping level in silicon influences etch rate in plasma environments[1–8]. We have now been able to reproduce and investigate these doping effects in a modulated-beam, mass spectrometer system described previously [9] using XeF2 as the etchant gas. The phenomena which have been observed in plasma reactors containing fluorine atoms are also observed in our experiments. The data has led to a model which explains the major trends.


Sensors ◽  
2011 ◽  
Vol 11 (3) ◽  
pp. 2408-2425 ◽  
Author(s):  
Lifu Zhang ◽  
Changping Huang ◽  
Taixia Wu ◽  
Feizhou Zhang ◽  
Qingxi Tong

Tellus B ◽  
2004 ◽  
Vol 56 (4) ◽  
pp. 322-338 ◽  
Author(s):  
RALPH F. KEELING ◽  
TEGAN BLAINE ◽  
BILL PAPLAWSKY ◽  
LAURA KATZ ◽  
CHRIS ATWOOD ◽  
...  

2008 ◽  
Vol 47 (34) ◽  
pp. 6371 ◽  
Author(s):  
James E. Lawler ◽  
Zac E. Labby ◽  
John M. Harlander ◽  
Frederick L. Roesler

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