scholarly journals Ultrafast Laser Machining of Transparent Materials: Process Development Supported by In-Situ Diagnostics

Author(s):  
M. Kumkar ◽  
M. Kaiser ◽  
J. Kleiner ◽  
D. Flamm ◽  
D. Grossmann ◽  
...  
2021 ◽  
Author(s):  
Malte Kumkar ◽  
Myriam Kaiser ◽  
Jonas Kleiner ◽  
Daniel Günther Grossmann ◽  
Daniel Flamm ◽  
...  

For the development of industrial NIR ultrafast laser processing of transparent materials, the absorption inside the bulk material has to be controlled. Applications we aim for are front and rear side ablation, drilling and inscription of modifications for cleaving and selective laser etching of glass and sapphire in sheet geometry. We applied pump probe technology and in situ stress birefringence microscopy for fundamental studies on the influence of energy and duration (100 fs – 20 ps), temporal and spatial spacing, focusing and beam shaping of the laser pulses. Applying pump probe technique we are able to visualize differences of spatio-temporal build up of absorption, self focusing, shock wave generation for standard, multispot and beam shaped focusing. Incubation effects and disturbance of beam propagation due to modifications or ablation can be observed. In-situ imaging of stress birefringence gained insight in transient build up of stress with and without translation. The results achieved so far, demonstrate that transient stress has to be taken into account in scaling the laser machining throughput of brittle materials. Furthermore it points out that transient stress birefringence is a good indicator for accumulation effects, supporting tailored processing strategies.Cutting results achieved for selective laser etching by single pass laser modification exemplifies the benefits of process development supported by in situ diagnostics.


2016 ◽  
Author(s):  
M. Kumkar ◽  
M. Kaiser ◽  
J. Kleiner ◽  
D. Grossmann ◽  
D. Flamm ◽  
...  

2021 ◽  
Author(s):  
Malte Kumkar ◽  
Myriam Kaiser ◽  
Jonas Kleiner ◽  
Daniel Flamm ◽  
Daniel Günther Grossmann ◽  
...  

With availability of high power ultra short pulsed lasers, one prerequisite towards throughput scaling demanded for industrial ultrafast laser processing was recently achieved. We will present different scaling approaches for ultrafast machining, including raster and vector based concepts. The main attention is on beam shaping for enlarged, tailored processed volume per pulse. Some aspects on vector based machining using beam shaping are discussed. With engraving of steel and full thickness modification of transparent materials, two different approaches for throughput scaling by confined interaction volume, avoiding detrimental heat accumulation, are exemplified. In Contrast, welding of transparent materials based on nonlinear absorption benefits from ultra short pulse processing in heat accumulation regime. Results on in-situ stress birefringence microscopy demonstrate the complex interplay of processing parameters on heat accumulation. With respect to process development, the potential of in-in-situ diagnostics, extended to high power ultrafast lasers and diagnostics allowing for multi-scale resolution in space and time is addressed.


Author(s):  
Ted Kolasa ◽  
Alfredo Mendoza

Abstract Comprehensive in situ (designed-in) diagnostic capabilities have been incorporated into digital microelectronic systems for years, yet similar capabilities are not commonly incorporated into the design of analog microelectronics. And as feature sizes shrink and back end interconnect metallization becomes more complex, the need for effective diagnostics for analog circuits becomes ever more critical. This paper presents concepts for incorporating in situ diagnostic capability into analog circuit designs. Aspects of analog diagnostic system architecture are discussed as well as nodal measurement scenarios for common signal types. As microelectronic feature sizes continue to shrink, diagnostic capabilities such as those presented here will become essential to the process of fault localization in analog circuits.


Author(s):  
V. A. Kurnaev ◽  
V. E. Nikolaeva ◽  
S. A. Krat ◽  
E. D. Vovchenko ◽  
A. V. Kaziev ◽  
...  

2021 ◽  
Vol 104 (8) ◽  
pp. 283-292
Author(s):  
David Alexander ◽  
Jake Pellicotte ◽  
Alejandro Mejia ◽  
Caitlin Benway ◽  
Calvin Maurice Stewart ◽  
...  

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