Transversely incident beam wave scattering from inhomogeneous fibers

1980 ◽  
Vol 70 (7) ◽  
pp. 799 ◽  
Author(s):  
R. F. Cordero Iannarella
Keyword(s):  
Wave Scattering ◽  
Incident Beam ◽  
Beam Wave

scholarly journals Light polarization and the Brewster law

2021 ◽  
Author(s):  
A.P. Pylaev
Keyword(s):  
Light Beam ◽  
Relative Intensity ◽  
Incident Beam ◽  
Light Polarization ◽  
Beam Wave ◽  
Wave Trains ◽  
The Law

It was obtained an analytical dependance of the relative intensity of the light beam reflected from the boundary of two transparent bodies expressing the law been established experimentally by Brewster. It was found on basis of comparison of the values of parallel and perpendicular components of the electrical vectors of the incident beam wave trains to the direction of the reflected beam.

Elastic Wave Scattering From an Interface Crack in a Layered Half Space Submerged in Water: Part II: Incident Plane Waves and Bounded Beams

1986 ◽  
Vol 53 (2) ◽  
pp. 333-338 ◽  
Author(s):  
S. M. Gracewski ◽  
D. B. Bogy
Keyword(s):  
Elastic Wave ◽  
Half Space ◽  
Interface Crack ◽  
Wave Scattering ◽  
Ultrasonic Transducer ◽  
Plane Waves ◽  
Incident Beam ◽  
Numerical Results ◽  
Elastic Wave Scattering ◽  
Layered Half Space

This is Part II of a two part paper which analyzes time harmonic elastic wave scattering by an interface crack in a layered half space submerged in water. The analytic solution was derived in Part I. Also numerical results for uniform harmonic normal or shear traction applied to the liquid-solid interface were presented. These were compared with previously published results as a check on the computer program used to obtain the numerical results. Here in Part II, additional numerical results are presented. Plane waves incident from the liquid onto the solid structure are first considered to gain insight into the response characteristics of the structure. The solution for an incident beam of Gaussian profile is then presented since this profile approximates the output of an ultrasonic transducer.

Instrumentation for detecting channelling radiation in the high-voltage electron microscope

1983 ◽  
Vol 41 ◽  
pp. 318-319
Author(s):  
J. H. Butler ◽  
C. J. Humphreys
Keyword(s):  
Monochromatic Light ◽  
Incident Beam ◽  
Laboratory Frame ◽  
Relativistic Electrons ◽  
Voltage Electron ◽  
Dipole Emission ◽  
Sinusoidal Oscillations ◽  
Pass Through ◽  
Incident Beam Energy ◽  
Increasing Function

Electromagnetic radiation is emitted when fast (relativistic) electrons pass through crystal targets which are oriented in a preferential (channelling) direction with respect to the incident beam. In the classical sense, the electrons perform sinusoidal oscillations as they propagate through the crystal (as illustrated in Fig. 1 for the case of planar channelling). When viewed in the electron rest frame, this motion, a result of successive Bragg reflections, gives rise to familiar dipole emission. In the laboratory frame, the radiation is seen to be of a higher energy (because of the Doppler shift) and is also compressed into a narrower cone of emission (due to the relativistic “searchlight” effect). The energy and yield of this monochromatic light is a continuously increasing function of the incident beam energy and, for beam energies of 1 MeV and higher, it occurs in the x-ray and γ-ray regions of the spectrum. Consequently, much interest has been expressed in regard to the use of this phenomenon as the basis for fabricating a coherent, tunable radiation source.

Arsenic segregation in polysilicon

1983 ◽  
Vol 41 ◽  
pp. 154-155 ◽  
Author(s):  
P.E. Batson ◽  
C.R.M. Grovenor ◽  
D.A. Smith ◽  
C. Wong
Keyword(s):  
Incident Beam ◽  
Silicon Wafers ◽  
Chemical Polishing ◽  
Bright Field Image ◽  
Beam Size ◽  
Stem Analysis ◽  
Bright Field ◽  
Twin Boundaries ◽  
X Ray ◽  
Line Scan

In this work As doped polysilicon was deposited onto (100) silicon wafers by APCVD at 660°C from a silane-arsine mixture, followed by a ten minute anneal at 1000°C, and in one case a further ten minute anneal at 700°C. Specimens for TEM and STEM analysis were prepared by chemical polishing. The microstructure, which is unchanged by the final 700°C anneal,is shown in Figure 1. It consists of numerous randomly oriented grains many of which contain twins.X-ray analysis was carried out in a VG HB5 STEM. As K α x-ray counts were collected from STEM scans across grain and twin boundaries, Figures 2-4. The incident beam size was about 1.5nm in diameter, and each of the 20 channels in the plots was sampled from a 1.6nm length of the approximately 30nm line scan across the boundary. The bright field image profile along the scanned line was monitored during the analysis to allow correlation between the image and the x-ray signal.

Resolution Attainable With the Present Day STEM

1973 ◽  
Vol 31 ◽  
pp. 230-231 ◽  
Author(s):  
J. S. Wall ◽  
J. P. Langmore ◽  
H. Isaacson ◽  
A. V. Crewe
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Incident Beam ◽  
Scanning Transmission Electron Microscope ◽  
Aperture Size ◽  
Magnetic Lens ◽  
Peak Intensity ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Half Angle

The scanning transmission electron microscope (STEM) constructed by the authors employs a field emission gun and a 1.15 mm focal length magnetic lens to produce a probe on the specimen. The aperture size is chosen to allow one wavelength of spherical aberration at the edge of the objective aperture. Under these conditions the profile of the focused spot is expected to be similar to an Airy intensity distribution with the first zero at the same point but with a peak intensity 80 per cent of that which would be obtained If the lens had no aberration. This condition is attained when the half angle that the incident beam subtends at the specimen, 𝛂 = (4𝛌/Cs)¼

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