scholarly journals Non-Modulated Martensite Microstructure With Internal Nanotwins In Ni-Mn-Ga Alloys

2015 ◽  
Vol 60 (3) ◽  
pp. 2267-2270 ◽  
Author(s):  
M.J. Szczerba
Keyword(s):  
Electron Backscatter Diffraction ◽  
Martensite Plate ◽  
The Self ◽  
The Third ◽  
Incoherent Interface ◽  
Electron Backscatter ◽  
Micro Level ◽  
Backscatter Diffraction ◽  
Martensite Microstructure ◽  
Scanning Electron

Abstract The self-accommodated non-modulated martensite of Ni-Mn-Ga single crystal was studied by transmission and scanning electron microscopy in the latter case using the electron backscatter diffraction technique. Three kinds of interfaces existing at different length scales were reported. The first, is the wavy and incoherent interface separating martensite variants observed on the micro-level with no-common crystallographic plane between them. The second is within a single martensite plate where the lattice rotates around one of the {110} pole to accommodate the interfacial curvature between martensite plates. Finally, at the nanoscale the third interface exists, a twin boundary separating internal nanotwins with the {112} type habit plane.

All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg

1997 ◽  
Vol 3 (S2) ◽  
pp. 387-388 ◽  
Author(s):  
J. R. Michael
Keyword(s):  
Electron Backscatter Diffraction ◽  
Photographic Film ◽  
Phase Identification ◽  
Electron Backscattered Diffraction ◽  
Bulk Specimen ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Over 40 Years ◽  
Orientation Determination ◽  
Scanning Electron

This tutorial will describe the technique of electron backscattered diffraction (EBSD) in the scanning electron microscope (SEM). To properly exploit EBSD in the SEM it is important to understand how these patterns are formed. This discussion will be followed by a description of the hardware required for the collection of electron backscatter patterns (EBSP). We will then discuss the methods used to extract the appropriate crystallographic information from the patterns for orientation determination and phase identification and how these operations can be automated. Following this, a number of applications of the technique for both orientation studies and phase identification will be discussed.EBSD in the SEM is a phenomenon that has been known for many years. EBSD in the SEM is a technique that permits the crystallography of sub-micron sized regions to be studied from a bulk specimen. These patterns were first observed over 40 years ago, before the development of the SEM and were recorded using a special chamber and photographic film.

Angular Precision of Automated Electron Backscatter Diffraction Measurements

2011 ◽  
Vol 702-703 ◽  
pp. 548-553 ◽  
Author(s):  
Stuart I. Wright ◽  
Jay A. Basinger ◽  
Matthew M. Nowell
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Hough Transform ◽  
Angular Resolution ◽  
Electron Backscatter Diffraction ◽  
Electron Backscatter ◽  
Individual Grains ◽  
Backscatter Diffraction ◽  
Work First ◽  
Scanning Electron

Electron backscatter diffraction (EBSD) has become the preferred technique for characterizing the crystallographic orientation of individual grains in polycrystalline microstructures due to its ability to rapidly measure orientations at specific points in the microstructure at resolutions of approximately 20-50nm depending on the capabilities of the scanning electron microscope (SEM) and on the material being characterized. Various authors have studied the angular resolution of the orientations measured using automated EBSD. These studies have stated values ranging from approximately 0.1° to 2° [1-6]. Various factors influence the angular resolution achievable. The two primary factors are the accuracy of the detection of the bands in the EBSD patterns and the accuracy of the pattern center (PC) calibration. The band detection is commonly done using the Hough transform. The effect of varying the Hough transform parameters in order to optimize speed has been explored in a previous work [6]. The present work builds upon the earlier work but with the focus towards achieving the best angular resolution possible regardless of speed. This work first details the methodology used to characterize the angular precision then reports on various approaches to optimizing parameters to improve precision.

Introduction: Electron Backscatter Diffraction Special Section

2013 ◽  
Vol 19 (4) ◽  
pp. 920-920
Author(s):  
Andrew Deal
Keyword(s):  
United States ◽  
Electron Backscatter Diffraction ◽  
Special Section ◽  
The United States ◽  
The Third ◽  
Electron Backscatter ◽  
Regional Workshop ◽  
Backscatter Diffraction

Welcome to the second special section of Microscopy and Microanalysis focused on electron backscatter diffraction (EBSD), which follows the June 2011 issue. The content of the previous special section was provided by participants at EBSD 2010, the second Microanalysis Society (MAS) topical conference dedicated to EBSD in the United States. The present 2013 special section includes work from participants at both EBSD 2012, the third of such topical conferences (held June 19–21, 2012 at Carnegie Mellon University, Pittsburgh, PA), and EMAS 2012, the European Microanalysis Society's 10th Regional Workshop that included three EBSD sessions (held June 17–20 at the Institute for Geosciences and Earth Resources, Padua, Italy).

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