scholarly journals Structure determination of channel and transport proteins by high-resolution microscopy techniques

2011 ◽  
Vol 392 (1-2) ◽  
Author(s):  
Marcel Meury ◽  
Daniel Harder ◽  
Zöhre Ucurum ◽  
Rajendra Boggavarapu ◽  
Jean-Marc Jeckelmann ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Transport Proteins ◽  
State Function ◽  
Oligomeric State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Microscopy Techniques ◽  
High Resolution Microscopy

Abstract High-resolution microscopy techniques provide a plethora of information on biological structures from the cellular level down to the molecular level. In this review, we present the unique capabilities of transmission electron and atomic force microscopy to assess the structure, oligomeric state, function and dynamics of channel and transport proteins in their native environment, the lipid bilayer. Most importantly, membrane proteins can be visualized in the frozen-hydrated state and in buffer solution by cryo-transmission electron and atomic force microscopy, respectively. We also illustrate the potential of the scintillation proximity assay to study substrate binding of detergent-solubilized transporters prior to crystallization and structural characterization.

Examination of Atomic (Scanning) Force Microscopy Probe Tips with the Transmission Electron Microscope

1997 ◽  
Vol 3 (3) ◽  
pp. 203-213 ◽  
Author(s):  
J.A. DeRose ◽  
J.-P. Revel
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Scanning Force Microscopy ◽  
Image Deconvolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Scanning Force

Abstract: We have developed a method for the examination of atomic force microscopy (scanning force microscopy) tips using a high-resolution transmission electron microscope (TEM). The tips can be imaged in a nondestructive way, enabling one to observe the shape of an atomic force microscope probe in the vicinity of the apex with high resolution. We have obtained images of atomic force microscopy probes with a resolution on the order of 1 nm. The tips can be imaged repeatedly, so one can examine tips before and after use. We have found that the tip can become blunted with use, the rate of wear depending upon the sample and tip materials and the scanning conditions. We have also found that the tips easily accrue contamination. We have studied both commercially produced tips, as well as tips grown by electron beam deposition. Direct imaging in the TEM should prove useful for image deconvolution methods because one does not have to make any assumptions concerning the general shape of the tip profile.

Direct visualization of the oligomeric state of hemagglutinins of influenza virus by high-resolution atomic force microscopy

Biochimie ◽  
2018 ◽  
Vol 146 ◽  
pp. 148-155 ◽  
Author(s):  
Nikolay Barinov ◽  
Nikita Ivanov ◽  
Alexey Kopylov ◽  
Dmitry Klinov ◽  
Elena Zavyalova
Keyword(s):  
Atomic Force Microscopy ◽  
Influenza Virus ◽  
High Resolution ◽  
Direct Visualization ◽  
Oligomeric State ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Taking Correlative Microscopy to a New Level

2003 ◽  
Vol 11 (4) ◽  
pp. 3-7
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Light Microscopy ◽  
Wide Angle ◽  
Correlative Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

We are all familiar with the concept of correlating an image acquired by light microscopy (LM) with one obtained by transmission electron microscopy (TEM). This allows us to take advantage of the “wide angle” view of LM and the high resolution of TEM. Correlative microscopy has been taken to a new level by Alvin Lin and Cynthia Goh who have designed a clever device. This device allows repetitive correlative microscopy between TEM and atomic force microscopy (AFM).

scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

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