Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification

AbstractScanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.

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Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

10.1117/12.134889 ◽

1992 ◽

Cited By ~ 3

Author(s):

Mark R. Kozlowski ◽

Michael C. Staggs ◽

Mehdi Balooch ◽

Robert J. Tench ◽

Wigbert J. Siekhaus

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Force Microscopy ◽

Dielectric Mirror ◽

Atomic Force

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High-Spatial-Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2×1) Using Noncontact Atomic Force Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.47.6085 ◽

2008 ◽

Vol 47 (7) ◽

pp. 6085-6087 ◽

Cited By ~ 6

Author(s):

Daisuke Sawada ◽

Takashi Namikawa ◽

Masuhiro Hiragaki ◽

Yoshiaki Sugimoto ◽

Masayuki Abe ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Spatial Resolution ◽

High Spatial Resolution ◽

Force Microscopy ◽

Distance Analysis ◽

Atomic Force ◽

Topographic Imaging

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Surface morphology studies on sublimation grown GaN by atomic force microscopy

Journal of Crystal Growth ◽

10.1016/s0022-0248(98)01433-x ◽

1999 ◽

Vol 200 (3-4) ◽

pp. 348-352 ◽

Cited By ~ 14

Author(s):

R.S Qhalid Fareed ◽

S Tottori ◽

K Nishino ◽

S Sakai

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Force Microscopy ◽

Atomic Force

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Determination of spatial resolution in atomic-force-microscopy-based electrical characterization techniques using quantum well structures

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1835317 ◽

2005 ◽

Vol 23 (1) ◽

pp. 61 ◽

Cited By ~ 10

Author(s):

O. Douhéret ◽

S. Bonsels ◽

S. Anand

Keyword(s):

Atomic Force Microscopy ◽

Quantum Well ◽

Spatial Resolution ◽

Electrical Characterization ◽

Quantum Well Structures ◽

Force Microscopy ◽

Characterization Techniques ◽

Atomic Force

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Dissolution Kinetics, Step and Surface Morphology of Magnesite (104) Surfaces in Acidic Aqueous Solution at 60 °C by Atomic Force Microscopy under Defined Hydrodynamic Conditions

The Journal of Physical Chemistry B ◽

10.1021/jp014045d ◽

2002 ◽

Vol 106 (26) ◽

pp. 6696-6705 ◽

Cited By ~ 14

Author(s):

Steven R. Higgins ◽

Lawrence H. Boram ◽

Carrick M. Eggleston ◽

Barry A. Coles ◽

Richard G. Compton ◽

...

Keyword(s):

Aqueous Solution ◽

Atomic Force Microscopy ◽

Surface Morphology ◽

Dissolution Kinetics ◽

Hydrodynamic Conditions ◽

Acidic Aqueous Solution ◽

Force Microscopy ◽

Atomic Force

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Development of a New Electrochemical Atomic Force Microscopy Tool for Obtaining Surface Morphology Through Electrochemical Reaction

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2019.16220 ◽

2019 ◽

Vol 19 (3) ◽

pp. 1242-1247 ◽

Cited By ~ 1

Author(s):

Longshou Zheng ◽

Ho Jae Shim ◽

Yinhua Cui ◽

Yuan Gao ◽

Kang Won Lee ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Electrochemical Reaction ◽

Force Microscopy ◽

Atomic Force

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Chromic Polydiacetylene Single Crystals: Atomic Force Microscopy Studies

MRS Proceedings ◽

10.1557/proc-413-445 ◽

1995 ◽

Vol 413 ◽

Author(s):

V. Shivshankar ◽

C. Sung ◽

J. Kumar ◽

S. K. Tripathy ◽

D. J. Sandman

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Single Crystals ◽

Ambient Conditions ◽

Free Standing ◽

Force Microscopy ◽

Sensor Performance ◽

Atomic Force ◽

Variable Surface

ABSTRACTWe have studied the surface morphology of free standing single crystals of thermochromic polydiacetylenes (PDAs), namely, ETCD and IPUDO (respectively, the ethyl and isopropyl urethanes of 5,7-dodecadiyn-1,12-diol), by Atomic Force Microscopy (AFM) under ambient conditions. Micron scale as well as molecularly resolved images were obtained. The micron scale images indicate a variable surface, and the molecularly resolved images show a well defined 2-D lattice that is interpreted in terms of molecular models and known crystallographic data. Thereby information about surface morphology, which is crucial to potential optical device or chromic sensor performance is available. We also report the observation of a “macroscopic shattering” of the IPUDO monomer crystal during in-situ UV polymerization studies.

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MICROCRACKS IN ~ 100 MeV Si7+-ION-IRRADIATED p-SILICON SURFACES

Surface Review and Letters ◽

10.1142/s0218625x04006177 ◽

2004 ◽

Vol 11 (03) ◽

pp. 265-269

Author(s):

O. P. SINHA ◽

P. C. SRIVASTAVA ◽

V. GANESAN

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Target Surface ◽

Silicon Surfaces ◽

Force Microscopy ◽

Atomic Force ◽

Induced Stress

The p-silicon surfaces have been irradiated with ~ 100 MeV Si 7+ions to a fluence of 2.2×1013 ions cm -2, and surface morphology has been studied with atomic force microscopy (AFM). Interesting features of cracks of ~ 47 nm in depth and ~ 103 nm in width on the irradiated surfaces have been observed. The observed features seemed to have been caused by the irradiation-induced stress in the irradiated regions of the target surface.

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