2D GeSe2 amorphous monolayer

Abstract In this paper, GeSe2 thin film and glass ingot were prepared in a layered structure. Subsequently, the 2D amorphous monolayers were achieved from layered thin film and layered glass ingot. The thicknesses of monolayers from thin film range from 1.5 nm to 5 nm. And the thickness of monolayer from glass ingot is 7 μm. The fast cooling of material results in the formation of self-assembled monolayers. In the case of thin film, layers are connected with “bridge”. After doping of Ag, the precipitation of nano particles exfoliates the adjacent monolayers which can be further dispersed by etching of Ag particles. In the case of glass ingot, the composition changes at 1 % between adjacent monolayers, according to EDX (energy-dispersive X-ray spectroscopy) spectra. And the glass 2D monolayer can be mechanically peeled off from the glass ingot.

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Problems in Thin-Film X-ray Quantification

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100135897 ◽

1990 ◽

Vol 48 (2) ◽

pp. 458-459

Author(s):

J N Chapman ◽

W A P Nicholson

Keyword(s):

Thin Film ◽

Specimen Thickness ◽

X Rays ◽

Characteristic Peak ◽

Local Composition ◽

X Ray ◽

Measured Ratio ◽

Path Lengths ◽

Composition Changes

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.

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SrTiO3 Functional Ceramics Thin Film Prepared by Self-Assembled Monolayers with the Liquid Phase Deposition Method on Silicon Substrates

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.105-106.270 ◽

2010 ◽

Vol 105-106 ◽

pp. 270-273

Author(s):

Hui Jun Ren ◽

Guo Qiang Tan ◽

Hong Yan Miao ◽

Ya Yu Song ◽

Ao Xia

Keyword(s):

Thin Film ◽

Contact Angle ◽

Liquid Phase ◽

Deposition Temperature ◽

Precursor Solution ◽

Self Assembled Monolayers ◽

Silicon Substrates ◽

Liquid Phase Deposition ◽

Assembled Monolayers ◽

Surface Contact Angle

In this article, (NH4)2TiF6, SrNO3 and H3BO3 were used as raw materials to prepare the precursor solution with the ratio of AHFT/SN/BA=1:1:3. The thin films of SrTiO3 were fabricated on the functional silicon substrates (100) by self-assembled monolayers (SAMs) with the liquid phase deposition (LPD). This article also studied the effects of wet state and the deposition temperature of the precursor solution before and after the functionalization of silicon substrate on the thin film growth. The results indicated that after the immersion in OTS for 30min, the surface contact angle of the silicon substrate changed from 24.64° to 100.91°. The substrate appeared hydrophobic property and it was irradiated by UV light for 30min. Then the surface contact angle of the substrate decreased to 5.00°. The substrate appeared hydrophilicity. The concentration of the precursor solution was 0.025 mol/L, the deposition temperature was 40°C and the deposition time was 9h, which were all helpful to SrTiO3 crystallization. XRD and SEM were used to characterize the physical phase of thin film and surface morphology at 600 °C with annealing and heat retaining for 2h. The results indicated that the thin film prepared by the mono-crystal Si substrate was SrTiO3 thin film with better crystalline. On the crystal surfaces of (110), (100), (200) and (211), there appeared the obvious diffraction peaks. The SrTiO3 grains on the surface had the clear outline and were regular and long columnar crystals.

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Mixed self-assembled monolayers of terminally functionalized thiols at gold surfaces characterized by angle resolved X-ray photoelectron spectroscopy (ARXPS) studies

Fresenius Journal of Analytical Chemistry ◽

10.1007/s002160051487 ◽

1999 ◽

Vol 365 (1-3) ◽

pp. 272-276 ◽

Cited By ~ 18

Author(s):

J. Heeg ◽

U. Schubert ◽

F. Küchenmeister

Keyword(s):

Photoelectron Spectroscopy ◽

Self Assembled Monolayers ◽

Gold Surfaces ◽

X Ray ◽

Assembled Monolayers ◽

Self Assembled

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X-ray spectroscopy characterization of self-assembled monolayers of nitrile-substituted oligo(phenylene ethynylene)s with variable chain length

Beilstein Journal of Nanotechnology ◽

10.3762/bjnano.3.2 ◽

2012 ◽

Vol 3 ◽

pp. 12-24 ◽

Cited By ~ 13

Author(s):

Hicham Hamoudi ◽

Ping Kao ◽

Alexei Nefedov ◽

David L Allara ◽

Michael Zharnikov

Keyword(s):

Chain Length ◽

Photoelectron Spectroscopy ◽

Self Assembled Monolayers ◽

Phenylene Ethynylene ◽

X Ray ◽

Molecular Length ◽

Assembled Monolayers ◽

Self Assembled ◽

Gold Thiolate

Self-assembled monolayers (SAMs) of nitrile-substituted oligo(phenylene ethynylene) thiols (NC-OPEn) with a variable chain length n (n ranging from one to three structural units) on Au(111) were studied by synchrotron-based high-resolution X-ray photoelectron spectroscopy and near-edge absorption fine-structure spectroscopy. The experimental data suggest that the NC-OPEn molecules form well-defined SAMs on Au(111), with all the molecules bound to the substrate through the gold–thiolate anchor and the nitrile tail groups located at the SAM–ambient interface. The packing density in these SAMs was found to be close to that of alkanethiolate monolayers on Au(111), independent of the chain length. Similar behavior was found for the molecular inclination, with an average tilt angle of ~33–36° for all the target systems. In contrast, the average twist of the OPEn backbone (planar conformation) was found to depend on the molecular length, being close to 45° for the films comprising the short OPE chains and ~53.5° for the long chains. Analysis of the data suggests that the attachment of the nitrile moiety, which served as a spectroscopic marker group, to the OPEn backbone did not significantly affect the molecular orientation in the SAMs.

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Sub-100-nm Pattern Formation through Selective Chemical Transformation of Self-Assembled Monolayers by Soft X-ray Irradiation

Langmuir ◽

10.1021/la0487085 ◽

2004 ◽

Vol 20 (16) ◽

pp. 6964-6964 ◽

Cited By ~ 2

Author(s):

Young-Hye La ◽

Yu Jin Jung ◽

Hyun Ju Kim ◽

Tai-Hee Kang ◽

Kyuwook Ihm ◽

...

Keyword(s):

Pattern Formation ◽

Chemical Transformation ◽

Self Assembled Monolayers ◽

X Ray ◽

Assembled Monolayers ◽

Selective Chemical ◽

Self Assembled

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Selective Deposition of Titanium Dioxide Thin Film on Glass Monolayers by Impregnating Method

Materials Science Forum ◽

10.4028/www.scientific.net/msf.610-613.147 ◽

2009 ◽

Vol 610-613 ◽

pp. 147-154

Author(s):

Yao Bo Hu ◽

Fu Sheng Pan ◽

Jing Feng Wang

Keyword(s):

Thin Film ◽

Titanium Dioxide ◽

Tio2 Film ◽

Tio2 Thin Film ◽

Monolayer Film ◽

Scanning Calorimetry ◽

X Ray ◽

Dual Beam ◽

Assembled Monolayers ◽

Tio2 Gel

Titanium dioxide (TiO2) thin film was fabricated on the surface of glass monolayers at room temperature, using KH-550 as self-assembled monolayers (SAMs). The TiO2 gel precursor was characterized with differential scanning calorimetry – thermogravimetry (DSC-TG), and the TiO2 powder was analyzed with X-ray diffraction (XRD). The TiO2 thin film was tested with X-ray fluorescence spectroscopy (XRF). With the application of atomic force microscope (AFM) the surface topography of siloxane layer and TiO2 film were studied. Their hydrophilicities were measured. The transmittance of TiO2 film was detected by using dual beam ultraviolet - visible spectrophotometer. The results show that the TiO2 thin film is in monolayer with nanometer level, the deposition is the anatase structure. TiO2 is deposited on the surface instead of channel or gap of siloxane, the hydrophilicities of TiO2 monolayer film are perfect, and TiO2 monolayer film has a good transmissivity in the visible light area.

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