Electrical and Structural Properties of Thin Palladium Films

1986 ◽  
Vol 41 (4) ◽  
pp. 665-670 ◽  
Author(s):  
R. Anton ◽  
K. Häupl ◽  
P. Rudolf ◽  
P. Wißmann
Keyword(s):  
Electrical Resistivity ◽  
Film Thickness ◽  
Statistical Model ◽  
Structural Information ◽  
Film Structure ◽  
X Ray Diffraction ◽  
Continuous Film ◽  
X Ray ◽  
Amorphous Substrates ◽  
Steep Decrease

The electrical resistivity of thin palladium films deposited on amorphous substrates is measured in dependence on film thickness. The data are interpreted with the help of a statistical model taking into account structural information obtained from AES, TEM and x-ray diffraction texture analysis. The steep decrease of resistivity in the ultra-thin thickness region can be immediately correlated with the formation of coherent areas in the films. A more flattened course is reached at about 8 nm thickness where a continuous film structure develops.

Structural Analysis of GaN and GaN/InGaN/GaN DH Structures on Sapphire (0001) Substrate Grown by MOCVD

1996 ◽  
Vol 449 ◽  
Author(s):  
Hisao Sato ◽  
Yoshiki Naoi ◽  
Shiro Sakai
Keyword(s):  
Structural Analysis ◽  
Film Thickness ◽  
Film Structure ◽  
Mosaic Structure ◽  
Lattice Structures ◽  
X Ray Diffraction ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
Double Heterostructures ◽  
20 Nm

ABSTRACTWe have investigated lattice structures of GaN and InGaN/GaN single-heterostructures (SH) and double-heterostructures (DH) by the reciprocal space mapping using X-ray diffraction technique from (0002) plane. For a single GaN layers, the transition of the film structure from grains with relatively independent orientation at about 0.3 μm followed by the coalescence at about 1 μm, to a uniform film with mosaic structure at 1.4 μm was clearly observed. For DH structure, ω-mode FWHMs both from InGaN (In composition approximately 7 %) and capping-GaN layers increased with increasing film thickness from 20 nm to 110 nm indicating the increased mosaic structure in the thick InGaN. We also observed the dislocation related to this increasing mosaic structure.

Die Struktur epitaktisch aufgedampfter Goldfilme

1976 ◽  
Vol 31 (2) ◽  
pp. 183-189 ◽  
Author(s):  
W. Fischer ◽  
P. Wißmann
Keyword(s):  
Film Thickness ◽  
Angular Displacement ◽  
Stacking Faults ◽  
Film Structure ◽  
Silicon Substrates ◽  
Gold Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Peaks ◽  
Lattice Distortions

Abstract Gold films of 400 Å thickness were evaporated under UHV-conditions on (111)-, (110)-and (100)-oriented silicon substrates and were subsequently investigated by x-ray diffraction. Mainly the influence of orientation and cleanliness of the substrate on film structure was studied.Informations on the orientation and size of the crystallites as well as on lattice distortions were obtained by analysing intensity, angular displacement and width of the diffraction peaks. It is found that the gold films show a preferred (111)-orientation in all cases; only the degree of orienta-tion changes with the pretreatment of the substrate. The size of the (111)-oriented crystallites cor-responds to the film thickness, and a noticeable density of intrinsic stacking faults can be detected.

Direct visualization of phase-separated domains in lipid membranes

1978 ◽  
Vol 36 (2) ◽  
pp. 290-291
Author(s):  
S. W. Hui ◽  
T. P. Stewart
Keyword(s):  
Lipid Membranes ◽  
Structural Information ◽  
Freeze Fracture ◽  
Biological Molecules ◽  
Vacuum Drying ◽  
Direct Visualization ◽  
X Ray Diffraction ◽  
Electron Microscopic ◽  
X Ray ◽  
Hydrocarbon Chains

Direct electron microscopic study of biological molecules has been hampered by such factors as radiation damage, lack of contrast and vacuum drying. In certain cases, however, the difficulties may be overcome by using redundent structural information from repeating units and by various specimen preservation methods. With bilayers of phospholipids in which both the solid and fluid phases co-exist, the ordering of the hydrocarbon chains may be utilized to form diffraction contrast images. Domains of different molecular packings may be recgnizable by placing properly chosen filters in the diffraction plane. These domains would correspond to those observed by freeze fracture, if certain distinctive undulating patterns are associated with certain molecular packing, as suggested by X-ray diffraction studies. By using an environmental stage, we were able to directly observe these domains in bilayers of mixed phospholipids at various temperatures at which their phases change from misible to inmissible states.

Characterizations of Synthetic 8mol% YSZ with Comparison to 3mol %YSZ for HT-SOFC

2020 ◽  
Vol 38 (4A) ◽  
pp. 491-500
Author(s):  
Abeer F. Al-Attar ◽  
Saad B. H. Farid ◽  
Fadhil A. Hashim
Keyword(s):  
Ionic Conductivity ◽  
Electrochemical Impedance ◽  
Structural Information ◽  
Impedance Analysis ◽  
High Energy ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Powder Morphology ◽  
X Ray

In this work, Yttria (Y2O3) was successfully doped into tetragonal 3mol% yttria stabilized Zirconia (3YSZ) by high energy-mechanical milling to synthesize 8mol% yttria stabilized Zirconia (8YSZ) used as an electrolyte for high temperature solid oxide fuel cells (HT-SOFC). This work aims to evaluate the densification and ionic conductivity of the sintered electrolytes at 1650°C. The bulk density was measured according to ASTM C373-17. The powder morphology and the microstructure of the sintered electrolytes were analyzed via Field Emission Scanning Electron Microscopy (FESEM). The chemical analysis was obtained with Energy-dispersive X-ray spectroscopy (EDS). Also, X-ray diffraction (XRD) was used to obtain structural information of the starting materials and the sintered electrolytes. The ionic conductivity was obtained through electrochemical impedance spectroscopy (EIS) in the air as a function of temperatures at a frequency range of 100(mHz)-100(kHz). It is found that the 3YSZ has a higher density than the 8YSZ. The impedance analysis showed that the ionic conductivity of the prepared 8YSZ at 800°C is0.906 (S.cm) and it was 0.214(S.cm) of the 3YSZ. Besides, 8YSZ has a lower activation energy 0.774(eV) than that of the 3YSZ 0.901(eV). Thus, the prepared 8YSZ can be nominated as an electrolyte for the HT-SOFC.

scholarly journals Crystallization and preliminary X-ray analysis of thePlasmodium falciparumapicoplast DNA polymerase

2015 ◽  
Vol 71 (3) ◽  
pp. 333-337 ◽  
Author(s):  
Morgan E. Milton ◽  
Jun-yong Choe ◽  
Richard B. Honzatko ◽  
Scott W. Nelson
Keyword(s):  
Dna Polymerase ◽  
Structural Information ◽  
Klenow Fragment ◽  
X Ray Diffraction ◽  
Dna Polymerase I ◽  
X Ray ◽  
Cell Parameters ◽  
A Genome ◽  
Reported Data ◽  
Polymerase I

Infection by the parasitePlasmodium falciparumis the leading cause of malaria in humans. The parasite has a unique and essential plastid-like organelle called the apicoplast. The apicoplast contains a genome that undergoes replication and repair through the action of a replicative polymerase (apPOL). apPOL has no direct orthologs in mammalian polymerases and is therefore an attractive antimalarial drug target. No structural information exists for apPOL, and the Klenow fragment ofEscherichia coliDNA polymerase I, which is its closest structural homolog, shares only 28% sequence identity. Here, conditions for the crystallization of and preliminary X-ray diffraction data from crystals ofP. falciparumapPOL are reported. Data complete to 3.5 Å resolution were collected from a single crystal (2 × 2 × 5 µm) using a 5 µm beam. The space groupP6522 (unit-cell parametersa=b= 141.8,c= 149.7 Å, α = β = 90, γ = 120°) was confirmed by molecular replacement. Refinement is in progress.

STUDY OF THE DEPENDENCE OF HIGH Tc ON VARIOUS SINTERING TEMPERATURES FOR Bi-Pb-Sr-Ca-Cu-O SUPERCONDUCTORS

1991 ◽  
Vol 05 (24n25) ◽  
pp. 1635-1638
Author(s):  
S.M. M.R. NAQVI ◽  
A.A. QIDWAI ◽  
S.M. ZIA-UL-HAQUE ◽  
FIROZ AHMAD ◽  
S.D.H. RIZVI ◽  
...  
Keyword(s):  
Electrical Resistivity ◽  
Liquid Nitrogen ◽  
X Ray Diffraction ◽  
High Tc ◽  
X Ray ◽  
Resistivity Measurements ◽  
Zero Resistance

Bi1.7-Pb0.3-Sr2-Ca2-Cu3-Ox superconducting samples were prepared at 855°C, 862 C, 870 C, and 882 C sintering temperatures respectively. All samples were sintered for 120 hours. The samples were then quenched in liquid nitrogen. The electrical resistivity measurements showed that the samples sintered at 870° C had the best Tc. For these samples the Tc onset was around 120 K and the zero resistance was obtained at 108 K. X-ray diffraction studies showed that the samples were multiphased.

Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

2011 ◽  
Vol 44 (5) ◽  
pp. 983-990 ◽  
Author(s):  
Chris Elschner ◽  
Alexandr A. Levin ◽  
Lutz Wilde ◽  
Jörg Grenzer ◽  
Christian Schroer ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Information ◽  
Grazing Incidence ◽  
Test Material ◽  
C60 Fullerene ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Molecular Arrangement ◽  
Diffraction Patterns

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledge of the single-crystal structure. C60 fullerene was chosen as a representative test material. A 250 nm C60 film was investigated by grazing-incidence X-ray diffraction and the data compared with a Bragg–Brentano X-ray diffraction measurement of the corresponding C60 powder. The diffraction patterns of both powder and film were used to calculate the pair distribution function (PDF), which allowed an investigation of the short-range order of the structures. With the help of the PDF, a structure model for the C60 molecular arrangement was determined for both C60 powder and thin film. The results agree very well with a classical whole-pattern fitting approach for the C60 diffraction patterns.

Evolution of crystal structure of dual layered molecular conductor (ET)4ZnBr4(C6H4Cl2) with temperature

CrystEngComm ◽  
2021 ◽  
Author(s):  
Gennady V. Shilov ◽  
Elena I. Zhilyaeva ◽  
Sergey M. Aldoshin ◽  
Alexandra M Flakina ◽  
Rustem B. Lyubovskii ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Electrical Resistivity ◽  
Single Crystal ◽  
Room Temperature ◽  
Organic Conductor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Resistivity Measurements ◽  
Molecular Conductor ◽  
Abrupt Changes

Electrical resistivity measurements of a dual layered organic conductor (ET)4ZnBr4(1,2-C6H4Cl2) above room temperature show abrupt changes in resistivity at 320 K. Single-crystal X-ray diffraction studies in the 100-350 K range...

scholarly journals Structure and Electrochemical Potential Simulation for the Cathode Material Li1+xV3O8

1997 ◽  
Vol 496 ◽  
Author(s):  
R. Benedek ◽  
M. M. Thackeray ◽  
L. H. Yang
Keyword(s):  
Density Functional ◽  
Structural Information ◽  
Local Density ◽  
Tetrahedral Site ◽  
Low Energy ◽  
Electrochemical Potential ◽  
X Ray Diffraction ◽  
X Ray ◽  
Local Density Functional Theory ◽  
Two Phases

ABSTRACTThe structure and electrochemical potential of monoclinic Li1+xV3O8 were calculated within the local-density-functional-theory framework by use of plane-wave-pseudopotential methods. Special attention was given to the compositions 1+x=1.2 and 1+x=4, for which x-ray diffraction structure refinements are available. The calculated low-energy configuration for 1+x=4 is consistent with the three Li sites identified in x-ray diffraction measurements and predicts the position of the unobserved Li. The location of the tetrahedrally coordinated Li in the calculated low-energy configuration for 1+x=1.5 is consistent with the structure measured by x-ray diffraction for Li1.2V3O8. Calculations were also performed for the two monoclinic phases at intermediate Li compositions, for which no structural information is available. Calculations at these compositions are based on hypothetical Li configurations suggested by the ordering of vacancy energies for Li4V3O8 and tetrahedral site energies in Li1.5V3O8. The internal energy curves for the two phases- cross near 1+x=3. Predicted electrochemical potential curves agree well with experiment.

Synthesis, Structure and Magnetism of ErCoIn5

2004 ◽  
Vol 848 ◽  
Author(s):  
Evan Lyle Thomas ◽  
Erin E. Erickson ◽  
Monica Moldovan ◽  
David P. Young ◽  
Julia Y. Chan
Keyword(s):  
Magnetic Properties ◽  
Electrical Resistivity ◽  
Magnetic Susceptibility ◽  
Single Crystal ◽  
Experimental Results ◽  
Flux Growth ◽  
X Ray Diffraction ◽  
Metallic Behavior ◽  
X Ray ◽  
Growth Method

AbstractA new member of the LnMIn5 family, ErCoIn5, has been synthesized by a flux-growth method. The structure of ErCoIn5 was determined by single crystal X-ray diffraction. It crystallizes in the tetragonal space group P4/mmm, Z = 1, with lattice parameters a = 4.5400(4) and c = 7.3970(7) Å, and V = 152.46(2) Å3. Electrical resistivity data show metallic behavior. Magnetic susceptibility measurements show this compound to be antiferromagnetic with TN = 5.1 K. We compare these experimental results with those of LaCoIn5 in an effort to better understand the effect of the structural trends observed on the transport and magnetic properties.

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