Untersuchung des MÖSSBAUER-Effekts in Elpasolithen A2INaFeF6.

1976 ◽  
Vol 31 (8) ◽  
pp. 1039-1042 ◽  
Author(s):  
J. Pebler ◽  
K. Schmidt ◽  
R. Haegele ◽  
D. Babel
Keyword(s):  
Mean Square Displacement ◽  
Statistical Distribution ◽  
Line Broadening ◽  
Octahedral Position ◽  
Cell Axis ◽  
X Ray ◽  
Mössbauer Data ◽  
Temperature Factors ◽  
Octahedral Distortion ◽  
Anion Displacement

57Fe-MÖSSBAUER spectra of the cubic elpasolithes A2INaFeF6 (AI = K, Rb, Cs) show strong single line broadening in the temperature range 4.2 K ≤ T ≤ 600 K. This broadening is attributed to a statistical distribution of differently distorted FeF63-octahedra, causing a statistical distribution of electric fieldgradients at the 57Fe-position. With the aid of a model calculation it was tried to estimate the order of the octahedral distortion. For the compound Rb2NaFeF6 normal to the cell axis an anion displacement of Δ q = 0.11 Å from the regular octahedral position was derived from the Mössbauer data. This value agrees with the root mean square displacement ū = 0.13 Å, which results in this direction from the strongly anisotropic fluorine temperature factors found by X-ray structure determination.

Nondestructive Inspection of Thin, Low-Z Samples using Multiplexed Compton Scatter Tomography

1997 ◽  
Vol 503 ◽  
Author(s):  
B. L. Evans ◽  
J. B. Martin ◽  
L. W. Burggraf
Keyword(s):  
Signal To Noise Ratio ◽  
Reconstruction Algorithm ◽  
Filtered Backprojection ◽  
Line Broadening ◽  
Compton Scatter ◽  
X Ray ◽  
Tomography System ◽  
Transmission Computed Tomography ◽  
High Purity Germanium ◽  
Scattered Energy

ABSTRACTThe viability of a Compton scattering tomography system for nondestructively inspecting thin, low Z samples for corrosion is examined. This technique differs from conventional x-ray backscatter NDI because it does not rely on narrow collimation of source and detectors to examine small volumes in the sample. Instead, photons of a single energy are backscattered from the sample and their scattered energy spectra are measured at multiple detector locations, and these spectra are then used to reconstruct an image of the object. This multiplexed Compton scatter tomography technique interrogates multiple volume elements simultaneously. Thin samples less than 1 cm thick and made of low Z materials are best imaged with gamma rays at or below 100 keV energy. At this energy, Compton line broadening becomes an important resolution limitation. An analytical model has been developed to simulate the signals collected in a demonstration system consisting of an array of planar high-purity germanium detectors. A technique for deconvolving the effects of Compton broadening and detector energy resolution from signals with additive noise is also presented. A filtered backprojection image reconstruction algorithm with similarities to that used in conventional transmission computed tomography is developed. A simulation of a 360–degree inspection gives distortion-free results. In a simulation of a single-sided inspection, a 5 mm × 5 mm corrosion flaw with 50% density is readily identified in 1-cm thick aluminum phantom when the signal to noise ratio in the data exceeds 28.

Temperature-induced structural phase transitions in RERhSn (RE = Y, Gd-Tm, Lu)

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Simon Engelbert ◽  
Rolf-Dieter Hoffmann ◽  
Jutta Kösters ◽  
Steffen Klenner ◽  
Rainer Pöttgen
Keyword(s):  
Rare Earth ◽  
Phase Transitions ◽  
Driving Force ◽  
Room Temperature ◽  
Structural Phase ◽  
Structural Phase Transitions ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
X Ray

Abstract The structures of the equiatomic stannides RERhSn with the smaller rare earth elements Y, Gd-Tm and Lu were reinvestigated on the basis of temperature-dependent single crystal X-ray diffraction data. GdRhSn crystallizes with the aristotype ZrNiAl at 293 and 90 K. For RE = Y, Tb, Ho and Er the HP-CeRuSn type (approximant with space group R3m) is already formed at room temperature, while DyRhSn adopts the HP-CeRuSn type below 280 K. TmRhSn and LuRhSn show incommensurate modulated variants with superspace groups P31m(1/3; 1/3; γ) 000 (No. 157.1.23.1) (γ = 3/8 for TmRhSn and γ = 2/5 for LuRhSn). The driving force for superstructure formation (modulation) is a strengthening of Rh–Sn bonding. The modulation is expressed in a 119Sn Mössbauer spectrum of DyRhSn at 78 K through line broadening.

X-Ray Diffraction Study of Hep Metals. I. Line Broadening in Polycrystalline Cd Powder

1974 ◽  
Vol 29 (12) ◽  
pp. 1771-1777 ◽  
Author(s):  
N. C. Haider ◽  
S. H. Hunter
Keyword(s):  
Room Temperature ◽  
Small Deformation ◽  
Correction Factors ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Fault Probability ◽  
Large Particle Size ◽  
X Ray ◽  
Melting Temperatures ◽  
Diffraction Patterns

Powder Cd of 99.999% purity was prepared at room temperature (25 °C) and x-ray diffraction patterns were obtained using CuKaα radiation with Ni-filter. The line broadening was analyzed after incorporating the appropriate correction factors. At room temperature Cd was found to have large particle size (653 A), small root mean square strain (.001), small deformation fault probability a (.003). and negligible growth fault probability β(0). Compared to other hep metals which have been studied earlier and which have higher melting temperatures, metal Cd is much less affected by mechanical deformation at room temperature.

Investigation of Residual Strains of the Second Kind in Plastically Deformed Metallic Materials

1994 ◽  
Vol 376 ◽  
Author(s):  
M. Vrána ◽  
P. Klimanek ◽  
T. Kschidock ◽  
P. Lukáš ◽  
P. Mikula
Keyword(s):  
High Resolution ◽  
Neutron Diffraction ◽  
Stacking Faults ◽  
Metallic Materials ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Neutron Diffractometer ◽  
Residual Strains ◽  
Good Agreement

ABSTRACTInvestigation of strongly distorted crystal structures caused by dislocations, stacking-faults etc. in both plastically deformed f.c.c. and b.c.c. metallic materials was performed by the analysis of the neutron diffraction line broadening. Measurements were realized by means of the high resolution triple-axis neutron diffractometer equipped by bent Si perfect crystals as monochromator and analyzer at the NPI Řež. The substructure parameters obtained in this manner are in good agreement with the results of X-ray diffraction analysis.

A variance analysis of the line broadening of X-ray profiles from Fortisan

Polymer ◽  
1973 ◽  
Vol 14 (9) ◽  
pp. 402-404
Author(s):  
A.K. Kulshreshtha ◽  
R.E. Hunter ◽  
N.E. Dweltz
Keyword(s):  
Variance Analysis ◽  
Line Broadening ◽  
X Ray

The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis

1997 ◽  
Vol 30 (4) ◽  
pp. 427-430 ◽  
Author(s):  
F. Sánchez-Bajo ◽  
F. L. Cumbrera
Keyword(s):  
Crystallite Size ◽  
Original Form ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Variance Method ◽  
The Mean ◽  
Voigt Function

A modified application of the variance method, using the pseudo-Voigt function as a good approximation to the X-ray diffraction profiles, is proposed in order to obtain microstructural quantities such as the mean crystallite size and root-mean-square (r.m.s.) strain. Whereas the variance method in its original form is applicable only to well separated reflections, this technique can be employed in the cases where there is line-profile overlap. Determination of the mean crystallite size and r.m.s. strain for several crystallographic directions in a nanocrystalline cubic sample of 9-YSZ (yttria-stabilized zirconia) has been performed by means of this procedure.

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