Elastic Recovery Measurements Performed by Atomic Force Microscopy and Standard Nanoindentation on a Co(10.1) Monocrystal

2002 ◽  
Vol 17 (6) ◽  
pp. 1258-1265 ◽  
Author(s):  
J. C. Arnault ◽  
A. Mosser ◽  
M. Zamfirescu ◽  
H. Pelletier
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Recovery ◽  
Intrinsic Parameter ◽  
Force Microscopy ◽  
Atomic Force ◽  
Material Hardness ◽  
Important Discrepancy ◽  
Shape Effects ◽  
Afm Cantilever ◽  
Hardness Values

Atomic force microscopy (AFM) nanoindentation experiments were performed on a Co(10.1) monocrystal. Using AFM line scans, we deduced the elastic recovery, which is an intrinsic parameter of the studied material. The comparison of these elastic recovery values with those calculated by standard nanoindentation shows a fair agreement for forces higher than 400 μN with an important discrepancy for lower forces. This difference is attributed to tip shape effects and to the AFM cantilever elastic deformation. Furthermore, the material hardness was measured from AFM images of the imprint by considering the lateral dimension L. In this case, the obtained values are practically independent from the applied load. Moreover, a simple model based on geometrical considerations is proposed to correct hardness values calculated from the residual depth.

Insight into the Deformation Mechanisms under a Sharp Contact Loading in Glass by Atomic Force Microscopy

2005 ◽  
Vol 904 ◽  
Author(s):  
Tanguy Rouxel ◽  
Satoshi Yoshida ◽  
Haixia Shang ◽  
Jean-Christophe Sangleboeuf
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Area ◽  
Elastic Recovery ◽  
Residual Deformation ◽  
Constitutive Law ◽  
Indentation Creep ◽  
Contact Loading ◽  
Force Microscopy ◽  
Atomic Force ◽  
Insight Into

AbstractThe response of a material to a sharp contact loading, as in the case of Vickers indentation for instance, provides a unique insight into the material constitutive law, including elastic and irreversible deformation parameters as well. However, under such peculiar thermodynamical and mechanical conditions (the mean contact pressure on the contact area reaches values typically higher than 1 GPa, corresponding to the hardness of the material) the deformation processes are complex and the matter located just beneath and around the contact area may experience some structural changes and behave in a way different to the expected - or known - macroscopic behaviour. It is showed in this study by means of detailed topological investigations of the residual indentations by Atomic Force Microscopy (AFM) that the elastic recovery typically represents 50 to 70 % of the indentation volume at maximum load and that the densification contribution may reach 90 % of the residual deformation volume. Besides, most glasses exhibit indentation-creep phenomena, which become significant over time scale of few minutes because of a pronounced shear-thinning behavior..

scholarly journals PROBING ATOMIC LEVEL INTERACTIONS IN NI NANORODS AND AFM CANTILEVER USING ATOMIC FORCE MICROSCOPY BASED F–D SPECTROSCOPY

2017 ◽  
Author(s):  
Sudipta Dutta ◽  
Mahesh Kumar Singh ◽  
M. S. Bobji
Keyword(s):  
Atomic Force Microscopy ◽  
Magnetic Interaction ◽  
Interaction Force ◽  
Small Scale ◽  
Magnetic Composite ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lift Height ◽  
Afm Cantilever ◽  
Force Displacement

Atomic force microscopy based force-displacement spectroscopy is used to quantify magnetic interaction force between sample and magnetic cantilever. AFM based F–D spectroscopy is used widely to understand various surface-surface interaction at small scale. Here we have studied the interaction between a magnetic nanocomposite and AFM cantilevers. Two different AFM cantilever with same stiffness but with and without magnetic coating is used to obtain F–D spectra in AFM. The composite used has magnetic Ni nanophase distributed uniformly in an Alumina matrix. Retrace curves obtained using both the cantilevers on magnetic composite and sapphire substrate are compared. It is found for magnetic sample cantilever comes out of contact after traveling 100 nm distance from the actual point of contact. We have also used MFM imaging at various lift height and found that beyond 100nm lift height magnetic contrast is lost for our composite sample, which further confirms our F–D observation.

scholarly journals Effect of Eigenmode Frequency on Loss Tangent Atomic Force Microscopy Measurements

2021 ◽  
Vol 11 (15) ◽  
pp. 6813
Author(s):  
Babak Eslami ◽  
Dylan Caputo
Keyword(s):  
Atomic Force Microscopy ◽  
Loss Tangent ◽  
Oscillation Amplitude ◽  
Excitation Frequency ◽  
Chemical Properties ◽  
Sample Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Tip Radius

Atomic Force Microscopy (AFM) is no longer used as a nanotechnology tool responsible for topography imaging. However, it is widely used in different fields to measure various types of material properties, such as mechanical, electrical, magnetic, or chemical properties. One of the recently developed characterization techniques is known as loss tangent. In loss tangent AFM, the AFM cantilever is excited, similar to amplitude modulation AFM (also known as tapping mode); however, the observable aspects are used to extract dissipative and conservative energies per cycle of oscillation. The ratio of dissipation to stored energy is defined as tanδ. This value can provide useful information about the sample under study, such as how viscoelastic or elastic the material is. One of the main advantages of the technique is the fact that it can be carried out by any AFM equipped with basic dynamic AFM characterization. However, this technique lacks some important experimental guidelines. Although there have been many studies in the past years on the effect of oscillation amplitude, tip radius, or environmental factors during the loss tangent measurements, there is still a need to investigate the effect of excitation frequency during measurements. In this paper, we studied four different sets of samples, performing loss tangent measurements with both first and second eigenmode frequencies. It is found that performing these measurements with higher eigenmode is advantageous, minimizing the tip penetration through the surface and therefore minimizing the error in loss tangent measurements due to humidity or artificial dissipations that are not dependent on the actual sample surface.

An Atomic Force Microscopy Tip Model for Investigating the Mechanical Properties of Materials at the Nanoscale

2008 ◽  
Vol 8 (5) ◽  
pp. 2479-2482
Author(s):  
Michele Alderighi ◽  
Vincenzo Ierardi ◽  
Maria Allegrini ◽  
Francesco Fuso ◽  
Roberto Solaro
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Coating Layer ◽  
Geometrical Model ◽  
Test Material ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Properties Of Materials ◽  
Material Hardness ◽  
Properties Of Materials

Investigation of the mechanical properties of materials at the nanoscale is often performed by atomic force microscopy nanoindentation. However, substrates with large surface roughness and heterogeneity demand careful data analysis. This requirement is even more stringent when surface indentations with a typical depth of a few nanometers are produced to test material hardness. Accordingly, we developed a geometrical model of the nanoindenter, which was first validated by measurements on a reference gold sample. Then we used this technique to investigate the mechanical properties of a coating layer made of Balinit C, a commercially available alloy with superior anti-wear features deposited on steel. The reported results support the feasibility of reliable hardness measurements with truly nanosized indents.

scholarly journals Hollow AFM Cantilever with Holes

2021 ◽  
Vol 4 (1) ◽  
pp. 13
Author(s):  
Wujoon Cha ◽  
Matthew F. Campbell ◽  
Akshat Jain ◽  
Igor Bargatin
Keyword(s):  
Atomic Force Microscopy ◽  
Biological Systems ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Cantilever

Since its invention, atomic force microscopy (AFM) has enhanced our understanding of physical and biological systems at sub-micrometer scales [...]

scholarly journals Volume and concentration dosing in picolitres using a two-channel microfluidic AFM cantilever

Nanoscale ◽  
2020 ◽  
Vol 12 (18) ◽  
pp. 10292-10305
Author(s):  
E. J. Verlinden ◽  
M. Madadelahi ◽  
E. Sarajlic ◽  
A. Shamloo ◽  
A. H. Engel ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Atomic Force Microscopy Cantilever

We introduce a two-channel microfluidic atomic force microscopy cantilever that can be used both for nanomechanical sensing and to manipulate liquids at the rate of femto-litres per second through nanoscale apertures near the cantilever tip apex.

A Systematic Method for Developing Harmonic Cantilevers for Atomic Force Microscopy

2016 ◽  
Vol 139 (1) ◽  
Author(s):  
Benliang Zhu ◽  
Soren Zimmermann ◽  
Xianmin Zhang ◽  
Sergej Fatikow
Keyword(s):  
Atomic Force Microscopy ◽  
Focused Ion Beam ◽  
Natural Frequencies ◽  
Ion Beam ◽  
Interaction Force ◽  
Resonant Frequencies ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Afm Cantilever

This paper proposes a method for developing harmonic cantilevers for tapping mode atomic force microscopy (AFM). The natural frequencies of an AFM cantilever are tuned by inserting gridiron holes with specific sizes and locations, such that the higher order resonance frequencies can be assigned to be integer harmonics generated by the nonlinear tip–sample interaction force. The cantilever is modeled using the vibration theory of the Timoshenko beam with a nonuniform cross section. The designed cantilever is fabricated by modifying a commercial cantilever through focused ion beam (FIB) milling. The resonant frequencies of the designed cantilever are verified using a commercial AFM.

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