Local piezoelectric and ferroelectric responses in nanotube-patterned thin films of BaTiO3 synthesized hydrothermally at 200 °C

2006 ◽  
Vol 21 (3) ◽  
pp. 547-551 ◽  
Author(s):  
Rosalía Poyato ◽  
Bryan D. Huey ◽  
Nitin P. Padture
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Atomic Force Microscopy ◽  
Direct Current ◽  
Piezoelectric Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phase Images ◽  
Fabrication Procedure ◽  
Film Substrate

Piezoresponse atomic-force microscopy (PFM) has been used to characterize the local piezoelectric properties of a novel, nanotube-patterned (“honeycomb”) thin film of BaTiO3 on Ti substrate synthesized hydrothermally at 200 °C. PFM amplitude and phase images, prior to the application of any direct current (dc) field, show ring-shaped piezoelectric regions that correspond to the nanostructure of this film. These results show clearly that the as-synthesized nanotube-patterned BaTiO3 thin film is piezoelectric, with a net spontaneous polarization perpendicular to the film–substrate interface. In addition, polarization switching and hysteresis were observed as a function of applied dc field, confirming that this novel fabrication procedure results in unique configurations of BaTiO3 film that are also ferroelectric.

scholarly journals Au Nanoparticles as Template for Defect Formation in Memristive SrTiO3 Thin Films

Nanomaterials ◽  
2018 ◽  
Vol 8 (11) ◽  
pp. 869 ◽  
Author(s):  
Nicolas Raab ◽  
Dirk Schmidt ◽  
Hongchu Du ◽  
Maximilian Kruth ◽  
Ulrich Simon ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Atomic Force Microscopy ◽  
Au Nanoparticles ◽  
Defect Formation ◽  
Subsequent Growth ◽  
Force Microscopy ◽  
Atomic Force ◽  
Oxygen Exchange Reaction ◽  
Defect Nucleation

We investigated the possibility of tuning the local switching properties of memristive crystalline SrTiO 3 thin films by inserting nanoscale defect nucleation centers. For that purpose, we employed chemically-synthesized Au nanoparticles deposited on 0.5 wt%-Nb-doped SrTiO 3 single crystal substrates as a defect formation template for the subsequent growth of SrTiO 3 . We studied in detail the resulting microstructure and the local conducting and switching properties of the SrTiO 3 thin films. We revealed that the Au nanoparticles floated to the SrTiO 3 surface during growth, leaving behind a distorted thin film region in their vicinity. By employing conductive-tip atomic force microscopy, these distorted SrTiO 3 regions are identified as sites of preferential resistive switching. These findings can be attributed to the enhanced oxygen exchange reaction at the surface in these defective regions.

Damaging of a Soft Polymeric Substrate by Crack Propagation Through Its Hard Coating

2002 ◽  
Vol 734 ◽  
Author(s):  
M. George ◽  
J. Colin ◽  
C. Coupeau ◽  
J.W. Grilhé
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Crack Propagation ◽  
Post Mortem ◽  
Polymeric Substrate ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force ◽  
Film Substrate ◽  
Metallic Thin Film

Atomic force microscopy observations of the fine structure of cracks have been carried out on Nickel thin films on polyimide substrates under tensile test. For strains of the order of 10%, the cracking of the metallic thin film induces notable damaging of the polymeric substrate. Post-mortem observations of the substrate and finite element simulations of the stress field at the cracks head have been performed to characterize this unexpected damaging: the crack propagation at the film/substrate interface and inside the substrate.

Measuring Thickness Changes in Thin Films Due to Chemical Reaction by Monitoring the Surface Roughness with In Situ Atomic Force Microscopy

2002 ◽  
Vol 8 (5) ◽  
pp. 422-428 ◽  
Author(s):  
L.Y. Beaulieu ◽  
A.D. Rutenberg ◽  
J.R. Dahn
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Alloy Film ◽  
Force Microscopy ◽  
Atomic Force ◽  
Direct Proportionality ◽  
Roughness Measurements

Measuring the changing thickness of a thin film, without a reference, using an atomic force microscope (AFM) is problematic. Here, we report a method for measuring film thickness based on in situ monitoring of surface roughness of films as their thickness changes. For example, in situ AFM roughness measurements have been performed on alloy film electrodes on rigid substrates as they react with lithium electrochemically. The addition (or removal) of lithium to (or from) the alloy causes the latter to expand (or contract) reversibly in the direction perpendicular to the substrate and, in principle, the change in the overall height of these materials is directly proportional to the change in roughness. If the substrate on which the film is deposited is not perfectly smooth, a correction to the direct proportionality is needed and this is also discussed.

Piezoelectric Measurements with Atomic Force Microscopy

1998 ◽  
Vol 541 ◽  
Author(s):  
J. A. Christman ◽  
H. Maiwa ◽  
S.-H. Kim ◽  
A. I. Kingon ◽  
R. J. Nemanich
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Atomic Force Microscopy ◽  
Hysteresis Loops ◽  
Force Microscopy ◽  
Atomic Force ◽  
Single Crystal Quartz ◽  
Crystal Quartz ◽  
Source Of Error ◽  
Piezoelectric Constants

AbstractAn atomic force microscope (AFM) is used to measure the magnitude of the effective longitudinal piezoelectric constant (d33) of thin films. Measurements are performed with a conducting diamond AFM tip in contact with a top electrode which is driven by an externally applied voltage. The interaction between the tip and electric field present is a potentially large source of error that is eliminated through the use of this configuration and the conducting diamond tips. Measurements yielded reasonable piezoelectric constants of X-cut single crystal quartz, thin film ZnO, Pb(Zr,Ti)O3 (Zr/Ti = 30/70), and nonpiezoelectric amorphous SiO2 thin films. The system was also used to measure d33 hysteresis loops for Pb(Zrx,Ti1−x)O3 thin films.

Thickness Dependence of Transport Properties of Epitaxial SrRuO3 Thin Films Grown on SrTiO3 Substrates

2001 ◽  
Vol 690 ◽  
Author(s):  
G. Herranz ◽  
F. Sánchez ◽  
M.V. García-Cuenca ◽  
C. Ferrater ◽  
M. Varela ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Transport Properties ◽  
Growth Mechanism ◽  
Thickness Dependence ◽  
Force Microscopy ◽  
Substrate Interface ◽  
Atomic Force ◽  
Film Substrate ◽  
Change Of Microstructure

ABSTRACTTo study the effect of the film/substrate interface in thin films we have analyzed the thickness dependence of the transport properties of SrRuO3 films grown on SrTiO3 substrates. Our data makes evident the failure of the so-called deadlayer model to describe the observed thickness dependence of the conductivity. This is interpreted as due to a non-monotonous change of microstructure as thickness increases. Indeed, Atomic Force Microscopy studies indicate substantial modifications of the growth mechanism with thickness.

Studies on the Microstructure and Properties of TiO2/(Ag) Thin Films

2012 ◽  
Vol 503-504 ◽  
pp. 378-381
Author(s):  
Fei Gao ◽  
Xiao Yan Liu ◽  
Li Yun Zheng ◽  
Mei Xia Li ◽  
Rui Jiao Jiang
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Atomic Force Microscopy ◽  
Anatase Phase ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
X Ray ◽  
Force Microscopy ◽  
Microstructure And Properties ◽  
Atomic Force

TiO2/(Ag) thin films were prepared by DC magnetron sputtering. The effects of Ag-doping on the microstructure and properties were compared studied by atomic force microscopy (AFM), X-ray diffraction (XRD), UV-Vis spectra and photocatalysis tesing, respectively. The results show that when doped with Ag, the surface of TiO2 thin film was improved and the growth of anatase phase was promoted. The absoption properties of Ag-doped TiO2 thin film was enhanced dramatically compared with that of TiO2 thin film. And the photocatalysis properties of Ag-doped TiO2 thin film was increased twice as well.

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