The Impact of Capping on the Mobility and Thermal Stability of Organic Thin Film Transistors
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ABSTRACTWe performed temperature-dependent studies on pentacene thin film transistors (TFTs) with and without encapsulation. The capping layer is realized either by a sputtering layer of aluminum oxide (AlOx.) or, alternatively, by a polymeric layer of poly-para-xylylene (PPX). A field-effect can be demonstrated for both capping materials up to temperatures of about 140 – 170 °C, which is about 50 °C above the desorption point of uncapped pentacene thin films on SiO2 substrates. Complementary studies by thermal desorption spectroscopy and temperature dependent x-ray diffraction show that the organic layer remains crystalline on the substrate far above the electrical breakdown temperature of the encapsulated device.
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2014 ◽
Vol 2014
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pp. 1-10
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2009 ◽
Vol 10
(8)
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pp. 1442-1447
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2020 ◽
Vol 67
(11)
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pp. 5091-5096
2016 ◽
Vol 4
(26)
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pp. 6391-6400
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