A Novel Near-field Raman and White Light Imaging System for Nano Photonic and Plasmonic Studies

2008 ◽  
Vol 1077 ◽  
Author(s):  
Ze Xiang Shen ◽  
J. Kasim ◽  
Y. M. You ◽  
C. L. Du

AbstractWe show the approaches in achieving high resolution Raman and white light imaging. In Raman imaging, a dielectric microsphere is trapped by the incoming laser, which was focused onto the sample by the microsphere. The microsphere was also used to collect the scattered Raman signals. We show the capability of this method in imaging various types of samples, such as Si devices and gold nanopattern. This method is comparatively easier to perform, better repeatability, and stronger signal than the normal near-field Raman techniques. Besides the Raman imaging, we also show a far-field confocal white light reflection imaging system that can be used for the fast imaging and characterization of nanostructures. This system uses a xenon (Xe) lamp as the incident light source and tunable aperture to enhance the spatial resolution. It has a spatial resolution of around 370 nm at a wavelength of 590 nm. With our system, we can clearly resolve images of 300 nm nanoparticles arranged in 2D honeycomb arrays with a period of 500 nm. Localized surface plasmons (LSPs) of isolated single and dimer gold nanospheres were also studied and the resonance energy difference between their LSPs was extracted.

Photonics ◽  
2021 ◽  
Vol 8 (5) ◽  
pp. 143
Author(s):  
Xin Yu ◽  
Yun Shen ◽  
Guohong Dai ◽  
Liner Zou ◽  
Tailin Zhang ◽  
...  

We experimentally demonstrate that high-resolution terahertz focusing can be realized in planar metalenses, which consist of arrays of different V-shaped antenna units on a silicon substrate. Numerical results show that a larger numerical aperture of metalenses can provide smaller full width at half maximum of field distribution, leading to higher spatial resolution. The measurement of fabricated metalenses samples was performed by a terahertz near-field imaging system, and experimental results agree well with the numerical prediction. Especially for 1.1 THz incident light, when the numerical aperture increases from 0.79 to 0.95, the full width at half maximum correspondingly decreases from 343 μm to 206 μm, offering an improvement of spatial resolution.


2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Yoel Sebbag ◽  
Eliran Talker ◽  
Alex Naiman ◽  
Yefim Barash ◽  
Uriel Levy

AbstractRecently, there has been growing interest in the miniaturization and integration of atomic-based quantum technologies. In addition to the obvious advantages brought by such integration in facilitating mass production, reducing the footprint, and reducing the cost, the flexibility offered by on-chip integration enables the development of new concepts and capabilities. In particular, recent advanced techniques based on computer-assisted optimization algorithms enable the development of newly engineered photonic structures with unconventional functionalities. Taking this concept further, we hereby demonstrate the design, fabrication, and experimental characterization of an integrated nanophotonic-atomic chip magnetometer based on alkali vapor with a micrometer-scale spatial resolution and a magnetic sensitivity of 700 pT/√Hz. The presented platform paves the way for future applications using integrated photonic–atomic chips, including high-spatial-resolution magnetometry, near-field vectorial imaging, magnetically induced switching, and optical isolation.


2013 ◽  
Vol 61 (5) ◽  
pp. 2874-2879 ◽  
Author(s):  
Carlos Vazquez ◽  
Cebrian Garcia ◽  
Yuri Alvarez ◽  
Samuel Ver-Hoeye ◽  
Fernando Las-Heras

2012 ◽  
Vol 2012 ◽  
pp. 1-6 ◽  
Author(s):  
Yuika Saito ◽  
Yoshiro Ohashi ◽  
Prabhat Verma

It is a general belief in apertureless near-field microscopy that the so-calledp-polarization configuration, where the incident light is polarized parallel to the axis of the probe, is advantageous to its counterpart, thes-polarization configuration, where the incident light is polarized perpendicular to the probe axis. While this is true for most samples under common near-field experimental conditions, there are samples which respond better to thes-polarization configuration due to their orientations. Indeed, there have been several reports that have discussed such samples. This leads us to an important requirement that the near-field experimental setup should be equipped with proper sensitivity for measurements withs-polarization configuration. This requires not only creation of effective s-polarized illumination at the near-field probe, but also proper enhancement of s-polarized light by the probe. In this paper, we have examined thes-polarization enhancement sensitivity of near-field probes by measuring and evaluating the near-field Rayleigh scattering images constructed by a variety of probes. We found that thes-polarization enhancement sensitivity strongly depends on the sharpness of the apex of near-field probes. We have discussed the efficient value of probe sharpness by considering a balance between the enhancement and the spatial resolution, both of which are essential requirements of apertureless near-field microscopy.


2012 ◽  
Author(s):  
Dan Gray ◽  
Evgenia Kim ◽  
Victoria Cotero ◽  
Paul Staudinger ◽  
Siavash Yazdanfar ◽  
...  

2012 ◽  
Vol 715-716 ◽  
pp. 518-520 ◽  
Author(s):  
Allan Lyckegaard ◽  
Henning Friis Poulsen ◽  
Wolfgang Ludwig ◽  
Richard W. Fonda ◽  
Erik M. Lauridsen

Within the last decade a number of x-ray diffraction methods have been presented for non-destructive 3D characterization of polycrystalline materials. 3DXRD [1] and Diffraction Contrast Tomography [2,3,4] are examples of such methods providing full spatial and crystallographic information of the individual grains. Both methods rely on specially designed high-resolution near-field detectors for acquire the shape of the illuminated grains, and therefore the spatial resolution is for both methods limited by the resolution of the detector, currently ~2 micrometers. Applying these methods using conventional far-field detectors provides information on centre of mass, crystallographic orientation and stress state of the individual grains [5], at the expense of high spatial resolution. However, far-field detectors have much higher efficiency than near-field detectors, and as such are suitable for dynamic studies requiring high temporal resolution and set-ups involving bulky sample environments (e.g. furnaces, stress-rigs etc.)


2012 ◽  
Author(s):  
Dan Gray ◽  
Evgenia Kim ◽  
Victoria Cotero ◽  
Paul Staudinger ◽  
Siavash Yazdanfar ◽  
...  

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