Box-Scan: A Novel 3DXRD Method for Studies of Recrystallization and Grain Growth

2012 ◽  
Vol 715-716 ◽  
pp. 518-520 ◽  
Author(s):  
Allan Lyckegaard ◽  
Henning Friis Poulsen ◽  
Wolfgang Ludwig ◽  
Richard W. Fonda ◽  
Erik M. Lauridsen
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Polycrystalline Materials ◽  
High Temporal Resolution ◽  
Far Field ◽  
X Ray Diffraction ◽  
The Individual ◽  
Individual Grains ◽  
Non Destructive

Within the last decade a number of x-ray diffraction methods have been presented for non-destructive 3D characterization of polycrystalline materials. 3DXRD [1] and Diffraction Contrast Tomography [2,3,4] are examples of such methods providing full spatial and crystallographic information of the individual grains. Both methods rely on specially designed high-resolution near-field detectors for acquire the shape of the illuminated grains, and therefore the spatial resolution is for both methods limited by the resolution of the detector, currently ~2 micrometers. Applying these methods using conventional far-field detectors provides information on centre of mass, crystallographic orientation and stress state of the individual grains [5], at the expense of high spatial resolution. However, far-field detectors have much higher efficiency than near-field detectors, and as such are suitable for dynamic studies requiring high temporal resolution and set-ups involving bulky sample environments (e.g. furnaces, stress-rigs etc.)

Application of Gandolfi X-Ray Diffraction to the Characterization of Reaction Products from the Alteration of Simulated Nuclear Wastes

1980 ◽  
Vol 24 ◽  
pp. 265-269 ◽  
Author(s):  
C. A. F. Anderson ◽  
M. E. Zolensky ◽  
D. K. Smith ◽  
W. P. Freeborn ◽  
B. E. Scheetz
Keyword(s):  
Powder Diffraction ◽  
Individual Particle ◽  
Nuclear Wastes ◽  
Reaction Products ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Individual ◽  
Individual Grains ◽  
Phase Characterization

AbstractAccurate phase characterization of the alteration products of rad-waste requires the separation and identification of scattered individual grains from among the bulk product. These grains are typically 5 to 100 μm in size. Bulk x-ray powder diffraction will normally not detect these minor phases, and even if the phase can be detected, it often may not be identifiable. The use of the Gandolfi technique with the individual particle not only facilitates the identification, but also allows the assignment of the identification to the specific grain.

Three-Dimensional X-Ray Diffraction Microscopy Using High-Energy X-Rays

MRS Bulletin ◽  
2004 ◽  
Vol 29 (3) ◽  
pp. 166-169 ◽  
Author(s):  
Henning F. Poulsen ◽  
Dorte Juul Jensen ◽  
Gavin B.M. Vaughan
Keyword(s):  
Materials Science ◽  
Three Dimensional ◽  
High Energy ◽  
Polycrystalline Materials ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reconstruction Methods ◽  
The Individual ◽  
Individual Grains

AbstractThree-dimensional x-ray diffraction (3DXRD) microscopy is a tool for fast and nondestructive characterization of the individual grains, subgrains, and domains inside bulk materials. The method is based on diffraction with very penetrating hard x-rays (E ≥ 50 keV), enabling 3D studies of millimeter-to-centimeter-thick specimens.The position, volume, orientation, and elastic and plastic strain can be derived for hundreds of grains simultaneously. Furthermore, by applying novel reconstruction methods, 3D maps of the grain boundaries can be generated. The 3DXRD microscope in use at the European Synchrotron Radiation Facility in Grenoble, France, has a spatial resolution of ∼5 μm and can detect grains as small as 150 nm. The technique enables, for the first time, dynamic studies of the individual grains within polycrystalline materials. In this article, some fundamental materials science applications of 3DXRD are reviewed: studies of nucleation and growth kinetics during recrystallization, recovery, and phase transformations, as well as studies of polycrystal deformation.

scholarly journals Comparison between a near-field and a far-field indexing approach for characterization of a polycrystalline sample volume containing more than 1500 grains

2014 ◽  
Vol 47 (4) ◽  
pp. 1402-1416 ◽  
Author(s):  
Laura Nervo ◽  
Andrew King ◽  
Jonathan P. Wright ◽  
Wolfgang Ludwig ◽  
Péter Reischig ◽  
...  
Keyword(s):  
Diffraction Data ◽  
Near Field ◽  
Three Dimensional ◽  
Pure Titanium ◽  
Polycrystalline Sample ◽  
Sample Volume ◽  
Polycrystalline Materials ◽  
Far Field ◽  
X Ray Diffraction ◽  
X Ray

A comparison of the performance of X-ray diffraction tomography, a near-field diffraction technique, and a far-field diffraction technique for indexing X-ray diffraction data of polycrystalline materials has been carried out by acquiring two sets of diffraction data from the same polycrystalline sample volume. Both approaches used in this study are variants of the three-dimensional X-ray diffraction (3DXRD) methodology, but they rely on different data-collection and analysis strategies. Previous attempts to assess the quality of 3DXRD indexing results from polycrystalline materials have been restricted to comparisons with two-dimensional electron backscatter diffraction cross sections containing a limited number of grains. In the current work, the relative performance of two frequently used polycrystalline-material indexing algorithms is assessed, comparing the indexing results obtained from a three-dimensional sample volume containing more than 1500 grains. The currently achievable accuracy of three-dimensional grain maps produced with these algorithms has been assessed using a statistical analysis of the measurement of the size, position and orientation of the grains in the sample. The material used for this comparison was a polycrystalline commercially pure titanium grade 2 sample, which has a hexagonal close-packed crystal structure. The comparison of the two techniques shows good agreement for the measurements of the grain position, size and orientation. Cross-validation between the indexing results shows that about 99% of the sample volume has been indexed correctly by either of these indexing approaches. The remaining discrepancies have been analysed and the strengths and limitations of both approaches are discussed.

3DXRD – Mapping Grains and Their Dynamics in 3 Dimensions

2004 ◽  
Vol 467-470 ◽  
pp. 1363-1372 ◽  
Author(s):  
Henning Friis Poulsen ◽  
Xing Fu ◽  
Erik Knudsen ◽  
Erik M. Lauridsen ◽  
L. Margulies ◽  
...  
Keyword(s):  
European Synchrotron Radiation Facility ◽  
Polycrystalline Materials ◽  
X Rays ◽  
X Ray Diffraction ◽  
Time Dynamic ◽  
3 Dimensional ◽  
Reconstruction Methods ◽  
Set Up ◽  
The Individual ◽  
Individual Grains

3-Dimensional X-Ray Diffraction (3DXRD) microscopy is a tool for fast and non-destructive characterization of the individual grains, sub-grains and domains inside bulk materials. The method is based on diffraction with highly penetrating hard x-rays, enabling 3D studies of millimeter - centimeter thick specimens. The position, volume, orientation, elastic and plastic strain can be derived for hundreds of grains simultaneously. Furthermore, by applying novel reconstruction methods 3D maps of the grain boundaries can be generated. With the present 3DXRD microscope set-up at the European Synchrotron Radiation Facility, the spatial resolution is ~ 5 µm, while grains of size 100 nm can be detected. 3DXRD microscopy enables, for the first time, dynamic studies of the individual grains and sub-grains within polycrystalline materials. The methodology is reviewed with emphasis on recent advances in grain mapping. Based on this a series of general 3DXRD approaches are identified for studies of nucleation and growth phenomena such as recovery, recrystallisation and grain growth in metals.

Tracking: a method for structural characterization of grains in powders or polycrystals

2001 ◽  
Vol 34 (6) ◽  
pp. 744-750 ◽  
Author(s):  
E. M. Lauridsen ◽  
S. Schmidt ◽  
R. M. Suter ◽  
H. F. Poulsen
Keyword(s):  
High Energy ◽  
X Rays ◽  
Rotation Method ◽  
Euler Space ◽  
On Line ◽  
The Individual ◽  
Individual Grains ◽  
Non Destructive ◽  
Non Destructive Characterization

A method is presented for fast and non-destructive characterization of the individual grains inside bulk materials (powders or polycrystals). The positions, volumes and orientations of hundreds of grains are determined simultaneously. An extension of the rotation method is employed: a monochromatic beam of high-energy X-rays, focused in one dimension, impinges on the sample and the directions of the diffracted beams are traced by translation of two-dimensional detectors. Algorithms suitable for on-line analysis are described, including a novel indexing approach, where the crystal symmetry is used directly by scanning in Euler space. The method is verified with a simulation of 100 grains.

Three Dimensional Characterization of Grain Structures by EBSP and 3DXRD

2007 ◽  
Vol 558-559 ◽  
pp. 751-756 ◽  
Author(s):  
Kristofer Hannesson ◽  
Dorte Juul Jensen
Keyword(s):  
Three Dimensional ◽  
Polycrystalline Materials ◽  
Serial Sectioning ◽  
X Ray Diffraction ◽  
X Ray ◽  
3D Structures ◽  
3 Dimensional ◽  
Grain Structures ◽  
Non Destructive

Grain structures in polycrystalline materials are typically three dimensional (3D) structures, but by far the most characterizations of grain structures are done by microscopy and are thus limited to 2D. In the present work 3D grain structures in a well-annealed cylindrical aluminium (AA1050) sample is characterized and analyzed. The characterization is done by 2 methods i) by non-destructive 3-dimensional x-ray diffraction (3DXRD) ii) by serial sectioning and subsequent EBSP mapping of entire circular 2D sample sections; 50 sections are mapped In total 333 grains are reconstructed. It is found that the 3D grain morphologies can be quite complex in particular for the larger grains, the number of neighbours varies significantly and values above 20 are not unusual. When the results from the 2 methods are compared, it is found that the crystallographic agreement is very good and within experimental uncertainties. Slightly more significant differences are found when the reconstructed grain morphologies are compared. Reasons for this are discussed.

Characterization and Control of Copper CMP with Optoacoustic Metrology

2001 ◽  
Vol 671 ◽  
Author(s):  
Michael Gostein ◽  
Paul Lefevre ◽  
Alex A. Maznev ◽  
Michael Joffe
Keyword(s):  
Film Thickness ◽  
Spatial Resolution ◽  
Chemical Mechanical Polishing ◽  
High Spatial Resolution ◽  
Mechanical Polishing ◽  
Length Measurement ◽  
And Control ◽  
Non Destructive

ABSTRACTWe discuss applications of optoacoustic film thickness metrology for characterization of copper chemical-mechanical polishing (CMP). We highlight areas where the use of optoacoustics for CMP characterization provides data complementary to that obtained by other techniques because of its ability to directly measure film thickness with high spatial resolution in a rapid, non-destructive manner. Examples considered include determination of planarization length, measurement of film thickness at intermediate stages of polish, and measurement of arrays of metal lines.

3-Dimensional Characterization of Polycrystalline Bulk Materials Using High-Energy Synchrotron Radiation

2007 ◽  
Vol 539-543 ◽  
pp. 2353-2358 ◽  
Author(s):  
Ulrich Lienert ◽  
Jonathan Almer ◽  
Bo Jakobsen ◽  
Wolfgang Pantleon ◽  
Henning Friis Poulsen ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
High Energy ◽  
Mapping Technique ◽  
X Ray Diffraction ◽  
Bulk Materials ◽  
Reciprocal Space Mapping ◽  
3 Dimensional ◽  
Individual Grains

The implementation of 3-Dimensional X-Ray Diffraction (3DXRD) Microscopy at the Advanced Photon Source is described. The technique enables the non-destructive structural characterization of polycrystalline bulk materials and is therefore suitable for in situ studies during thermo-mechanical processing. High energy synchrotron radiation and area detectors are employed. First, a forward modeling approach for the reconstruction of grain boundaries from high resolution diffraction images is described. Second, a high resolution reciprocal space mapping technique of individual grains is presented.

scholarly journals Demonstration of an integrated nanophotonic chip-scale alkali vapor magnetometer using inverse design

2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Yoel Sebbag ◽  
Eliran Talker ◽  
Alex Naiman ◽  
Yefim Barash ◽  
Uriel Levy
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Computer Assisted ◽  
Experimental Characterization ◽  
Optical Isolation ◽  
New Concepts ◽  
On Chip ◽  
The Cost ◽  
Micrometer Scale

AbstractRecently, there has been growing interest in the miniaturization and integration of atomic-based quantum technologies. In addition to the obvious advantages brought by such integration in facilitating mass production, reducing the footprint, and reducing the cost, the flexibility offered by on-chip integration enables the development of new concepts and capabilities. In particular, recent advanced techniques based on computer-assisted optimization algorithms enable the development of newly engineered photonic structures with unconventional functionalities. Taking this concept further, we hereby demonstrate the design, fabrication, and experimental characterization of an integrated nanophotonic-atomic chip magnetometer based on alkali vapor with a micrometer-scale spatial resolution and a magnetic sensitivity of 700 pT/√Hz. The presented platform paves the way for future applications using integrated photonic–atomic chips, including high-spatial-resolution magnetometry, near-field vectorial imaging, magnetically induced switching, and optical isolation.

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