X-Ray Tomographic Microscopy of Nicalon Preforms and Chemical Vapor Infiltrated Nicalon/Silicon Carbide Composites
Keyword(s):
X Ray
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AbstractFollowing the evolving microstructure of composites through all stages of chemical vapor infiltration (CVI) is a key to improved understanding and control of the process. X-ray Tomographic Microscopy (XTM), i.e., very high resolution computed tomography, allows the microstructure of macroscopic volumes of a composite to be imaged nondestructively with resolution approaching one micrometer. Results obtained with XTM on dense SiC/SiC composites and on woven SiC fiber preforms illustrate how details of the densification process can be followed using this technique during interruptions in processing. Ways in which the three-dimensional microstructural information may be used to improve modeling are also indicated.
2014 ◽
Vol 788
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pp. 593-597
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2004 ◽
Vol 85
(5)
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pp. 1217-1221
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2007 ◽
Vol 546-549
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pp. 1585-1590
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2009 ◽
Vol 24
(5)
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pp. 939-942
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2002 ◽
Vol 110
(1277)
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pp. 44-50
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