On the Determination of Partial RDFs for Amorphous Materials

1993 ◽  
Vol 321 ◽  
Author(s):  
L. C. Qin ◽  
L. W. Hobbs
Keyword(s):  
Electron Diffraction ◽  
Diffraction Data ◽  
Amorphous Materials ◽  
Vitreous Silica ◽  
Scanning Transmission Electron Microscope ◽  
Distribution Functions ◽  
Electron Diffraction Data ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission

ABSTRACTRadial distribution functions (RDFs) for vitreous silica (V-SiO2) have been obtained from energy-filtered electron diffraction data obtained in the HB5 scanning transmission electron Microscope. Results have been compared with those obtained from high-resolution neutron diffraction experiments, and are in good agreement within experimental errors. It was found to be impractical to obtain partial RDFs for this material from combined neutron, X-ray and electron diffraction data, because the similarities in characteristics of X-ray and electron scattering cause indeter-Minacies. A criterion equation has been given to determine feasibility.

Energy-filtered electron diffraction from amorphized solids in the dedicated scanning transmission electron microscope (STEM)¶

1996 ◽  
Vol 54 ◽  
pp. 702-703
Author(s):  
A. N. Sreeram ◽  
L.-C. Qin ◽  
A. J. Garratt-Reed ◽  
L. W. Hobbs
Keyword(s):  
Electron Diffraction ◽  
Diffraction Data ◽  
Scanning Transmission Electron Microscope ◽  
Real Space ◽  
Distribution Functions ◽  
Space Distribution ◽  
Electron Diffraction Data ◽  
X Rays ◽  
Transmission Electron ◽  
Scanning Transmission

There is significant current interest in understanding the structure of aperiodic solids, such as originally crystalline material amorphized by ion implantation, impact or application of massive pressures, or deposited amorphous thin films, which occupy small volumes. Radially-averaged real-space distribution functions can be derived from diffraction data, the best of which come from thermal neutron diffraction, which inconveniently requires large volumes. Neutron data are collectable in reciprocal space out to q ≡ 2sin(Θ/2)/λ = 70 nm-1, where Θ is the scattering angle and λ the wavelength, or about twice as far as for X-rays, which also require large diffracting volumes. Electron diffraction is the only recourse for very small volumes because of the much stronger interaction of the electron, but spectra must be energy filtered to remove the large inelastic scattering component. Recently, it has been shown that useful electron diffraction data can be collected conveniently to at least q = 16 nm-1 in the VG HB5 dedicated 100-kV field-emission STEM. This contribution details our experiences with improved collection in the VG HB603 instrument operating at 250 kV.

scholarly journals SUePDF: a program to obtain quantitative pair distribution functions from electron diffraction data

2017 ◽  
Vol 50 (1) ◽  
pp. 304-312 ◽  
Author(s):  
Dung Trung Tran ◽  
Gunnar Svensson ◽  
Cheuk-Wai Tai
Keyword(s):  
Electron Diffraction ◽  
Electron Scattering ◽  
Diffraction Data ◽  
Amorphous Materials ◽  
Fourier Transforms ◽  
Distribution Functions ◽  
Electron Diffraction Data ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Pair Distribution Functions

SUePDFis a graphical user interface program written in MATLAB to achieve quantitative pair distribution functions (PDFs) from electron diffraction data. The program facilitates structural studies of amorphous materials and small nanoparticles using electron diffraction data from transmission electron microscopes. It is based on the physics of electron scattering as well as the total scattering methodology. A method of background modeling is introduced to treat the intensity tail of the direct beam, inelastic scattering and incoherent multiple scattering. Kinematical electron scattering intensity is scaled using the electron scattering factors. The PDFs obtained after Fourier transforms are normalized with respect to number density, nanoparticle form factor and the non-negativity of probability density.SUePDFis distributed as free software for academic users.

scholarly journals Quantitative Electron Diffraction Data of Amorphous Materials

2005 ◽  
Vol 60 (6) ◽  
pp. 459-468 ◽  
Author(s):  
Jürgen Ankele ◽  
Joachim Mayer ◽  
Peter Lamparter ◽  
Siegfried Steeb
Keyword(s):  
Electron Diffraction ◽  
Multiple Scattering ◽  
Diffraction Data ◽  
Amorphous Materials ◽  
Structural Model ◽  
Electron Diffraction Data ◽  
X Ray ◽  
A Value ◽  
Transmission Electron ◽  
Scattering Correction

A method has been developed to obtain quantitative electron diffraction data up to a value of Q = 20 Å−1 of the modulus of the scattering vector. The experiments were performed on a commercially available transmission electron microscope equipped with a so-called omega energy filter. An analytical multiple scattering correction was applied. The electron diffraction results obtained with amorphous germanium were compared with X-ray and neutron diffraction data and showed good agreement. For an amorphous Ni63Nb37 sample it was shown that it is possible to estimate the multiple scattering intensity without exact knowledge of the sample thickness. This technique was applied to derive the structure factor for electron diffraction of two precursor-derived amorphous Si-C-N ceramics (a-Si24C43N33 and a-Si40C24N36). The results are consistent with corresponding X-ray diffraction data and with an existing structural model for such ceramics.

X-ray powder diffraction and transmission electron diffraction data for BaMnSi2O6—A new phase in the system BaO–MnO–SiO2

1996 ◽  
Vol 11 (4) ◽  
pp. 284-287 ◽  
Author(s):  
I. T. Ivanov ◽  
D. D. Nihtianova ◽  
I. Georgieva
Keyword(s):  
Electron Diffraction ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Electron Diffraction Data ◽  
Space Group ◽  
X Ray ◽  
Transmission Electron ◽  
New Phase

A new phase in the system BaO–MnO–SiO2 obtained by a pyrosynthetic method has been inves- tigated using electron microprobe analysis (EPMA), X-ray powder diffraction (PDA), and trans- mission electron diffraction. The lattice parameters and possible space group of the phase with a general composition BaMnSi2O6 were determined as follows: a=13.896, b=12.261, c=10.781 Å, β=103.47°, space group P21/m, Z=12.

High-resolution x-ray imaging of small copper-rich precipitates in steels

1988 ◽  
Vol 46 ◽  
pp. 528-529
Author(s):  
J. R. Michael ◽  
K. A. Taylor
Keyword(s):  
Electron Microscopy ◽  
Thermomechanical Processing ◽  
Atom Probe ◽  
Ferrite Matrix ◽  
Scanning Transmission Electron Microscope ◽  
Probe Field ◽  
X Ray ◽  
Subsequent Transformation ◽  
Transmission Electron ◽  
Scanning Transmission

Although copper is considered an incidental or trace element in many commercial steels, some grades contain up to 1-2 wt.% Cu for precipitation strengthening. Previous electron microscopy and atom-probe/field-ion microscopy (AP/FIM) studies indicate that the precipitation of copper from ferrite proceeds with the formation of Cu-rich bcc zones and the subsequent transformation of these zones to fcc copper particles. However, the similarity between the atomic scattering amplitudes for iron and copper and the small misfit between between Cu-rich particles and the ferrite matrix preclude the detection of small (<5 nm) Cu-rich particles by conventional transmission electron microscopy; such particles have been imaged directly only by FIM. Here results are presented whereby the Cu Kα x-ray signal was used in a dedicated scanning transmission electron microscope (STEM) to image small Cu-rich particles in a steel. The capability to detect these small particles is expected to be helpful in understanding the behavior of copper in steels during thermomechanical processing and heat treatment.

The effect of small additions of Cu on precipitation in Al-Mg-Si alloys

1990 ◽  
Vol 48 (2) ◽  
pp. 442-443
Author(s):  
M. Tamizifar ◽  
G. Cliff ◽  
R.W. Devenish ◽  
G.W. Lorimer
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Argon Atmosphere ◽  
Age Hardening ◽  
X Ray ◽  
Transmission Electron ◽  
Heat Treated ◽  
Analytical Electron ◽  
Scanning Transmission

Small additions of copper, <1 wt%, have a pronounced effect on the ageing response of Al-Mg-Si alloys. The object of the present investigation was to study the effect of additions of copper up to 0.5 wt% on the ageing response of a series of Al-Mg-Si alloys and to use high resolution analytical electron microscopy to determine the composition of the age hardening precipitates.The composition of the alloys investigated is given in Table 1. The alloys were heat treated in an argon atmosphere for 30m, water quenched and immediately aged either at 180°C for 15 h or given a duplex treatment of 180°C for 15 h followed by 350°C for 2 h2. The double-ageing treatment was similar to that carried out by Dumolt et al. Analyses of the precipitation were carried out with a HB 501 Scanning Transmission Electron Microscope. X-ray peak integrals were converted into weight fractions using the ratio technique of Cliff and Lorimer.

High Spatial Resolution Compositional Analysis at Interfaces

1980 ◽  
Vol 38 ◽  
pp. 356-359
Author(s):  
John B. Vander Sande ◽  
Thomas F. Kelly ◽  
Douglas Imeson
Keyword(s):  
Electron Microscope ◽  
High Spatial Resolution ◽  
Compositional Analysis ◽  
Scanning Transmission Electron Microscope ◽  
Thin Specimen ◽  
X Ray ◽  
Volume Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

In the scanning transmission electron microscope (STEM) a fine probe of electrons is scanned across the thin specimen, or the probe is stationarily placed on a volume of interest, and various products of the electron-specimen interaction are then collected and used for image formation or microanalysis. The microanalysis modes usually employed in STEM include, but are not restricted to, energy dispersive X-ray analysis, electron energy loss spectroscopy, and microdiffraction.

Sign in / Sign up

Export Citation Format

Share Document