The Characterization of Thin Films and Layered Structures Using X-RAY Absorption and Reflection at Grazing Incidence

1984 ◽  
Vol 37 ◽  
Author(s):  
S. M. Heald ◽  
J. M. Tranquada ◽  
D. O. Welch ◽  
H. Chen
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
High Resolution ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray ◽  
Surface And Interface ◽  
Interface Structures ◽  
X Ray Absorption

AbstractX-rays at grazing incidence have a short, controllable penetration depth and are well suited as a probe of surface and interface structures. This paper examines the possibility applying grazing-incidence reflectivity and Extended X-Ray Absorption Fine Structure (EXAFS) measurements to such systems. Results are presented for an Al-Cu couple for which both high resolution reflectivity and interface EXAFS measurements are made. The latter results are the first interface specific EXAFS data to be reported. Distinct changes in both signals are observed upon annealing, demonstrating the potential of the techniques.

Characterization of Cellulosic Biomass Loaded with Iron and Arsenic Using High Energy X-Rays

2007 ◽  
Vol 20-21 ◽  
pp. 643-646 ◽  
Author(s):  
G. Cordeiro Silva ◽  
Regina Pinto de Carvalho ◽  
M. Sylvia S. Dantas ◽  
Virgínia S.T. Ciminelli
Keyword(s):  
Fine Structure ◽  
Arsenic Species ◽  
High Energy ◽  
Cellulosic Biomass ◽  
X Rays ◽  
Iron Ions ◽  
X Ray ◽  
X Ray Absorption ◽  
Exafs Spectra

The biosorption of arsenic species by dried lettuce leaves (L.sativa) was investigated. Arsenic sorption, that is not effective on in natura biomass, was enhanced when the biomass was previously loaded with Fe(III). Analysis of X-ray Absorption Near-Edge Spectroscopy (XANES) spectra showed that iron was incorporated as Fe(III) and arsenic as As(V), regardless the contact with the lowest or highest valence species of these elements. The features of Extended X-ray Absorption Fine-Structure Spectroscopy (EXAFS) spectra suggest that the nearest neighboring atoms of iron ions are the same in all the samples, even in the As-Fe loaded ones. These results indicate the arsenic oxyanions as the sorbed species on the iron-loaded biomass.

X-ray absorption fine structure and magnetization characterization of the metallic Co component in Co-doped ZnO thin films

2009 ◽  
Vol 79 (7) ◽  
Author(s):  
Steve M. Heald ◽  
Tiffany Kaspar ◽  
Tim Droubay ◽  
V. Shutthanandan ◽  
Scott Chambers ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Zno Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
Doped Zno ◽  
X Ray Absorption ◽  
Co Doped

Characterization of the Non-uniform Reaction in Chemically Amplified Calix[4]resorcinarene Molecular Resist Thin Films

2011 ◽  
Vol 64 (8) ◽  
pp. 1065 ◽  
Author(s):  
Vivek M. Prabhu ◽  
Shuhui Kang ◽  
R. Joseph Kline ◽  
Dean M. DeLongchamp ◽  
Daniel A. Fischer ◽  
...  
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
Neutron Reflectivity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Organic Bases ◽  
Reaction Extent ◽  
X Ray Absorption ◽  
Surface Layer Thickness

The ccc stereoisomer-purified tert-butoxycarbonyloxy-protected calix[4]resorcinarene molecular resists blended with photoacid generator exhibit a non-uniform photoacid-catalyzed reaction in thin films. The surface displays a reduced reaction extent, compared with the bulk, with average surface-layer thickness 7.0 ± 1.8 nm determined by neutron reflectivity with deuterium-labelled tert-butoxycarbonyloxy groups. Ambient impurities (amines and organic bases) are known to quench surface reactions and contribute, but grazing-incidence X-ray diffraction shows an additional effect that the protected molecular resists are preferentially oriented at the surface, whereas the bulk of the film displays diffuse scattering representative of amorphous packing. The surface deprotection reaction and presence of photoacid were quantified by near-edge X-ray absorption fine-structure measurements.

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
Sign in / Sign up

Export Citation Format

Share Document