A Method For The Tem Characterisation Of Grain Boundary Films In Ceramics
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ABSTRACTThe behaviour of Fresnel fringes with focus has been investigated as a means of characterising grain boundaries in engineering ceramics. This technique, together with dark-field imaging, has been applied to the study of grain boundaries in two hot-pressed silicon carbides. It is demonstrated that these two techniques, applied together, provide the best means of obtaining a complete characterisation of grain boundary films, in terms of width, structure, and composition.
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1995 ◽
Vol 53
◽
pp. 466-467
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