Differential Anomalous X-Ray Scattering Techniques for Determination of Liquid and Amorphous Structures

1985 ◽  
Vol 57 ◽  
Author(s):  
W. K. Warburton ◽  
K. F. Ludwig ◽  
L. Wilson ◽  
A. Bienenstock
Keyword(s):  
Structural Models ◽  
Distribution Functions ◽  
Anomalous Scattering ◽  
Differential Distribution ◽  
X Ray ◽  
Amorphous Systems ◽  
X Ray Scattering ◽  
Scattering Technique ◽  
Amorphous Structures

AbstractThe differential anomalous scattering technique is outlined and compared to other techniques for studying short-range order in amorphous systems, such as EXAFS. The differential distribution functions obtained for liquid GeBr4 were found to support a model for the liquid state based on the structure of the h.c.p. crystal. Application of the technique to aqueous ZnBr2 also allowed discr imination between structural models.

Determination of Structure, Shape and Sizes of Clusters Using Radial Distribution Functions (RDF) Method

1992 ◽  
Vol 272 ◽  
Author(s):  
Pavel E. Kolosov ◽  
A. V. Bubnov
Keyword(s):  
Distribution Functions ◽  
Structure Characterization ◽  
Radial Distribution Functions ◽  
Experimental Conditions ◽  
Interatomic Distances ◽  
X Ray ◽  
Molybdenum Sulfides ◽  
X Ray Scattering

ABSTRACTThe theoretical reduced intensity of X-ray scattering i(S) may be calculated for a cluster of any structure using Debye's formula. The comparison of both experimental determination and model calculation of the RDF or i(S) allows, to make a conclusions about structure of materials in a wide region of interatomic distances. This is a very important for direct structure characterization of giant clusters, dispersed molybdenum sulfides etc.. The simple formula for the upper limit of interatomic distances when the data are collected at equidistant step on S – scatterinrg vector, may be used for the optimal experimental conditions selection.

Combination of EXAFS and Differential Anomalous X-ray Scattering for Studying Ni 2 Zr Amorphous Alloy

1992 ◽  
Vol 47 (12) ◽  
pp. 1191-1196 ◽  
Author(s):  
Yu. A. Babanov ◽  
A. F. Sidorenko ◽  
V. R. Shvetsov ◽  
M. Bionducci ◽  
G. Licheri ◽  
...  
Keyword(s):  
Amorphous Alloy ◽  
Mechanical Alloying ◽  
Distribution Functions ◽  
Anomalous Scattering ◽  
X Ray ◽  
Amorphous Sample ◽  
X Ray Scattering ◽  
Partial Distribution ◽  
Pair Distribution Functions ◽  
Ray Scattering

Abstract In this paper we report a first application of the new idea of combining EXAFS and differential anomalous scattering techniques to obtain partial distribution functions for a binary amorphous sample. This method has been successfully employed in extracting Ni-Ni and Ni-Zr pair distribution functions for Ni2Zr prepared by mechanical alloying. A comparison with results from previous studies is also reported.

Structural determination of amorphous Ti-Ni alloys

1984 ◽  
Vol 42 ◽  
pp. 508-509
Author(s):  
A. R. Pelton ◽  
P. Moine ◽  
R. Sinclair
Keyword(s):  
Amorphous Alloys ◽  
Structural Investigation ◽  
Distribution Functions ◽  
Atomic Processes ◽  
Statistical Characterization ◽  
X Ray ◽  
Ni Alloys ◽  
Amorphous Structures

Amorphous Ti-Ni alloys may be prepared by a variety of techniques, including: liquid quenching, ion implantation, electron irradiation, and vapor synthesis. Each of these techniques involves fundamentally different atomic processes with concomitant different effective quench rates. Since quench rates affect the degree of structural order, it is conceivable that a variety of metastable configurational states may thus result. Radial distribution functions (RDF’s) from diffraction experiments are a generally accessible probe for statistical characterization of amorphous alloys, and hence, a useful tool to compare amorphous structures. However, not all of the amorphization methods are capable of producing sufficient quantities of material required for x-ray or neutron scattering. Therefore, the purpose of this paper is to report the preliminary results from a comparative structural investigation of Ti-Ni alloys by x-ray and electron diffraction.

Structure Determination of B4C and SiC Thin Films Via Synchrotron High-Resolution Diffraction

1997 ◽  
Vol 505 ◽  
Author(s):  
J. Hershberger ◽  
F. Kustas ◽  
Z. U. Rek ◽  
S. M. Yalisove ◽  
J. C. Bilello
Keyword(s):  
Thin Films ◽  
Average Density ◽  
Distribution Functions ◽  
Degree Of Crystallinity ◽  
X Ray Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Si Substrates ◽  
X Ray Scattering

ABSTRACTThin films of B4C and SiC deposited by magnetron sputtering as components of multilayers have the potential to provide significant property improvements over current wear resistant coating technology. B4C and SiC have previously been found to be amorphous and possibly nanocrystalline under the deposition conditions used. This study reports results of synchrotron x-ray scattering experiments providing information on the degree of crystallinity, strain, average density, and coordination number in 2000 Å films of these compounds on Si substrates. Radial distribution functions from B4C and SiC thin films were obtained and used to model the structure. Strain results are compared with Double Crystal x-ray Diffraction Topography (DCDT) results as a means for establishing a standard strain state.

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