Texture Formation and Superconducting Properties of YBa2Cu3Ox Thin Films Prepared by Solution Process on LaAlO3 Single Crystals

2000 ◽  
Vol 659 ◽  
Author(s):  
Y.-A Jee ◽  
B. Ma ◽  
M. Li ◽  
B. L. Fisher ◽  
U. Balachandran

ABSTRACTYBa2Cu3Ox (YBCO) thin films were fabricated by the trifluoroacetate (TFA) process on LaAlO3 (LAO) single crystal in an argon atmosphere. We focused on lowering the heat treatment temperature by decreasing the oxygen partial pressure to adopt the TFA process to metallic substrates. YBCO phase formation was checked by measuring Tc with the inductive method. In-plane and out-of-plane film textures were evaluated by phi-scan and omega scan, respectively. Raman spectroscopy was used to estimate grain connectivity, in-plane texture, and second-phase formation of the films. Although Raman spectroscopy revealed some evidence of cation disorder, the film prepared at 750°C shows a sharp superconducting transition at 91 K and critical current density of 1.3 MA/cm2 at 77 K. Optimal heat treatment temperature was 750°C in the argon atmosphere, which is consistent with the thermodynamic estimate that heat treatment temperature decreases as oxygen partial pressure decreases.

1995 ◽  
Vol 10 (7) ◽  
pp. 1756-1763 ◽  
Author(s):  
P.K. Narwankar ◽  
J.S. Speck ◽  
F.F. Lange

Thin films of ZrO2-Al2O3 were grown on cubic-Zr(Y)O2 substrates by a liquid precursor route. Phase formation and epitaxy of these films was studied as a function of heat-treatment temperature and time. The following sequence of phases was observed in these thin films: Precursor → t-(Zr,Al)O2 → t-(Zr,Al)O2 + γ-(Al,Zr)2O3 → m-ZrO2 + α-Al2O3 Observations strongly suggest that the epitaxial process initiated before the metastable, single phase t-(Zr, Al)O2 partitioned to t-(Zr, Al)O2 + γ-(Al, Zr)2O3. Observations at 1400 °C show that, after the γ to α transformation, α-Al2O3, grains develop an elongated, prismatic morphology and an epitaxial relation with the underlying and surrounding m-ZrO2. The phase that is chemically and structurally similar to the substrate, in this case t-(Zr,Al)O2, or m-ZrO2, forms an epitaxial layer between the substrate and isolated, prismatic grains of heteroepitaxial α-Al2O3.


Optik ◽  
2021 ◽  
Vol 232 ◽  
pp. 166527
Author(s):  
Haisu Qian ◽  
Linhua Xu ◽  
Fenglin Xian ◽  
Jing Su ◽  
Xiaoqiang Luo

1985 ◽  
Vol 54 ◽  
Author(s):  
Albertus G. Dirks ◽  
Tien Tien ◽  
Janet M. Towner

ABSTRACTThe microstructure and properties of thin films depends strongly upon the alloy composition. A study was made of the metallurgical aspects of homogeneous Al alloy films, particularly the binary Al-Ti and the ternary Al-Ti-Si systems. Electrical resistivity, grain size morphology, second phase formation and electromigration have been studied as a function of the alloy composition and its heat treatment.


2009 ◽  
Vol 387 (1) ◽  
pp. 161-166 ◽  
Author(s):  
Zongrong Wang ◽  
Tao Hu ◽  
Liwen Tang ◽  
Chenlu Song ◽  
Gaorong Han ◽  
...  

2014 ◽  
Author(s):  
H. Funakubo ◽  
T. Shimizu ◽  
T. Yokouchi ◽  
T. Oikawa ◽  
T. Shiraishi ◽  
...  

2007 ◽  
Vol 539-543 ◽  
pp. 3514-3519
Author(s):  
Yi Hu ◽  
Feng Wei Wang ◽  
Hur Lon Lin

La3Ga5SiO14 (LGS) thin films were grown on (200)-textured MgO buffer layer, which was deposited on the silicon wafer, by sputtering at 600°C. These thin films were annealed and transformed form amorphous to the LGS crystalline phase with the heat treatment temperature higher than 1150°C. It was found that the films with LGS crystalline phase showed luminescent characterization whereas the LGS sintered solids did not. The emission peak of the films was found to be 438 nm under the excited light of λex=300nm. Effects of annealed temperature on the luminescent properties of the thin films are investigated. The relationship between the mechanism of luminescence and the crystalline structure of the LGS films are discussed.


2007 ◽  
Vol 31 ◽  
pp. 14-16
Author(s):  
Wen Xiu Que ◽  
X.M. Ren ◽  
W. Zhang ◽  
W.J. Jiang ◽  
Y. Gao ◽  
...  

Titania/organically modified silane hybrid thin films for photonic applications were prepared by combining a low temperature sol-gel technique and a spin-coating process from an organic-inorganic hybrid system. Effects of the titanium content and heat treatment temperature on the structural and optical properties of the hybrid thin films were characterized by atomic force microscopy and UV-visible spectroscopy. It is found that the optical and microstructural properties of the hybrid thin films depend on the heat-treatment temperature and titanium molar contents. The thickness and the refractive index of the hybrid thin films were also measured and found to be related to the heat treatment temperature and titanium molar content. These results indicate that a dense and high transparent hybrid thin film can be obtained at a low heat treatment temperature. Potential photonic device structural patterns can easily fabricated from the as-prepared hybrid thin films by using etching process.


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