Formation of Gold Nanowires on MgO Surfaces

2001 ◽  
Vol 703 ◽  
Author(s):  
Akira Ueda ◽  
Richard R. Mu ◽  
Vanessa Saunders ◽  
Thurston Livingston ◽  
Marvin H. Wu ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force Microscope Image ◽  
Gold Nanowires ◽  
Microscope Image ◽  
Atomic Force ◽  
Inclined Angle

ABSTRACTGold nanowires were fabricated on the stepped MgO (100) surfaces. The stepped MgO (100) surfaces were produced by polishing (100) surfaces at an inclined angle ∼1° toward a [110] direction. An atomic force microscope image indicates that gold nanowires have grown at the steps on MgO (100) surface with a height of ∼ 2 nm and a width of ∼60 nm.

Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image

1997 ◽  
Vol 36 (Part 2, No. 10B) ◽  
pp. L1410-L1412
Author(s):  
Ryuji Nishi ◽  
Takayuki Ohta ◽  
Yasuhiro Sugawara ◽  
Seizo Morita ◽  
Takao Okada
Keyword(s):  
Computed Tomography ◽  
Atomic Force Microscope ◽  
Atomic Force Microscope Image ◽  
Microscope Image ◽  
Atomic Force

Comparison of Etch Pit Shapes on Off-Oriented 4H-SiC Using Different Halogen Gases

2013 ◽  
Vol 740-742 ◽  
pp. 589-592
Author(s):  
Tomoaki Hatayama ◽  
Tetsuya Tamura ◽  
Hiroshi Yano ◽  
Takashi Fuyuki
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force Microscope Image ◽  
Mixed Gas ◽  
Cross Sectional ◽  
X Ray ◽  
Microscope Image ◽  
Etch Pit ◽  
Atomic Force ◽  
Dislocation Type ◽  
The Cross

An etch pit shape of off-angled 4H-SiC Si-face formed by different halogen gases such as chlorine trifluoride (ClF3) and a mixed gas (O2+Cl2) of oxygen and chlorine in nitrogen (N2) ambience has been studied. One kind of etch pit with the crooked hexagon was formed at etching temperature under 500oC. The angle of etch pit measured by the cross-sectional atomic force microscope image was about 10o from the [11-20] view. A dislocation type of the etch pit was discussed in comparison with the etch pit shape and an X-ray topography image.

scholarly journals In situbending of an Au nanowire monitored by micro Laue diffraction

2015 ◽  
Vol 48 (1) ◽  
pp. 291-296 ◽  
Author(s):  
Cédric Leclere ◽  
Thomas W. Cornelius ◽  
Zhe Ren ◽  
Anton Davydok ◽  
Jean-Sébastien Micha ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Gold Nanowires ◽  
Element Analysis ◽  
Bending Angle ◽  
Three Point Bending ◽  
Atomic Force ◽  
Au Nanowire ◽  
Bending Process ◽  
Diffraction Patterns

This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope forin situnanomechanical tests of individual nanostructures.In situthree-point bending on self-suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self-suspended wire, the evolution of µLaue diffraction patterns was monitored, allowing for extraction of the bending angle of the nanowire. This bending compares well with finite element analysis taking into account elastic constant bulk values and geometric nonlinearities. This novel experimental setup opens promising perspectives for studying mechanical properties at the nanoscale.

Fabrication of Gold Nanowires Using Contact Mode Atomic Force Microscope

2004 ◽  
Vol 43 (9A) ◽  
pp. 6347-6349 ◽  
Author(s):  
Manabu Watanabe ◽  
Hiroki Minoda ◽  
Kunio Takayanagi
Keyword(s):  
Atomic Force Microscope ◽  
Gold Nanowires ◽  
Contact Mode ◽  
Atomic Force

Direct nanomechanical machining of gold nanowires using a nanoindenter and an atomic force microscope

2004 ◽  
Vol 15 (3) ◽  
pp. 551-556 ◽  
Author(s):  
Xiaodong Li ◽  
Patrick Nardi ◽  
Chang-Wook Baek ◽  
Jong-Man Kim ◽  
Yong-Kweon Kim
Keyword(s):  
Atomic Force Microscope ◽  
Gold Nanowires ◽  
Atomic Force
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