ABSTRACTGold nanowires were fabricated on the stepped MgO (100) surfaces. The stepped MgO (100) surfaces were produced by polishing (100) surfaces at an inclined angle ∼1° toward a [110] direction. An atomic force microscope image indicates that gold nanowires have grown at the steps on MgO (100) surface with a height of ∼ 2 nm and a width of ∼60 nm.
An etch pit shape of off-angled 4H-SiC Si-face formed by different halogen gases such as chlorine trifluoride (ClF3) and a mixed gas (O2+Cl2) of oxygen and chlorine in nitrogen (N2) ambience has been studied. One kind of etch pit with the crooked hexagon was formed at etching temperature under 500oC. The angle of etch pit measured by the cross-sectional atomic force microscope image was about 10o from the [11-20] view. A dislocation type of the etch pit was discussed in comparison with the etch pit shape and an X-ray topography image.
Presented is a new fabrication method for CNT (Carbon NanoTubes) nanoelectrode pairs by combining the DEP (Di-electrophoresis) and AFM (Atomic Force Microscope) lithography. The single CNT is driven and electrically connected with the microeletrodes by the DEP force,then cut into nanoeletrode pairs with AFM tip. The fabricated CNT nanoeletrode pairs can be used as probes to detect species in micro-environment and applied in electrochemical sensors.
Atomic Force Microscope Image Contrast Mechanisms on Supported Lipid Bilayers