Interface Conduction between Conductive ReO3 Thin Film and NdBa2Cu3O6 Thin Film

ABSTRACTThe Re oxide films were deposited on quartz glasses by RF reactive sputtering from a Re metal target. The lowest resistivity was observed in the film in-situ annealed at 200°C in Ar atmosphere and showed the order of 10-4 Ω cm of which the value was still about 10 times as large as that of a single crystal ReO3. The temperature dependence of the resistivity revealed a metallic behavior. A superconductivity did not take place in the bilayered film of ReO3 / NdBa2Cu3O6. In the interface region the resistivity minimum probably caused by the Kondo effect was observed in the neighborhood of 120K.

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Interface Conduction between Conductive ReO3 Thin Film and NdBa2Cu3O6 Thin Film

MRS Proceedings ◽

10.1557/proc-751-z5.7 ◽

2002 ◽

Vol 751 ◽

Author(s):

Manabu Ohkubo ◽

Kumiko Fukai ◽

Kohji Matsuo ◽

Nobuyuki Iwata ◽

Hiroshi Yamamoto

Keyword(s):

Thin Film ◽

Single Crystal ◽

Kondo Effect ◽

Metal Target ◽

Metallic Behavior ◽

Resistivity Minimum ◽

Bilayered Film ◽

Quartz Glasses ◽

Interface Conduction

ABSTRACTThe Re oxide films were deposited on quartz glasses by RF reactive sputtering from a Re metal target. The lowest resistivity was observed in the film in-situ annealed at 200?C in Ar atmosphere and showed the order of 10-4 Ωcm of which the value was still about 10 times as large as that of a single crystal ReO3. The temperature dependence of the resistivity revealed a metallic behavior. A superconductivity did not take place in the bilayered film of ReO3 / NdBa2Cu3O6. In the interface region the resistivity minimum probably caused by the Kondo effect was observed in the neighborhood of 120K.

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In situ TEM oxidation study of Fe thin-film transformation to single-crystal magnetite nanoparticles

Journal of Materials Science ◽

10.1007/s10853-020-04917-8 ◽

2020 ◽

Vol 55 (27) ◽

pp. 12897-12905

Author(s):

Leonardo Lari ◽

Stephan Steinhauer ◽

Vlado K. Lazarov

Keyword(s):

Thin Film ◽

Single Crystal ◽

Magnetite Nanoparticles ◽

In Situ Tem ◽

Oxidation Study

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Thin Film Ag/YBCO Multistructures for Metal Contact Applications

MRS Proceedings ◽

10.1557/proc-275-825 ◽

1992 ◽

Vol 275 ◽

Author(s):

M. Powers ◽

R. Gronsky ◽

J. Washburn

Keyword(s):

Thin Film ◽

Single Crystal ◽

Ybco Film ◽

Electrical Contact ◽

Ceramic Substrate ◽

Metal Contact ◽

Intimate Contact ◽

Sputter Deposited ◽

Maximum Contact

ABSTRACTA technique is presented where Ag is initially sputter deposited on a single crystal ceramic substrate followed by in situ deposition of YBa2Cu3O7δ The resulting microstructure shows Ag islands amidst a c-axis oriented YBCO film, apparently with intimate contact between the YBCO and substrate. This morphology appears ideal for electrical contact to the {hko} surfaces of the superconductor with current carrying CuO planes in maximum contact with the Ag.

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T0302-2-6 In-situ TEM Experiment of Tensile Testing for Single-Crystal-Silicon Thin Film

The proceedings of the JSME annual meeting ◽

10.1299/jsmemecjo.2010.8.0_263 ◽

2010 ◽

Vol 2010.8 (0) ◽

pp. 263-264

Author(s):

Taeko ANDO ◽

Hidekazu Ishihara ◽

Masahiro Nakajima ◽

Shigeo Arai ◽

Toshio Fukuda ◽

...

Keyword(s):

Thin Film ◽

Single Crystal ◽

Tensile Testing ◽

Single Crystal Silicon ◽

In Situ Tem ◽

Silicon Thin Film ◽

Crystal Silicon

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Study of uniaxial deformation behavior of 50 nm-thick thin film of gold single crystal using in situ X-ray pole figure measurements

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2019.06.103 ◽

2019 ◽

Vol 377 ◽

pp. 124878

Author(s):

J. Drieu La Rochelle ◽

P. Godard ◽

C. Mocuta ◽

D. Thiaudière ◽

J. Nicolai ◽

...

Keyword(s):

Thin Film ◽

Single Crystal ◽

Pole Figure ◽

Deformation Behavior ◽

Uniaxial Deformation ◽

X Ray

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Ion Thinning of Electron Transparent Single Crystal Sapphire Substrates

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100052353 ◽

1974 ◽

Vol 32 ◽

pp. 468-469

Author(s):

J. L. Kenty ◽

R. E. Johnson

Keyword(s):

Thin Film ◽

Single Crystal ◽

Film Growth ◽

Ion Beam ◽

Thin Film Growth ◽

Sapphire Substrates ◽

Single Crystal Sapphire ◽

Growth Experiments

Samples of single crystal sapphire (α-Al2O3) have been ion-beam thinned to yield electron transparent regions suitable for use as substrates for in situ thin film growth experiments. Routine fabrication of 1 mm dia. samples containing one or more thin (∼200Å) regions ∼10μm2 in area was possible. The samples were surprisingly robust, many surviving post-thinning subdivision, mounting into a TEM environment cell, and heating to ∼1200°C.

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