scholarly journals Automated System for Studying Magneto-Optical Properties of Thin Films of Metals in situ

2016 ◽  
pp. 63-69 ◽  
Author(s):  
Igor Belous ◽  
◽  
Valentin Dotsenko ◽  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Automated System

Optical properties of different polymer thin films containing in situ synthesized Ag and Au nanoparticles

2009 ◽  
Vol 33 (8) ◽  
pp. 1720 ◽  
Author(s):  
Rafael Abargues ◽  
Kamal Abderrafi ◽  
E. Pedrueza ◽  
Rachid Gradess ◽  
J. Marqués-Hueso ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Au Nanoparticles ◽  
Polymer Thin Films

scholarly journals Plasmon-enhanced diffraction in nanoparticle gratings fabricated by in situ photo-reduction of gold chloride doped polymer thin films by laser interference patterning

2017 ◽  
Vol 5 (14) ◽  
pp. 3553-3560 ◽  
Author(s):  
E. Nadal ◽  
N. Barros ◽  
H. Glénat ◽  
J. Laverdant ◽  
D. S. Schmool ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Polymer Thin Films ◽  
Gold Chloride ◽  
Laser Interference ◽  
Plasmonic Nanoparticle ◽  
Novel Method ◽  
Doped Polymer

This is a novel method for fabricating plasmonic nanoparticle gratings with original optical properties induced by laser photo-reduction of gold precursors in PVA thin films.

Effects of substrates on structural and optical properties of Cu-poor CuGaSe2 thin films prepared by in-situ co-evaporation

2013 ◽  
Vol 13 (5) ◽  
pp. 907-912 ◽  
Author(s):  
A.R. Jeong ◽  
W. Jo ◽  
D.Y. Park ◽  
H. Cheong ◽  
Y.K. Seo ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Structural And Optical Properties

In Situ Fast Temperature Measurement of Silicon Thin Films during the Excimer Laser Annealing

2006 ◽  
Vol 326-328 ◽  
pp. 195-198
Author(s):  
Seung Jae Moon
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Melting Point ◽  
Temperature Measurement ◽  
Amorphous Silicon ◽  
Laser Annealing ◽  
Crystalline Silicon ◽  
Excimer Laser Annealing ◽  
Silicon Thin Films

The formation and growth mechanism of polysilicon grains in thin films via laser annealing of amorphous silicon thin films are studied. The complete understanding of the mechanism is crucial to improve the thin film transistors used as switches in the active matrix liquid crystal displays. To understand the recrystallization mechanism, the temperature history and liquidsolid interface motion during the excimer laser annealing of 50-nm thick amorphous and polysilicon films on fused quartz substrates are intensively investigated via in-situ time-resolved thermal emission measurements, optical reflectance and transmittance measurements at near infrared wavelengths. The front transmissivity and reflectivity are measured to obtain the emissivity at the 1.52 μm wavelength of the probe IRHeNe laser to improve the accuracy of the temperature measurement. The melting point of amorphous silicon is higher than that of crystalline silicon of 1685 K by 100-150 K. This is the first direct measurement of the melting temperature of amorphous silicon thin films. It is found that melting of polysilicon occurs close to the melting point of crystalline silicon. Also the optical properties such as reflectance and transmittance are used to determine the melt duration by the detecting the difference of the optical properties of liquid silicon and solid silicon.

scholarly journals In Situ Photoacoustic Study of Optical Properties of P-Type (111) Porous Silicon Thin Films

Nanomaterials ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 1314
Author(s):  
Cristian Felipe Ramirez-Gutierrez ◽  
Ivan Alonso Lujan-Cabrera ◽  
Cesar Isaza ◽  
Ely Karina Anaya Rivera ◽  
Mario Enrique Rodriguez-Garcia
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Porous Silicon ◽  
Effective Medium Theory ◽  
Pore Geometry ◽  
Medium Theory ◽  
Specular Reflectance ◽  
Silicon Thin Films ◽  
P Type

Porous silicon (PSi) on p++-type (111) silicon substrate has been fabricated by electronically etching method in hydrofluoric acid (HF) media from 5 to 110 mA/cm2 of anodizing current density. The problem of determining the optical properties of (111) PSi is board through implementing a photoacoustic (PA) technique coupled to an electrochemical cell for real-time monitoring of the formation of porous silicon thin films. PA amplitude allows the calculation of the real part of the films refractive index and porosity using the reflectance self-modulation due to the interference effect between the PSi film and the substrate that produces a periodic PA amplitude. The optical properties are studied from specular reflectance measurements fitted through genetic algorithms, transfer matrix method (TMM), and the effective medium theory, where the Maxwell Garnett (MG), Bruggeman (BR), and Looyenga (LLL) models were tested to determine the most suitable for pore geometry and compared with the in situ PA method. It was found that (111) PSi exhibit a branched pore geometry producing optical anisotropy and high scattering films.

Influence of the pH on the Surface and Optical Properties of the Thin Film of Polyaniline / Polyethylene Terephthalate Composite. The AFM and Spectroscopies Studies

2011 ◽  
Vol 1312 ◽  
Author(s):  
Rafaella T. Paschoalin ◽  
Clarice Steffens ◽  
Alexandra Manzoli ◽  
Mhbuti R. Hlophe ◽  
Paulo S. P. Herrmann
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Optical Properties ◽  
Great Influence ◽  
Spectroscopic Properties ◽  
Printing Technique ◽  
Vibrational Bands ◽  
Coating Layers ◽  
Ph Increase

ABSTRACTThe effect of pH was investigated on the morphological and spectroscopic properties of PANI thin films on PET. PANI/PET strips were prepared by a pattern-printing technique and coated with a thin film of polyaniline in situ emeraldine oxidation state, doped with HCl (PANI-HCl), obtained by in situ polymerization. AFM, UV-VIS-NIR and FTIR/ATR spectroscopic results showed that pH has a great influence on the polymer layer morphology of the coating layers, while the intensity of vibrational bands decreases with rising pH, increase due to changes in the H-bonded structure in the polymer chain.

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