Calibration of Carbon Nanotube Probes for Pico-Newton Order Force Measurement Inside a Scanning Electron Microscope

2004 ◽  
Vol 16 (2) ◽  
pp. 155-162 ◽  
Author(s):  
Masahiro Nakajima ◽  
◽  
Fumihito Arai ◽  
Lixin Dong ◽  
Toshio Fukuda
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Elastic Moduli ◽  
Force Measurement ◽  
Ultrasonic Waves ◽  
Copper Electrodes ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Scanning Electron

A method is presented for pico-Newton (pN) order force measurement using a carbon nanotube (CNT) probe, which is calibrated by electromechanical resonance. A CNT probe is constructed by attaching a CNT to the end of a tungsten needle or an atomic force microscope (AFM) cantilever using nanorobotic manipulators inside a field-emission scanning electron microscope (FE-SEM). Conductive electron-beam-induced deposition (EBID) is used for the fixation of CNTs with an internal vaporized precursor W(CO)6. For manipulating them easily and quickly, CNTs are dispersed in ethanol by ultrasonic waves and oriented on copper electrodes by electrophoresis. The elastic moduli of CNT probes are calibrated for use as a force measurement probe by electrically exciting at fundamental frequency. We analyzed the resolution of force measurement using a CNT probe. This force measurement can be used to characterize the mechanical properties of nanostructures and to measure friction or exfoliation forces in nanometer order.

Advancement in fabrication of carbon nanotube tip for atomic force microscope using multi-axis nanomanipulator in scanning electron microscope

2022 ◽  
Author(s):  
Sanjeev Kumar Kanth ◽  
Anjli Sharma ◽  
Byong Chon Park ◽  
Woon Song ◽  
Hyun Rhu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Atomic Force Microscope ◽  
Structural Integrity ◽  
Ion Beam ◽  
Rectilinear Motion ◽  
Atomic Force ◽  
Scanning Electron

Abstract We have constructed a new nanomanipulator (NM) in a field emission scanning electron microscope (FE-SEM) to fabricate carbon nanotube (CNT) tip to precisely adjust the length and attachment angle of CNT onto the mother atomic force microscope (AFM) tip. The new NM is composed of 2 modules, each of which has the degree of freedom of three-dimensional rectilinear motion x, y and z and one-dimensional rotational motion θ. The NM is mounted on the stage of a FE-SEM. With the system of 14 axes in total which includes 5 axes of FE-SEM and 9 axes of nano-actuators, it was possible to see CNT tip from both rear and side view about the mother tip. With the help of new NM, the attachment angle error could be reduced down to 0º as seen from both the side and the rear view, as well as, the length of the CNT could be adjusted with the precision using electron beam induced etching. For the proper attachment of CNT on the mother tip surface, the side of the mother tip was milled with focused ion beam. In addition, electron beam induced deposition was used to strengthen the adhesion between CNT and the mother tip. In order to check the structural integrity of fabricated CNT, transmission electron microscope image was taken which showed the fine cutting of CNT and the clean surface as well. Finally, the performance of the fabricated CNT tip was demonstrated by imaging 1-D grating and DNA samples with atomic force microscope in tapping mode.

scholarly journals Spinning Carbon Nanotube Nanothread under a Scanning Electron Microscope

Materials ◽  
2011 ◽  
Vol 4 (9) ◽  
pp. 1519-1527 ◽  
Author(s):  
Weifeng Li ◽  
Chaminda Jayasinghe ◽  
Vesselin Shanov ◽  
Mark Schulz
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Scanning Electron

scholarly journals Blood and Synovial Microparticles as Revealed by Atomic Force and Scanning Electron Microscope

2009 ◽  
Vol 1 (1) ◽  
pp. 50-58 ◽  
Author(s):  
Ita Junkar ◽  
Vid Sustar ◽  
Mojca Frank ◽  
Vid Jansa ◽  
Apolonija Bedina Zavec ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Atomic Force ◽  
Scanning Electron

Highly sensitive compression sensors using three-dimensional printed polydimethylsiloxane/carbon nanotube nanocomposites

2019 ◽  
Vol 30 (8) ◽  
pp. 1216-1224 ◽  
Author(s):  
Mohammad Charara ◽  
Mohammad Abshirini ◽  
Mrinal C Saha ◽  
M Cengiz Altan ◽  
Yingtao Liu
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Three Dimensional ◽  
Multi Walled Carbon Nanotube ◽  
Highly Sensitive ◽  
Multi Walled Carbon Nanotubes ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

This article presents three-dimensional printed and highly sensitive polydimethylsiloxane/multi-walled carbon nanotube sensors for compressive strain and pressure measurements. An electrically conductive polydimethylsiloxane/multi-walled carbon nanotube nanocomposite is developed to three-dimensional print compression sensors in a freestanding and layer-by-layer manner. The dispersion of multi-walled carbon nanotubes in polydimethylsiloxane allows the uncured nanocomposite to stand freely without any support throughout the printing process. The cross section of the compression sensors is examined under scanning electron microscope to identify the microstructure of nanocomposites, revealing good dispersion of multi-walled carbon nanotubes within the polydimethylsiloxane matrix. The sensor’s sensitivity was characterized under cyclic compression loading at various max strains, showing an especially high sensitivity at lower strains. The sensing capability of the three-dimensional printed nanocomposites shows minimum variation at various applied strain rates, indicating its versatile potential in a wide range of applications. Cyclic tests under compressive loading for over 8 h demonstrate that the long-term sensing performance is consistent. Finally, in situ micromechanical compressive tests under scanning electron microscope validated the sensor’s piezoresistive mechanism, showing the rearrangement, reorientation, and bending of the multi-walled carbon nanotubes under compressive loads, were the main reasons that lead to the piezoresistive sensing capabilities in the three-dimensional printed nanocomposites.

The Nano Membrane-Like Structure of the Precambrian Microfossils under Atomic Force Microscope (AFM)

2007 ◽  
Vol 121-123 ◽  
pp. 739-742 ◽  
Author(s):  
H.M. Chi ◽  
Z.D. Xiao ◽  
Xin Xing Xiao
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Atomic Force Microscope ◽  
Early Life ◽  
Three Dimensional ◽  
New Method ◽  
Subcellular Structure ◽  
Atomic Force ◽  
Fossil Embryos ◽  
Scanning Electron

Weng`an fauna in Guizhou, China provides a unique window for the evolution of the early life especially since the animal embryos and sponge is found there. Phosphatization makes the fossils preserve in details including cells and subcellular structure. Here we use atomic force microscope observing the surface of some three dimensional preserved embryo fossils and the ultra membrane-like structure is found under atomic force microscope (AFM) while such structure can`t be found under scanning electron microscope (SEM). The membrane-like structure is approximately 10nm in thickness which maybe one part of the fossil embryos or belong to another nano scale microfossils. Therefore, AFM provides a new method for the study of the ultra structure of the microfossils from Weng`an fauna.

Femtosecond Laser-Induced Micro-Structuring of Thin a-Si:H Films

2004 ◽  
Vol 850 ◽  
Author(s):  
Barada K. Nayak ◽  
Mool C. Gupta
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Femtosecond Laser ◽  
Light Trapping ◽  
Surface Texturing ◽  
Textured Surface ◽  
Near Ir ◽  
Atomic Force ◽  
Micro Structuring ◽  
Scanning Electron

ABSTRACTIn a-Si:H solar cells, light trapping has been sought as a method to enhance absorption and improve the efficiencies of these devices. Here we present results for surface texturing of 2μm thick a-Si:H films by 800 nm wavelength femtosecond laser. The texture led to a significant enhancement in optical absorption (80%) in visible through near IR (60%). The textured surface was examined by a scanning electron microscope (SEM) and atomic force microscope (AFM). The results indicated the formation of dense spikes with height of 65–75 nm. The samples were completely black after femtosecond laser treatment.

scholarly journals Stable Operating Condition of Carbon Nanotube Field Electron Emitter for Small Size Scanning Electron Microscope

Shinku ◽  
2007 ◽  
Vol 50 (6) ◽  
pp. 448-451
Author(s):  
Hiroshi SUGA ◽  
Teruaki OHNO ◽  
Miyuki TANAKA ◽  
Yasushiro NISHIOKA ◽  
Hiroshi TOKUMOTO ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Operating Condition ◽  
Electron Emitter ◽  
Field Electron ◽  
Stable Operating ◽  
Scanning Electron
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